公开(公告)号：US20180301359A1

公开(公告)日：2018-10-18

申请号：US15766191

申请日：2016-10-06

申请人： Toyo Tanso Co., Ltd.

发明人： Satoshi Torimi ,  Masato Shinohara ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/67 ,  H01L21/3065 ,  H01L21/04 ,  H01L21/687

摘要： A heat treatment container (1) is provided with support members (6) for supporting a disc-shaped SiC substrate (2), which is an object, at a time of an etching treatment of the SiC substrate (2). Each of the support members (6) has an inclined surface (6F) for supporting a lower surface end (2E) of the SiC substrate (2), the inclined surface being inclined so as to increasingly approach the centerline of the SiC substrate (2) going downward. More specifically, each of the support members (6) is formed in a conical shape with a diameter that increases going downward, and a conical surface which is the peripheral surface of each supporting member forms the inclined surface (6F). A vertically-middle section of the inclined surface (6F) contacts the lower surface end (2E) of the SiC substrate (2).

公开(公告)号：US09991175B2

公开(公告)日：2018-06-05

申请号：US15300653

申请日：2015-03-10

申请人： Toyo Tanso Co., Ltd.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/00 ,  H01L21/66 ,  H01L21/02 ,  H01L21/04 ,  H01L29/16

CPC分类号： H01L22/12 ,  H01L21/0201 ,  H01L21/02019 ,  H01L21/02024 ,  H01L21/0475 ,  H01L21/3065 ,  H01L29/1608

摘要： This method for estimating the depth of latent scratches in SiC substrates includes an etching step, a measurement step, and an estimation step. In the etching step, a SiC substrate in which at least the surface is formed from single crystal SiC, and which has been subjected to machining, is subjected to heat treatment under Si atmosphere to etch the surface of the SiC substrate. In the measurement step, the surface roughness or the residual stress of the SiC substrate which has been subjected to the etching step is measured. In the estimation step, the depth of latent scratches or the presence or absence of latent scratches in the SiC substrate before the etching step are estimated on the basis of the results obtained in the measurement step.

公开(公告)号：US09704733B2

公开(公告)日：2017-07-11

申请号：US14434864

申请日：2013-11-15

申请人： TOYO TANSO CO., LTD.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/02 ,  H01L21/673 ,  C30B29/36 ,  C30B33/12 ,  H01L21/3065 ,  H01L29/16 ,  H01L21/67 ,  C30B35/00 ,  H01L21/04 ,  H01L21/306 ,  H01L21/302 ,  C23C10/22 ,  F27B17/00 ,  C23C10/02

CPC分类号： H01L21/673 ,  C23C10/02 ,  C23C10/22 ,  C30B29/36 ,  C30B33/12 ,  C30B35/002 ,  F27B17/0025 ,  H01L21/046 ,  H01L21/302 ,  H01L21/30604 ,  H01L21/3065 ,  H01L21/67069 ,  H01L21/6719 ,  H01L29/1608

摘要： The present invention is to provide a storing container wherein Si does not drop onto a single crystal SiC substrate, and Si pressure distribution in an internal space can be made uniform. This storing container stores therein a single crystal SiC substrate to be etched by means of a heat treatment under Si vapor pressure. The storing container is formed of a tantalum metal, and has a tantalum carbide layer provided on an internal space side, and a tantalum silicide layer provided on the side further toward the internal space side than the tantalum carbide layer. The tantalum silicide layer supplies Si to the internal space. Furthermore, the tantalum silicide layer is different from adhered Si, and does not melt and drop.

公开(公告)号：US20170110378A1

公开(公告)日：2017-04-20

申请号：US15300653

申请日：2015-10-03

申请人： Toyo Tanso Co., Ltd.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/66 ,  H01L21/02

CPC分类号： H01L22/12 ,  H01L21/0201 ,  H01L21/02019 ,  H01L21/02024 ,  H01L21/0475 ,  H01L21/3065 ,  H01L29/1608

摘要： This method for estimating the depth of latent scratches in SiC substrates includes an etching step, a measurement step, and an estimation step. In the etching step, a SiC substrate in which at least the surface is formed from single crystal SiC, and which has been subjected to machining, is subjected to heat treatment under Si atmosphere to etch the surface of the SiC substrate. In the measurement step, the surface roughness or the residual stress of the SiC substrate which has been subjected to the etching step is measured. In the estimation step, the depth of latent scratches or the presence or absence of latent scratches in the SiC substrate before the etching step are estimated on the basis of the results obtained in the measurement step.

