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公开(公告)号:US20210351031A1
公开(公告)日:2021-11-11
申请号:US17370263
申请日:2021-07-08
Applicant: ASM IP HOLDING B.V.
Inventor: Elina Färm , Hidemi Suemori , Raija H. Matero , Antti Niskanen , Suvi P. Haukka , Eva Tois
IPC: H01L21/02 , C23C16/40 , H01L21/32 , C23C16/455
Abstract: Vapor deposition processes are provided in which a material is selectively deposited on a first surface of a substrate relative to a second organic surface. In some embodiments a substrate comprising a first surface, such as a metal, semi-metal or oxidized metal or semi-metal is contacted with a first vapor phase hydrophobic reactant and a second vapor phase reactant such that the material is deposited selectively on the first surface relative to the second organic surface. The second organic surface may comprise, for example, a self-assembled monolayer, a directed self-assembled layer, or a polymer, such as a polyimide, polyamide, polyurea or polystyrene. The material that is deposited may be, for example, a metal or metallic material. In some embodiments the material is a metal oxide, such as ZrO2 or HfO2. In some embodiments the vapor deposition process is a cyclic chemical vapor deposition (CVD) process or an atomic layer deposition (ALD) process. In some embodiments the material is deposited on the first surface relative to the second surface with a selectivity of greater than about 50%, greater than about 60%, greater than about 70%, greater than about 80%, greater than about 90% or greater than about 95%.
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公开(公告)号:US11168395B2
公开(公告)日:2021-11-09
申请号:US16816078
申请日:2020-03-11
Applicant: ASM IP Holding B.V.
Inventor: Sonti Sreeram , John Tolle , Joe Margetis , Junwei Su
IPC: C23C16/455
Abstract: A flange, flange assembly, and reactor system including the flange and flange assembly are disclosed. An exemplary flange assembly includes heated and cooled sections to independently control temperatures of sections of the flange. Methods of using the flange, flange assembly and reactor system are also disclosed.
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公开(公告)号:US20210343554A1
公开(公告)日:2021-11-04
申请号:US17242519
申请日:2021-04-28
Applicant: ASM IP Holding B.V.
Inventor: Theodorus G.M. Oosterlaken , Jeroen Fluit
IPC: H01L21/677
Abstract: A vertical batch furnace assembly for processing wafers having a cassette handling space, a wafer handling space, and a first wall and separating the cassette handling space from the wafer handling space. The first wall has at least one wafer transfer opening in front of which, at a side of the first wall which is directed to the cassette handling space, a wafer transfer position for a wafer cassette is provided. The cassette handling space comprises a cassette storage having a plurality of cassette storage positions and a cassette handler configured to transfer wafer cassettes between the cassette storage positions and the wafer transfer position. The cassette handler has a first cassette handler arm and a second cassette handler arm.
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公开(公告)号:US20210335595A1
公开(公告)日:2021-10-28
申请号:US17370197
申请日:2021-07-08
Applicant: ASM IP Holding B.V.
Inventor: Viljami Pore , Werner Knaepen , Bert Jongbloed , Dieter Pierreux , Gido van Der Star , Toshiya Suzuki
IPC: H01L21/02 , C23C16/455 , C23C16/50 , C23C16/04 , H01L21/762
Abstract: There is provided a method of filling one or more gaps by providing the substrate in a reaction chamber and introducing a first reactant to the substrate with a first dose, thereby forming no more than about one monolayer by the first reactant on a first area; introducing a second reactant to the substrate with a second dose, thereby forming no more than about one monolayer by the second reactant on a second area of the surface, wherein the first and the second areas overlap in an overlap area where the first and second reactants react and leave an initially unreacted area where the first and the second areas do not overlap; and, introducing a third reactant to the substrate with a third dose, the third reactant reacting with the first or second reactant remaining on the initially unreacted area.
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公开(公告)号:US20210333049A1
公开(公告)日:2021-10-28
申请号:US17236065
申请日:2021-04-21
Applicant: ASM IP Holding B.V.
Inventor: Melvin Verbaas , Christianus G.M. de Ridder
IPC: F27D3/00 , H01L21/67 , H01L21/677
Abstract: A vertical batch furnace assembly, comprising a core tube, an outer casing, a cooling chamber bounded and enclosed by the outer casing and the core tube, and at least one cooling gas supply emanating in the cooling chamber. The core tube has an elongated circumferential wall extending in a longitudinal direction, and is configured to accommodate wafers for processing in the vertical batch furnace. The outer casing extends around the core tube and comprises a heating element for applying a thermal treatment to wafers accommodated in the core tube. The at least one cooling gas supply comprises at least one cooling gas supply opening which is arranged such that the cooling gas enters the cooling chamber with a flow direction which is substantially tangent to the circumferential wall.
