ADDRESS FAULT DETECTION IN A MEMORY SYSTEM
    212.
    发明公开

    公开(公告)号:US20230162794A1

    公开(公告)日:2023-05-25

    申请号:US17588198

    申请日:2022-01-28

    Inventor: Hieu Van Tran

    CPC classification number: G11C16/08 G11C16/0425 G11C16/26 H01L27/11521

    Abstract: Various examples of memory systems comprising an address fault detection system are disclosed. The memory system comprises a first memory array, a row decoder, and an address fault detection system comprising a second array, wherein the row decoder decodes row addresses into word lines, each word line coupled to a row of cells in the first array and a row of cells in the second array. The second array contains digital bits and/or analog values that are used to identify address faults.

    READ AND PROGRAMMING DECODING SYSTEM FOR ANALOG NEURAL MEMORY

    公开(公告)号:US20230018166A1

    公开(公告)日:2023-01-19

    申请号:US17853315

    申请日:2022-06-29

    Abstract: Various examples of decoders and physical layout designs for non-volatile flash memory arrays in an analog neural system are disclosed. In one example, a system comprises a plurality of vector-by-matrix multiplication arrays in an analog neural memory system, each vector-by-matrix multiplication array comprising an array of non-volatile memory cells organized into rows and columns, wherein each memory cell comprises a word line terminal; a plurality of read row decoders, each read row decoder coupled to one of the plurality of vector-by-matrix multiplication arrays for applying a voltage to one or more selected rows during a read operation; and a shared program row decoder coupled to all of the plurality of vector-by-matrix multiplication arrays for applying a voltage to one or more selected rows in one or more of the vector-by-matrix multiplication arrays during a program operation.

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