公开(公告)号：US11261539B2

公开(公告)日：2022-03-01

申请号：US16495282

申请日：2018-03-20

申请人： Toyo Tanso Co., Ltd.

发明人： Satoshi Torimi ,  Yusuke Sudo ,  Masato Shinohara ,  Youji Teramoto ,  Takuya Sakaguchi ,  Satoru Nogami ,  Makoto Kitabatake

IPC分类号： H01L21/02 ,  C30B25/18 ,  C30B29/36 ,  H01L29/34 ,  H01L29/16 ,  C30B25/20

摘要： In a method for manufacturing a reformed SiC wafer 41 (a surface treatment method for a SiC wafer) having its surface that is reformed by processing an untreated SiC wafer 40 before formation of an epitaxial layer 42, the method includes a surface reforming step as described below. That is, the untreated SiC wafer 40 includes BPDs as dislocations parallel to an inside of a (0001) face, and TEDs. Property of the surface of the untreated SiC wafer 40 is changed so as to have higher rate in which portions having BPDs on the surface of the untreated SiC wafer 40 propagate as TEDs at a time of forming the epitaxial layer 42.

公开(公告)号：US20170121848A1

公开(公告)日：2017-05-04

申请号：US15300617

申请日：2015-03-10

申请人： TOYO TANSO CO., LTD.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： C30B25/18 ,  C30B33/08 ,  H01L21/04 ,  C30B25/10 ,  H01L21/02 ,  C30B25/20 ,  C30B29/36

CPC分类号： C30B25/186 ,  C30B25/10 ,  C30B25/20 ,  C30B29/36 ,  C30B33/08 ,  H01L21/02019 ,  H01L21/02378 ,  H01L21/02433 ,  H01L21/02529 ,  H01L21/02661 ,  H01L21/0475 ,  H01L21/302 ,  H01L21/3065 ,  H01L21/3247 ,  H01L29/1608

摘要： When a SiC substrate (40) after performing mechanical treatment is heat-treated under SiC atmosphere to etch the SiC substrate (40), the etching rate is controlled by adjusting the inert gas pressure around the periphery of the SiC substrate (40). As a result, when latent scratches or the like exist in the SiC substrate (40), the latent scratches or the like can be removed. Accordingly, the surface of the SiC substrate (40) does not become rough, even if epitaxial growth and heat treatment and the like are performed. This can manufacture high-quality SiC substrates.

公开(公告)号：US09570306B2

公开(公告)日：2017-02-14

申请号：US14435383

申请日：2013-11-15

申请人： TOYO TANSO CO., LTD.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/04 ,  C30B29/36 ,  C30B33/12 ,  C30B31/22 ,  H01L21/3065 ,  C30B33/02 ,  C30B33/08 ,  H01L29/16

CPC分类号： H01L21/0445 ,  C30B29/36 ,  C30B31/22 ,  C30B33/02 ,  C30B33/08 ,  C30B33/12 ,  H01L21/3065 ,  H01L29/1608

摘要： The present application aims to provide a surface treatment method that is able to accurately control the rate of etching a single crystal SiC substrate and thereby enables correct understanding of the amount of etching. In the surface treatment method, the single crystal SiC substrate is etched by a heat treatment performed under Si vapor pressure. At a time of the etching, inert gas pressure in an atmosphere around the single crystal SiC substrate is adjusted to control the rate of etching. Accordingly, correct understanding of the amount of etching is obtained.

摘要翻译： 本申请旨在提供一种表面处理方法，其能够精确地控制蚀刻单晶SiC衬底的速率，从而能够正确地理解蚀刻量。 在表面处理方法中，通过在Si蒸气压下进行的热处理蚀刻单晶SiC衬底。 在蚀刻时，调整在单晶SiC衬底周围的气氛中的惰性气体压力以控制蚀刻速率。 因此，获得对蚀刻量的正确理解。

公开(公告)号：US20150255314A1

公开(公告)日：2015-09-10

申请号：US14434864

申请日：2013-11-15

申请人： TOYO TANSO CO., LTD.

