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公开(公告)号:US20240014203A1
公开(公告)日:2024-01-11
申请号:US18472985
申请日:2023-09-22
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jian-Sing LI , Guo-Huei WU , Hui-Zhong ZHUANG , Chih-Liang CHEN , Li-Chun TIEN
IPC: H01L27/02 , H01L27/092 , H01L29/06 , H01L29/423 , G06F30/392 , H01L21/02 , H01L21/8238 , H01L29/786
CPC classification number: H01L27/0207 , H01L27/0922 , H01L29/0673 , H01L29/42392 , G06F30/392 , H01L21/02603 , H01L21/823807 , H01L21/823821 , H01L21/823871 , H01L29/78696
Abstract: An integrated circuit includes a first transistor of a first conductivity type including a first active area extending in a first direction; a second transistor of the first conductivity type including at least two second active areas extending in the first direction and a first gate stripe crossing the at least two second active areas; and a third transistor of a second conductivity type that is stacked on the second transistor and includes at least two third active areas arranged above the at least two second active areas. A top most boundary line of the first active area is aligned with a top most boundary line of one of the at least two third active areas in a layout view.
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公开(公告)号:US20230154917A1
公开(公告)日:2023-05-18
申请号:US18156605
申请日:2023-01-19
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chih-Liang CHEN , Shun Li CHEN , Li-Chun TIEN , Ting Yu CHEN , Hui-Zhong ZHUANG
IPC: H01L27/02 , G06F30/392 , H01L27/092
CPC classification number: H01L27/0207 , G06F30/392 , H01L27/092
Abstract: A non-transitory computer-readable medium contains thereon a cell library. The cell library includes a plurality of cells configured to be placed in a layout diagram of an integrated circuit (IC). Each cell among the plurality of cells includes a first active region inside a boundary of the cell. The first active region extends along a first direction. At least one gate region is inside the boundary. The at least one gate region extends across the first active region along a second direction transverse to the first direction. A first conductive region overlaps the first active region and a first edge of the boundary. The first conductive region is configured to form an electrical connection to the first active region. The plurality of cells includes at least one cell a width of which in the first direction is equal to one gate region pitch between adjacent gate regions of the IC.
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公开(公告)号:US20220367440A1
公开(公告)日:2022-11-17
申请号:US17876909
申请日:2022-07-29
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Shao-Lun CHIEN , Po-Chun WANG , Hui-Zhong ZHUANG , Chih-Liang CHEN , Li-Chun TIEN
IPC: H01L27/02 , G06F30/392 , H01L23/522
Abstract: An integrated circuit is provided and includes a multi-bit cell having multiple bit cells disposed in multiple cell rows. The bit cells include M bit cells, M being positive integers. A first bit cell of the bit cells and a M-th bit cell of the bit cells are arranged diagonally in different cell rows in the multi-bit cell. The multi-bit cell includes first to fourth cell boundaries. The first and second boundaries extend in a first direction and the third and fourth boundaries extend in a second direction different from the first direction. The first bit cell and a second bit cell of the bit cells abut the third cell boundary, and the first bit cell and a (M/2+1)-th bit cell of the bit cells abut the first cell boundary.
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公开(公告)号:US20220293469A1
公开(公告)日:2022-09-15
申请号:US17831108
申请日:2022-06-02
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jerry Chang-Jui KAO , Hui-Zhong ZHUANG , Li-Chung HSU , Sung-Yen YEH , Yung-Chen CHIEN , Jung-Chan YANG , Tzu-Ying LIN
IPC: H01L21/822 , H01L21/48 , H01L23/535 , H01L23/50
Abstract: A semiconductor device includes several first cell row an several second cell rows. The first cell rows extend in a first direction. Each of the first cell rows has a first row height. A first row of the first cell rows is configured for a first cell to be arranged. The second cell rows extend in the first direction. Each of the second cell rows has a second row height that is different from the first row height. At least one row of the second cell rows includes a portion for at least one second cell to be arranged. The portion has a third row height that is different from the first row height and the second row height.
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公开(公告)号:US20210098453A1
公开(公告)日:2021-04-01
申请号:US17120839
申请日:2020-12-14
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Shih-Wei PENG , Hui-Zhong ZHUANG , Jiann-Tyng TZENG , Li-Chun TIEN , Pin-Dai SUE , Wei-Cheng LIN
IPC: H01L27/092 , H03K17/687
Abstract: Exemplary embodiments for an exemplary dual transmission gate and various exemplary integrated circuit layouts for the exemplary dual transmission gate are disclosed. These exemplary integrated circuit layouts represent double-height, also referred to as double rule, integrated circuit layouts. These double rule integrated circuit layouts include a first group of rows from among multiple rows of an electronic device design real estate and a second group of rows from among the multiple rows of the electronic device design real estate to accommodate a first metal layer of a semiconductor stack. The first group of rows can include a first pair of complementary metal-oxide-semiconductor field-effect (CMOS) transistors, such as a first p-type metal-oxide-semiconductor field-effect (PMOS) transistor and a first n-type metal-oxide-semiconductor field-effect (NMOS) transistor, and the second group of rows can include a second pair of CMOS transistors, such as a second PMOS transistor and a second NMOS transistor. These exemplary integrated circuit layouts disclose various configurations and arrangements of various geometric shapes that are situated within an oxide diffusion (OD) layer, a polysilicon layer, a metal diffusion (MD) layer, the first metal layer, and/or a second metal layer of a semiconductor stack. In the exemplary embodiments to follow, the various geometric shapes within the first metal layer are situated within the multiple rows of the electronic device design real estate and the various geometric shapes within the OD layer, the polysilicon layer, the MD layer, and/or the second metal layer are situated within multiple columns of the electronic device design real estate.
