摘要:
An analog-to-digital converter has a digital-to-analog converter, first, second and third comparators, and a sequential comparison register and control logic circuit. The digital-to-analog converter produces analog signals, the first, second and third comparators compare the input analog signal with first, second and third analog signals which are different from each other. Further, the sequential comparison register and control logic circuit controls the digital signals that are fed to the digital-to-analog converter from the first to third comparators, and outputs the digital signals as digital values obtained by subjecting the input analog signals to the analog-to-digital conversion.
摘要:
A current mirror circuit including: a first resistance element having one terminal connected to a first potential, and the other terminal connected to a second potential lower than the first potential; an operational amplifier having a high-potential input terminal connected to the first potential and the one terminal of the first resistance element; a second resistance element having one terminal connected to a low-potential input terminal of the operational amplifier, and the other terminal connected to the second potential; and a transistor having a first electrode connected to an output terminal of the operational amplifier, a second electrode connected to the low-potential input terminal of the operational amplifier and the one terminal of the second resistance element, and a third electrode used as an output terminal, wherein the first and second resistance elements both start to operate from a linear area having lower voltage than a saturation area.
摘要:
A manufacturing method for a CMOS semiconductor device in which gate electrodes are adjusted to have different work function values comprises forming an device region of a first and second conductivity type for forming first and second MOS semiconductor element devices, respectively, in a semiconductor substrate, forming a gate insulator, forming a laminated film comprising a molybdenum film and nitrogen containing film for doping nitrogen into molybdenum, doping nitrogen from the nitrogen containing film into molybdenum, processing the laminated film into gate electrodes of the first and second MOS semiconductor element devices, removing the nitrogen containing film from the gate electrodes of the second MOS semiconductor element device and covering the gate electrode of the first MOS semiconductor element devices with a nitrogen diffusion preventing film, and reducing the nitrogen concentration in molybdenum of the gate electrodes of the second MOS semiconductor element device. Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.
摘要:
The purpose of the invention is to determine an optimum initial value to be input to a test pattern generator in order to achieve efficient testing of an integrated circuit. To achieve this purpose, a minimum test length is obtained by performing a fault simulation and a reverse-order fault simulation using an arbitrarily given initial value; the next initial value that is likely to yield a test length shorter than the minimum test length is computed and a fault simulation is performed using the thus computed initial value; and the next initial value that is likely to yield a test length shorter than that test length is computed and a fault simulation is performed using the thus computed initial value. By repeating this process, an initial value that yields the shortest test length is obtained.
摘要:
A reciprocal square root for a radix of x is calculated when S[j] represents the partial result obtained after j iterations of calculation, W[j], a residual, and P[j], the product of an operand X and the S[j]. Firstly, appropriate values are set to the initial values S[0], W[0], and P[0]. Secondly, n iterations of calculations from j=0 to n−1 are performed. One calculation includes selecting a reciprocal square root digit qj+1 from the digit set {−a, . . . , −1, 0, 1, . . . , a}, and calculating a recurrence equation of the S[j], i.e., S[j+1]:=S[j]+qj+1r−j−1, a recurrence equation of the W[j], i.e., W[j+1]:=rW[j]−(2P[j]+Xqj+1r−j−1)qj+1, and a recurrence equation of the P[j], i.e., P[j+1]:=P[j]+Xqj+1r−j−1.
摘要:
In an encoding method of moving pictures which generates a predictive picture for a current picture based on a reference picture and a motion vector, a macroblock is divided into subblocks. In each of the plurality of subblocks, an initial value of the motion vector is set and an evaluated value E on a difference between the current picture and the reference picture is calculated along a steepest descent direction to determine the minimum value. Then, the smallest evaluated value is selected among the minimum values obtained on the plurality of subblocks to determine the motion vector based on the pixel position of the smallest value.
摘要:
An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.
摘要:
There is disclosed a current mirror circuit comprising a first transistor having a first electrode connected to a first potential, a second electrode connected to a second potential lower than the first potential, and a third electrode connected to a third potential higher than the second potential, a second transistor having a first electrode connected to the first potential and the first electrode of the first transistor, and a second electrode connected to the second potential, an operational amplifier having a high-potential input connected to the third potential and the third electrode of the first transistor, and a low-potential input connected to the third electrode of the second transistor, and a third transistor having a first electrode connected to an output of the operational amplifier, a second electrode connected to the low-potential input and the third electrode of the second transistor, and a third electrode used as an output terminal.
摘要:
An on-chip signal waveform measurement apparatus mounted on an IC chip measures signal waveforms at detection points on the IC chip. A reference voltage generator successively generates reference voltages different from each other based on a predetermined timing signal, and Signal probing front-end circuits are mounted to correspond to the detection points, respectively, and each buffer-amplifies a voltage at each detection point, compares the buffer-amplified voltage with each reference voltage, and digitizes a comparison result into a binary digital output signal. A multiplexer time-division-multiplexes the binary digital output signals from the signal probing front-end circuits. A data processing unit calculates a judgment output probability for a detected voltage at each detection point detected by the respective signal probing front-end circuits, by counting a number of times of a predetermined binary value of the multiplexed binary digital output signal.
摘要:
A complex band-pass ΔΣ AD modulator is provided with a subtracter device, a complex band-pass filter, first and second AD converters, and first and second DA converters. The first and second DA converters and first and second logic circuits are sandwiched by first and second multiplexers. At a first timing of a clock signal, the first multiplexer inputs and outputs the first and second digital signals as they are, and at a second timing thereof, the first multiplexer inputs the first and second digital signals, and outputs the first digital signal as a second digital signal and outputs the second digital signal as a first digital signal. The second multiplexer inputs and outputs first and second analog signals similarly. The first and second logic circuits substantially noise-shapes non-linearities of the first and second DA converters by realizing complex digital and analog filters, using high-pass and low-pass element rotation methods.