Reference cell configuration for sensing resistance states of MRAM bit cells
    221.
    发明授权
    Reference cell configuration for sensing resistance states of MRAM bit cells 有权
    用于感测MRAM位单元的电阻状态的参考单元配置

    公开(公告)号:US08687412B2

    公开(公告)日:2014-04-01

    申请号:US13438006

    申请日:2012-04-03

    CPC classification number: G11C11/161 G11C11/1673

    Abstract: A reference circuit discerns high or low resistance states of a magneto-resistive memory element such as a bit cell. The reference circuit has magnetic tunnel junction (MTJ) elements in complementary high and low resistance states RH and RL, providing a voltage, current or other parameter for comparison against the memory element to discern a resistance state. The parameter represents an intermediate resistance straddled by RH and RL, such as an average or twice-parallel resistance. The reference MTJ elements are biased from the same read current source as the memory element but their magnetic layers are in opposite order, physically or by order along bias current paths. The reference MTJ elements are biased to preclude any read disturb risk. The memory bit cell is coupled to the same bias polarity source along a comparable path, being safe from read disturb risk in one of its two possible logic states.

    Abstract translation: 参考电路识别诸如位单元的磁阻存储元件的高或低电阻状态。 参考电路具有互补的高电阻状态RH和低电阻状态RL的磁隧道结(MTJ)元件,提供用于与存储元件进行比较的电压,电流或其它参数以识别电阻状态。 该参数表示由RH和RL跨过的中间电阻,例如平均或两倍平行的电阻。 参考MTJ元件从与存储元件相同的读取电流源偏置,但它们的磁性层在物理上或沿着偏置电流路径的顺序是相反的顺序。 参考MTJ元件被偏置以排除任何读取干扰风险。 存储器位单元沿着可比较的路径耦合到相同的偏置极性源,在其两种可能的逻辑状态之一中可以避免读取干扰风险。

    Decision feedback equalizers and operating methods thereof
    222.
    发明授权
    Decision feedback equalizers and operating methods thereof 有权
    决策反馈均衡器及其操作方法

    公开(公告)号:US08675724B2

    公开(公告)日:2014-03-18

    申请号:US12836999

    申请日:2010-07-15

    Abstract: A method for updating a tap coefficient of a decision feedback equalizer is provided. The method includes sampling a first input signal received by a sampler of a decision feedback equalizer. It is determined if an amplitude of the first input signal falls within a range defined between a first predetermined voltage level and a second predetermined voltage level. If the amplitude of the first input signal falls outside the range, a tap coefficient is updated to generate an updated tap coefficient that is fed back to adjust an amplitude of a second input signal received at an input end of the decision feedback equalizer. If the amplitude of the first input signal falls within the range, the tap coefficient is free from being updated.

    Abstract translation: 提供了一种用于更新判决反馈均衡器的抽头系数的方法。 该方法包括对由判决反馈均衡器的采样器接收的第一输入信号进行采样。 确定第一输入信号的振幅是否落在在第一预定电压电平和第二预定电压电平之间限定的范围内。 如果第一输入信号的振幅超出该范围,则抽头系数被更新以产生被反馈的更新抽头系数,以调整在判决反馈均衡器的输入端接收的第二输入信号的幅度。 如果第一输入信号的振幅落在该范围内,则抽头系数不被更新。

    Lamp apparatuses
    225.
    发明授权
    Lamp apparatuses 有权
    灯具

    公开(公告)号:US08632199B2

    公开(公告)日:2014-01-21

    申请号:US12550337

    申请日:2009-08-28

    Abstract: A lamp apparatus include a lamp body, at least an alternating current light-emitting diode and a plug. The alternating current light-emitting diode is disposed on a lamp body. The plug is electrically connected to the alternating current light-emitting diode. In lamp apparatuses utilizing AC LED, heat generated thereby is almost concentrated on chips. Compared with conventional lamp apparatuses utilizing DC LEDs, heat generated thereby is distributed on chips and outer rectifier. In lamp apparatuses utilizing AC LEDs, heat generated thereby is almost concentrated on chips because AC LEDs operate directly with AC electric power, omitting a rectifier and preventing power loss during operation of power rectification. Therefore, the heat accumulated on the chips of the AC LEDs is enough to be used to evaporate essential oil. In another embodiment, the invention utilizes low-resistance pure water surrounding the AC LED to dissipate its heat.

    Abstract translation: 一种灯具包括:灯体,至少一个交流发光二极管和一个插头。 交流发光二极管配置在灯体上。 插头电连接到交流发光二极管。 在使用AC LED的灯具中,由此产生的热几乎集中在芯片上。 与使用DC LED的传统灯具相比,由此产生的热量分布在芯片和外部整流器上。 在使用AC LED的灯具中,由于AC LED直接用AC电力进行动作,省略整流器并且防止功率整流运转时的功率损耗,因此产生的热量几乎集中在芯片上。 因此,积聚在AC LED的芯片上的热量足以用于蒸发精油。 在另一个实施例中,本发明利用围绕AC LED的低电阻纯水来散热。

    High voltage device with a parallel resistor
    226.
    发明授权
    High voltage device with a parallel resistor 有权
    具有并联电阻的高压器件

    公开(公告)号:US08624322B1

    公开(公告)日:2014-01-07

    申请号:US13551262

    申请日:2012-07-17

    CPC classification number: H01L27/0629

    Abstract: Provided is a high voltage semiconductor device. The high voltage semiconductor device includes a transistor having a gate, a source, and a drain. The source and the drain are formed in a doped substrate and are separated by a drift region of the substrate. The gate is formed over the drift region and between the source and the drain. The transistor is configured to handle high voltage conditions that are at least a few hundred volts. The high voltage semiconductor device includes a dielectric structure formed between the source and the drain of the transistor. The dielectric structure protrudes into and out of the substrate. Different parts of the dielectric structure have uneven thicknesses. The high voltage semiconductor device includes a resistor formed over the dielectric structure. The resistor has a plurality of winding segments that are substantially evenly spaced apart.