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公开(公告)号:US20200328201A1
公开(公告)日:2020-10-15
申请号:US16837970
申请日:2020-04-01
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jian-Sing LI , Guo-Huei WU , Hui-Zhong ZHUANG , Chih-Liang CHEN , Li-Chun TIEN
IPC: H01L27/02 , H01L27/092 , H01L29/06 , H01L29/423 , H01L29/786 , H01L21/02 , H01L21/8238 , G06F30/392
Abstract: An integrated circuit includes a first cell and a second cell. The first cell with a first cell height along a first direction includes a first active region and a second active region that extend in a second direction different from the first direction. The first active region overlaps the second active region in a layout view. The second cell with a second cell height includes a first plurality of active regions and a second plurality of active regions. The first plurality of active regions and the second plurality of active regions extend in the second direction and the first plurality of active regions overlap the second plurality of active regions, respectively, in the layout view. The first cell abuts the second cell, and the first active region is aligned with one of the first plurality of active regions in the layout view.
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公开(公告)号:US20170323877A1
公开(公告)日:2017-11-09
申请号:US15145354
申请日:2016-05-03
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chung-Te LIN , Ting-Wei CHIANG , Hui-Zhong ZHUANG , Pin-Dai SUE , Li-Chun TIEN
IPC: H01L27/02 , G06F17/50 , H01L27/092 , H01L29/423
CPC classification number: H01L27/0207 , G06F17/5072 , H01L27/092 , H01L29/42376 , H01L2027/11875
Abstract: A layout includes a plurality of cells and at least one dummy gate electrode continuously extends across the cells. Since the dummy gate electrode is electrically conductive, the dummy gate electrode can be utilized for interconnecting the cells. That is, some signals may travel through the dummy gate electrode rather than through a metal one line or a metal two line. Therefore, an amount of metal one lines and/or metal two lines for interconnecting the cells can be reduced.
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公开(公告)号:US20150067616A1
公开(公告)日:2015-03-05
申请号:US14011790
申请日:2013-08-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chin-Hsiung HSU , Yuan-Te HOU , Li-Chun TIEN , Hui-Zhong ZHUANG , Fang-Yu FAN , Wen-Hao CHEN , Ting Yu CHEN
IPC: G06F17/50
CPC classification number: G06F17/5072 , G06F17/5068
Abstract: A method includes comparing one or more cells to a selection guideline and storing the cells that meet the selection guideline in a non-transient computer readable storage medium to create the cell library based on the comparing. The selection guideline identifies a suitable position of a boundary pin within a cell.
Abstract translation: 一种方法包括将一个或多个单元与选择指南进行比较,并将满足选择准则的单元存储在非瞬态计算机可读存储介质中,以基于该比较创建单元库。 选择指南确定单元格内边界引脚的合适位置。
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公开(公告)号:US20230377976A1
公开(公告)日:2023-11-23
申请号:US18361722
申请日:2023-07-28
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jerry Chang-Jui KAO , Hui-Zhong ZHUANG , Li-Chung HSU , Sung-Yen YEH , Yung-Chen CHIEN , Jung-Chan YANG , Tzu-Ying LIN
IPC: H01L21/822 , H01L23/50 , H01L21/48 , H01L23/535
CPC classification number: H01L21/8221 , H01L23/50 , H01L21/4828 , H01L23/535
Abstract: An integrated circuit is provided and includes first transistors of a first circuit arranged in a first cell row having a first number of fin structures and a second transistor of a second circuit. The second transistor is coupled in parallel with a first element in the first transistors between first and second terminals of the first circuit, and arranged in a second cell row having a second number, different from the first number, of fin structures. The first element and the second transistor share a first gate extending in a first direction to pass through the first and second cell rows in a layout view. The second transistor is a duplication of the first element.
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公开(公告)号:US20230334208A1
公开(公告)日:2023-10-19
申请号:US18341545
申请日:2023-06-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Cheok-Kei LEI , Zhe-Wei JIANG , Chi-Yu LU , Yi-Hsin KO , Chi-Lin LIU , Hui-Zhong ZHUANG
IPC: G06F30/327 , H01L23/52 , H01L23/522 , G06F30/392 , G06F30/398
CPC classification number: G06F30/327 , H01L23/52 , H01L23/5222 , G06F30/392 , G06F30/398
Abstract: The present disclosure describes a method for optimizing metal cuts in standard cells. The method includes placing a standard cell in a layout area and inserting a metal cut along a metal interconnect of the standard cell at a location away from a boundary of the standard cell. The method further includes disconnecting, at the location, a metal portion of the metal interconnect from a remaining portion of the metal interconnect based on the metal cut.
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