Sequential comparison-type AD converter having small size and realizing high speed operation
    21.
    发明授权
    Sequential comparison-type AD converter having small size and realizing high speed operation 失效
    顺序比较型AD转换器,体积小,实现高速运行

    公开(公告)号:US07561094B2

    公开(公告)日:2009-07-14

    申请号:US11889620

    申请日:2007-08-15

    IPC分类号: H03M1/38

    摘要: An analog-to-digital converter has a digital-to-analog converter, first, second and third comparators, and a sequential comparison register and control logic circuit. The digital-to-analog converter produces analog signals, the first, second and third comparators compare the input analog signal with first, second and third analog signals which are different from each other. Further, the sequential comparison register and control logic circuit controls the digital signals that are fed to the digital-to-analog converter from the first to third comparators, and outputs the digital signals as digital values obtained by subjecting the input analog signals to the analog-to-digital conversion.

    摘要翻译: 模拟 - 数字转换器具有数模转换器,第一,第二和第三比较器,以及顺序比较寄存器和控制逻辑电路。 数模转换器产生模拟信号,第一,第二和第三比较器将输入模拟信号与彼此不同的第一,第二和第三模拟信号进行比较。 此外,顺序比较寄存器和控制逻辑电路控制从第一至第三比较器馈送到数模转换器的数字信号,并将数字信号作为数字值输出,该数字值通过使输入的模拟信号经受模拟 数字转换。

    CURRENT MIRROR CIRCUIT
    22.
    发明申请
    CURRENT MIRROR CIRCUIT 失效
    当前镜像电路

    公开(公告)号:US20080297203A1

    公开(公告)日:2008-12-04

    申请号:US12189044

    申请日:2008-08-08

    IPC分类号: G05F3/26

    摘要: A current mirror circuit including: a first resistance element having one terminal connected to a first potential, and the other terminal connected to a second potential lower than the first potential; an operational amplifier having a high-potential input terminal connected to the first potential and the one terminal of the first resistance element; a second resistance element having one terminal connected to a low-potential input terminal of the operational amplifier, and the other terminal connected to the second potential; and a transistor having a first electrode connected to an output terminal of the operational amplifier, a second electrode connected to the low-potential input terminal of the operational amplifier and the one terminal of the second resistance element, and a third electrode used as an output terminal, wherein the first and second resistance elements both start to operate from a linear area having lower voltage than a saturation area.

    摘要翻译: 一种电流镜电路,包括:第一电阻元件,其具有连接到第一电位的一个端子,而另一个端子连接到低于第一电位的第二电位; 运算放大器,具有连接到第一电位的高电位输入端和第一电阻元件的一个端子; 第二电阻元件,其一端连接到运算放大器的低电位输入端,而另一端连接到第二电位; 以及晶体管,其具有连接到运算放大器的输出端的第一电极,连接到运算放大器的低电位输入端和第二电阻元件的一端的第二电极和用作输出的第三电极 端子,其中第一和第二电阻元件都从具有比饱和区域更低的电压的线性区域开始操作。

    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
    23.
    发明申请
    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF 审中-公开
    半导体器件及其制造方法

    公开(公告)号:US20070281415A1

    公开(公告)日:2007-12-06

    申请号:US11771916

    申请日:2007-06-29

    申请人: Kentaro Shibahara

    发明人: Kentaro Shibahara

    IPC分类号: H01L21/8238

    CPC分类号: H01L21/823842

    摘要: A manufacturing method for a CMOS semiconductor device in which gate electrodes are adjusted to have different work function values comprises forming an device region of a first and second conductivity type for forming first and second MOS semiconductor element devices, respectively, in a semiconductor substrate, forming a gate insulator, forming a laminated film comprising a molybdenum film and nitrogen containing film for doping nitrogen into molybdenum, doping nitrogen from the nitrogen containing film into molybdenum, processing the laminated film into gate electrodes of the first and second MOS semiconductor element devices, removing the nitrogen containing film from the gate electrodes of the second MOS semiconductor element device and covering the gate electrode of the first MOS semiconductor element devices with a nitrogen diffusion preventing film, and reducing the nitrogen concentration in molybdenum of the gate electrodes of the second MOS semiconductor element device. Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.

