Article comprising a PB-free solder having improved mechanical properties
    12.
    发明授权
    Article comprising a PB-free solder having improved mechanical properties 失效
    包含具有改善的机械性能的无PB焊料的制品

    公开(公告)号:US5538686A

    公开(公告)日:1996-07-23

    申请号:US278673

    申请日:1994-06-27

    CPC分类号: C22C13/00 B23K35/262

    摘要: Pb-free solder alloys based on the Sn-In-Zn system (exemplarily 86:5:9 weight %) are disclosed. Compositions can have a melting temperature in the range 183.degree. C..+-.10.degree. C. and thus can be readily substituted for conventional 40 Pb-60 Sn solder. The novel compositions also can possess superior mechanical properties, compared to the 40/60 Pb-Sn composition, and readily wets copper. Bi and/or Sb may be added to the Sn-In-Zn base to reduce the tendency for the formation of lower temperature phases.

    摘要翻译: 公开了基于Sn-In-Zn体系的无铅焊料合金(示例性为86:5:9重量%)。 组合物可以具有在183℃±10℃的范围内的熔融温度,因此可以容易地代替传统的40Pb-60Sn焊料。 与40/60 Pb-Sn组合物相比,新型组合物也具有优异的机械性能,并且易于润湿铜。 可以向Sn-In-Zn基中添加Bi和/或Sb以降低形成低温相的倾向。

    Method and apparatus for wafer level testing of integrated optical waveguide circuits
    15.
    发明授权
    Method and apparatus for wafer level testing of integrated optical waveguide circuits 失效
    集成光波导电路的晶圆级测试方法和装置

    公开(公告)号:US07386197B2

    公开(公告)日:2008-06-10

    申请号:US10994021

    申请日:2004-11-19

    IPC分类号: G02B6/12

    CPC分类号: G01M11/37

    摘要: A method of testing a planar lightwave circuit is achieved by coupling an optical probe to the planar lightwave circuit. In one embodiment, a second probe is used in combination with the first probe to test the planar lightwave circuit by sending and receiving a light beam through the planar lightwave circuit.

    摘要翻译: 通过将光学探针耦合到平面光波电路来实现测试平面光波电路的方法。 在一个实施例中,第二探针与第一探头组合使用,以通过发射和接收通过平面光波电路的光束来测试平面光波电路。

    Method and apparatus for wafer level testing of integrated optical waveguide circuits
    16.
    发明授权
    Method and apparatus for wafer level testing of integrated optical waveguide circuits 失效
    集成光波导电路的晶圆级测试方法和装置

    公开(公告)号:US06859587B2

    公开(公告)日:2005-02-22

    申请号:US10041038

    申请日:2001-12-28

    IPC分类号: G01M11/00 G02B6/30

    CPC分类号: G01M11/37

    摘要: A method of testing a planar lightwave circuit is achieved by coupling an optical probe to the planar lightwave circuit. In one embodiment, a second probe is used in combination with the first probe to test the planar lightwave circuit by sending and receiving a light beam through the planar lightwave circuit.

    摘要翻译: 通过将光学探针耦合到平面光波电路来实现测试平面光波电路的方法。 在一个实施例中,第二探针与第一探头组合使用,以通过发射和接收通过平面光波电路的光束来测试平面光波电路。