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公开(公告)号:US20210332479A1
公开(公告)日:2021-10-28
申请号:US17236782
申请日:2021-04-21
Applicant: ASM IP Holding B.V.
Inventor: KiKang KIM , HakYong KWON , HieChul KIM , SungKyu KANG , SeungHwan LEE , SungBae KIM , JongHyun AHN , SeongRyeong KIM , KyuMin KIM , YoungMin KIM
IPC: C23C16/455 , H01L21/3065 , H01L21/02 , C23C16/56
Abstract: This application relates to a method of filling a gap in a three-dimensional structure over a semiconductor substrate. The method may include depositing a thin film at least on a three-dimensional structure over a substrate using at least one reaction gas activated with a first radio frequency (RF) power having a first frequency, the three dimensional structure comprising a trench and/or hole. The method may also include etching the deposited thin film using at least one etchant activated with a second RF power having a second frequency lower than the first frequency. The method may further include repeating a cycle of the depositing and the etching at least once until the trench and/or hole are filled with the thin film. According to some embodiments, a thin film having substantially free of voids and/or seams can be formed in the three-dimensional structure.
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公开(公告)号:US20210332476A1
公开(公告)日:2021-10-28
申请号:US17113301
申请日:2020-12-07
Applicant: ASM IP Holding B.V.
Inventor: Pia Homm Jara , Werner Knaepen , Dieter Pierreux , Bert Jongbloed , Panagiota Arnou , Ren-Jie Chang , Qi Xie , Giuseppe Alessio Verni , Gido van der Star
IPC: C23C16/34 , H01L21/285 , C23C16/44 , C23C16/455 , C23C16/04 , C23C16/56
Abstract: The current disclosure relates to methods of forming a vanadium nitride-containing layer. The method comprises providing a substrate within a reaction chamber of a reactor and depositing a vanadium nitride-containing layer onto a surface of the substrate, wherein the deposition process comprises providing a vanadium precursor to the reaction chamber and providing a nitrogen precursor to the reaction chamber. The disclosure further relates to structures and devices comprising the vanadium nitride-containing layer.
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公开(公告)号:US20210331935A1
公开(公告)日:2021-10-28
申请号:US17238424
申请日:2021-04-23
Applicant: ASM IP Holding B.V.
Inventor: Charles Dezelah , Eric Shero
Abstract: Methods of stabilizing a vanadium compound in a solution, compositions including a vanadium compound and a stabilizing agent, apparatus including the composition, systems that use the composition, and methods of using the compositions, apparatus, and systems are disclosed. Use of the stabilizing agent allows for use of desired precursors, while mitigating unwanted decomposition of the precursors.
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公开(公告)号:US20210328036A1
公开(公告)日:2021-10-21
申请号:US17360045
申请日:2021-06-28
Applicant: ASM IP Holding B.V.
Inventor: Dong Li , Peng-Fu Hsu , Petri Raisanen , Moataz Bellah Mousa , Ward Johnson , Xichong Chen
IPC: H01L29/423 , H01L21/28 , H01L29/49
Abstract: Methods for depositing a doped metal carbide film on a substrate are disclosed. The methods may include: depositing a doped metal carbide film on a substrate utilizing at least one deposition cycle of a cyclical deposition process; and contacting the doped metal carbide film with a plasma generated from a hydrogen containing gas. Semiconductor device structures including a doped metal carbide film formed by the methods of the disclosure are also disclosed.
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公开(公告)号:US20210320020A1
公开(公告)日:2021-10-14
申请号:US17356900
申请日:2021-06-24
Applicant: ASM IP Holding B.V.
Inventor: Theodorus Oosterlaken , Chris de Ridder
Abstract: The disclosure relates to substrate processing apparatus, with a first and second reactor, each reactor configured for processing a plurality of substrates; and, a substrate handling robot constructed and arranged to transfer substrates between a substrate cassette at a substrate transfer position and the first and second reactor. The apparatus is constructed and arranged with a maintenance area between the first and second reactors to allow maintenance of the reactors from the maintenance area to both the first and second reactor.
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