    摘要翻译: 其中栅电极被调整为具有不同功函数的CMOS半导体器件的制造方法包括在半导体衬底中分别形成用于形成第一和第二MOS半导体元件器件的第一和第二导电类型的器件区域,形成 栅极绝缘体,形成包含钼膜和含氮氮膜的层压膜,用于将氮掺杂到钼中,将含氮膜的氮掺杂到钼中,将层压膜加工成第一和第二MOS半导体元件器件的栅电极,去除 来自第二MOS半导体元件元件的栅电极的含氮膜,并且用氮扩散防止膜覆盖第一MOS半导体元件的栅电极,并且降低第二MOS半导体的栅电极的钼中的氮浓度 元件装置。 本领域技术人员将容易想到额外的优点和修改。 因此,本发明在其更广泛的方面不限于本文所示和所述的具体细节和代表性实施例。 因此,在不脱离由所附权利要求及其等同物限定的总体发明构思的精神或范围的情况下,可以进行各种修改。

    Method and apparatus for determining optimum initial value for test pattern generator
    24.
    发明授权
    Method and apparatus for determining optimum initial value for test pattern generator 失效
    用于确定测试图案发生器的最佳初始值的方法和装置

    公开(公告)号:US07299394B2

    公开(公告)日:2007-11-20

    申请号:US10400911

    申请日:2003-03-28

    IPC分类号: G01R31/28

    摘要: The purpose of the invention is to determine an optimum initial value to be input to a test pattern generator in order to achieve efficient testing of an integrated circuit. To achieve this purpose, a minimum test length is obtained by performing a fault simulation and a reverse-order fault simulation using an arbitrarily given initial value; the next initial value that is likely to yield a test length shorter than the minimum test length is computed and a fault simulation is performed using the thus computed initial value; and the next initial value that is likely to yield a test length shorter than that test length is computed and a fault simulation is performed using the thus computed initial value. By repeating this process, an initial value that yields the shortest test length is obtained.

    摘要翻译: 本发明的目的是确定要输入到测试图案发生器的最佳初始值,以便实现集成电路的有效测试。 为了达到这个目的,通过使用任意给定的初始值执行故障模拟和反向故障模拟来获得最小测试长度; 计算可能产生比最小测试长度短的测试长度的下一个初始值,并且使用由此计算的初始值来执行故障模拟; 并且计算可能产生比该测试长度短的测试长度的下一个初始值,并且使用由此计算的初始值来执行故障模拟。 通过重复该过程,获得产生最短测试长度的初始值。

    Method and hardware for computing reciprocal square root and program for the same
    25.
    发明授权
    Method and hardware for computing reciprocal square root and program for the same 失效
    用于计算相互平方根和程序的方法和硬件相同

    公开(公告)号:US07266578B2

    公开(公告)日:2007-09-04

    申请号:US10160966

    申请日:2002-05-31

    申请人: Naofumi Takagi

    发明人: Naofumi Takagi

    IPC分类号: G06F7/38

    摘要: A reciprocal square root for a radix of x is calculated when S[j] represents the partial result obtained after j iterations of calculation, W[j], a residual, and P[j], the product of an operand X and the S[j]. Firstly, appropriate values are set to the initial values S[0], W[0], and P[0]. Secondly, n iterations of calculations from j=0 to n−1 are performed. One calculation includes selecting a reciprocal square root digit qj+1 from the digit set {−a, . . . , −1, 0, 1, . . . , a}, and calculating a recurrence equation of the S[j], i.e., S[j+1]:=S[j]+qj+1r−j−1, a recurrence equation of the W[j], i.e., W[j+1]:=rW[j]−(2P[j]+Xqj+1r−j−1)qj+1, and a recurrence equation of the P[j], i.e., P[j+1]:=P[j]+Xqj+1r−j−1.