    Abstract translation: 提供高压半导体器件。 高电压半导体器件包括具有栅极,源极和漏极的晶体管。 源极和漏极形成在掺杂衬底中并且由衬底的漂移区域分离。 栅极形成在漂移区域上以及源极和漏极之间。 晶体管被配置为处理至少几百伏特的高电压条件。 高电压半导体器件包括在晶体管的源极和漏极之间形成的电介质结构。 电介质结构突出进出基板。 电介质结构的不同部分具有不均匀的厚度。 高电压半导体器件包括在电介质结构上形成的电阻器。 电阻器具有大致均匀间隔开的多个绕组段。

    Embedded JFETs for High Voltage Applications
    227.
    发明申请
    Embedded JFETs for High Voltage Applications 有权
    用于高压应用的嵌入式JFET

    公开(公告)号:US20130313617A1

    公开(公告)日:2013-11-28

    申请号:US13481462

    申请日:2012-05-25

    Abstract: A device includes a buried well region and a first HVW region of the first conductivity, and an insulation region over the first HVW region. A drain region of the first conductivity type is disposed on a first side of the insulation region and in a top surface region of the first HVW region. A first well region and a second well region of a second conductivity type opposite the first conductivity type are on the second side of the insulation region. A second HVW region of the first conductivity type is disposed between the first and the second well regions, wherein the second HVW region is connected to the buried well region. A source region of the first conductivity type is in a top surface region of the second HVW region, wherein the source region, the drain region, and the buried well region form a JFET.

    Abstract translation: 一种器件包括掩埋阱区和第一导电性的第一HVW区,以及位于第一HVW区上的绝缘区。 第一导电类型的漏极区域设置在绝缘区域的第一侧和第一HVW区域的顶表面区域中。 与第一导电类型相反的第二导电类型的第一阱区和第二阱区在绝缘区的第二侧上。 第一导电类型的第二HVW区域设置在第一和第二阱区域之间,其中第二HVW区域连接到掩埋阱区域。 第一导电类型的源极区域位于第二HVW区域的顶表面区域中,其中源极区域,漏极区域和掩埋阱区域形成JFET。

    System for monitoring dynamic stability of micro machine process and method thereof
    229.
    发明授权
    System for monitoring dynamic stability of micro machine process and method thereof 有权
    微机过程动态稳定监测系统及其方法

    公开(公告)号:US08576278B2

    公开(公告)日:2013-11-05

    申请号:US12687826

    申请日:2010-01-14

    Abstract: The present invention discloses a system for monitoring dynamic stability of micro machine is provided in this invention, wherein an image-capturing device and an analytic device are included. The image-capturing device captures an image on a surface of a work piece milled by the micro machine. The analytic device comprises an image input interface, means for gray-scaling an image, means for analyzing abnormal gray-scaled value of the gray-scaled image, and means for analyzing numbers of veins of the gray-scaled image. This invention also provides a method for monitoring dynamic stability of micro machine.

    Abstract translation: 本发明公开了一种在本发明中提供的用于监视微机动态稳定性的系统,其中包括图像捕获装置和分析装置。 图像捕获装置捕获由微型机器研磨的工件的表面上的图像。 分析装置包括图像输入接口,用于灰度图像的装置,用于分析灰度图像的异常灰度值的装置,以及用于分析灰度图像的静脉数量的装置。 本发明还提供了一种监测微机动态稳定性的方法。

    METHOD AND APPARATUS FOR DEFECT IDENTIFICATION
    230.
    发明申请
    METHOD AND APPARATUS FOR DEFECT IDENTIFICATION 有权
    缺陷识别的方法和装置

    公开(公告)号:US20130287287A1

    公开(公告)日:2013-10-31

    申请号:US13455584

    申请日:2012-04-25

    Abstract: A method of identifying defects including producing, with an imaging system, an original image of a fabricated article having a feature thereon, the feature having an intended height and extracting a contour image from the original image, the contour image having an outline of those portions of the feature having a height approximate to the intended height. The method also includes producing a simulated image of the article based upon the contour and creating a defect image based on the differences between the simulated image and the original image, the defect image including any portions of the feature having a height less than the intended height.

    Abstract translation: 一种识别缺陷的方法,包括用成像系统制造具有其特征的制品的原始图像,该特征具有预期高度并从原始图像提取轮廓图像,轮廓图像具有这些部分的轮廓 的特征具有近似于预期高度的高度。 该方法还包括基于轮廓产生物品的模拟图像,并且基于模拟图像和原始图像之间的差异创建缺陷图像,缺陷图像包括高度小于预期高度的特征的任何部分 。

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