发明人： Satoshi Torimi ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/673 ,  H01L21/67 ,  H01L21/306

CPC分类号： H01L21/673 ,  C23C10/02 ,  C23C10/22 ,  C30B29/36 ,  C30B33/12 ,  C30B35/002 ,  F27B17/0025 ,  H01L21/046 ,  H01L21/302 ,  H01L21/30604 ,  H01L21/3065 ,  H01L21/67069 ,  H01L21/6719 ,  H01L29/1608

摘要： The present invention is to provide a storing container wherein Si does not drop onto a single crystal SiC substrate, and Si pressure distribution in an internal space can be made uniform. This storing container stores therein a single crystal SiC substrate to be etched by means of a heat treatment under Si vapor pressure. The storing container is formed of a tantalum metal, and has a tantalum carbide layer provided on an internal space side, and a tantalum silicide layer provided on the side further toward the internal space side than the tantalum carbide layer. The tantalum silicide layer supplies Si to the internal space. Furthermore, the tantalum silicide layer is different from adhered Si, and does not melt and drop.

摘要翻译： 本发明提供一种储存容器，其中Si不会落在单晶SiC衬底上，并且内部空间中的Si压力分布可以均匀。 该储存容器通过在Si蒸气压下进行热处理而存储待蚀刻的单晶SiC衬底。 存储容器由钽金属形成，并且具有设置在内部空间侧的碳化钽层和设置在比碳化钽层更靠内部空间侧的一侧的硅化硅层。 硅化硅层将Si提供给内部空间。 此外，硅化硅层与附着的Si不同，不会熔融落下。

公开(公告)号：US20220376109A1

公开(公告)日：2022-11-24

申请号：US17642811

申请日：2020-06-18

申请人： Hitachi, Ltd. ,  TOYO TANSO CO., LTD

发明人： Keisuke Kobayashi ,  Kumiko Konishi ,  Akio Shima ,  Norihito Yabuki ,  Yusuke Sudoh ,  Satoru Nogami ,  Makoto Kitabatake

IPC分类号： H01L29/78 ,  H01L29/16 ,  H01L29/10 ,  H01L29/08 ,  H01L29/06 ,  H01L29/423 ,  H01L21/04

摘要： To provide a technique capable of improving performance and reliability of a semiconductor device. An n−-type epitaxial layer (12) is formed on an n-type semiconductor substrate (11), and a p+-type body region (14), n+-type current spreading regions (16, 17), and a trench. TR are formed in the n−-type epitaxial layer (12). A bottom surface B1 of the trench TR is located in the p+-type body region (14), a side surface S1 of the trench TR is in contact with the n+-type current spreading region (17), and a side surface S2 of the trench TR is in contact with the n+-type current spreading region (16). Here, a ratio of silicon is higher than a ratio of carbon in an upper surface T1 of the n−-type epitaxial layer (12), and the bottom surface B1, the side surface S1, and the side surface 32 of the trench. Furthermore, an angle θ1 at which the upper surface T1 of the n−-type epitaxial layer (12) is inclined with respect to the side surface S1 is smaller than an angle θ2 at which the upper surface T1 of the n−-type epitaxial layer (12) is inclined with respect to the side surface S2.

公开(公告)号：US10665485B2

公开(公告)日：2020-05-26

申请号：US15766191

申请日：2016-10-06

申请人： Toyo Tanso Co., Ltd.

发明人： Satoshi Torimi ,  Masato Shinohara ,  Norihito Yabuki ,  Satoru Nogami

IPC分类号： H01L21/683 ,  H01L21/67 ,  H01L21/3065 ,  H01L21/302 ,  H01L21/04 ,  H01L21/687

摘要： A heat treatment container (1) is provided with support members (6) for supporting a disc-shaped SiC substrate (2), which is an object, at a time of an etching treatment of the SiC substrate (2). Each of the support members (6) has an inclined surface (6F) for supporting a lower surface end (2E) of the SiC substrate (2), the inclined surface being inclined so as to increasingly approach the centerline of the SiC substrate (2) going downward. More specifically, each of the support members (6) is formed in a conical shape with a diameter that increases going downward, and a conical surface which is the peripheral surface of each supporting member forms the inclined surface (6F). A vertically-middle section of the inclined surface (6F) contacts the lower surface end (2E) of the SiC substrate (2).