    摘要翻译: 当S [j]表示在 j次迭代计算之后获得的部分结果时,计算 x的基数的倒数平方根W [j] ,P [j],操作数X和S [j]的乘积。 首先,将适当的值设置为初始值S [0],W [0]和P [0]。 其次,执行从j = 0到n-1的n次迭代计算的。 。 。 ,-1,0,1,... 。 。 ,a},并且计算S [j]的递归方程,即S [j + 1]:= S [j] + q&lt; j + 1&lt; ,W [j]的递归方程,即W [j + 1]:= rW [j] - (2P [j] + Xq)j + 1 < 以及P [j]的递归方程,即P [j + 1]:= P [j] + Xq < SUB> j + 1 -j-1

    Image encoding of moving pictures
    26.
    发明授权
    Image encoding of moving pictures 失效
    运动图像的图像编码

    公开(公告)号:US07236634B2

    公开(公告)日:2007-06-26

    申请号:US10703547

    申请日:2003-11-10

    IPC分类号: G06K9/36

    CPC分类号: H04N19/61 H04N19/51

    摘要: In an encoding method of moving pictures which generates a predictive picture for a current picture based on a reference picture and a motion vector, a macroblock is divided into subblocks. In each of the plurality of subblocks, an initial value of the motion vector is set and an evaluated value E on a difference between the current picture and the reference picture is calculated along a steepest descent direction to determine the minimum value. Then, the smallest evaluated value is selected among the minimum values obtained on the plurality of subblocks to determine the motion vector based on the pixel position of the smallest value.

    摘要翻译: 在基于参考图像和运动矢量生成当前图像的预测图像的运动图像的编码方法中,宏块被划分为子块。 在多个子块中的每一个中,设置运动矢量的初始值,并且沿最陡下降方向计算当前画面与参考画面之间的差值的评估值E,以确定最小值。 然后,从在多个子块上获得的最小值中选择最小的评估值,以基于最小值的像素位置来确定运动矢量。

    Semiconductor integrated circuit incorporating test configuration and test method for the same
    27.
    发明申请
    Semiconductor integrated circuit incorporating test configuration and test method for the same 失效
    半导体集成电路结合测试配置和测试方法相同

    公开(公告)号:US20060282730A1

    公开(公告)日:2006-12-14

    申请号:US11397899

    申请日:2006-04-05

    IPC分类号: G01R31/28

    摘要: An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.

    摘要翻译: 本发明的一个目的是大大减少包含使用部分旋转扫描电路的测试配置的半导体集成电路中的面积开销。 为了实现这一点,在包括组合电路(3)和通过连接多个扫描触发器(5)构成的扫描链(2)的测试配置的半导体集成电路中,扫描链(2) )被分成多个子扫描链(20a至20n),每个子扫描链具有部分旋转扫描(PRS)功能和测试响应压缩(MISR)功能。 通过在将要设置为PRS的子扫描链和将被设置为MISR的副扫描链的组合改变的同时执行多个步骤中的扫描测试,可以执行测试而不必提供测试响应压缩器 与扫描链分开,因此可以减少面积开销。

    Current mirror circuit
    28.
    发明申请
    Current mirror circuit 失效
    电流镜电路

    公开(公告)号:US20060202763A1

    公开(公告)日:2006-09-14

    申请号:US11370630

    申请日:2006-03-08

    IPC分类号: H03F3/04

    摘要: There is disclosed a current mirror circuit comprising a first transistor having a first electrode connected to a first potential, a second electrode connected to a second potential lower than the first potential, and a third electrode connected to a third potential higher than the second potential, a second transistor having a first electrode connected to the first potential and the first electrode of the first transistor, and a second electrode connected to the second potential, an operational amplifier having a high-potential input connected to the third potential and the third electrode of the first transistor, and a low-potential input connected to the third electrode of the second transistor, and a third transistor having a first electrode connected to an output of the operational amplifier, a second electrode connected to the low-potential input and the third electrode of the second transistor, and a third electrode used as an output terminal.

    摘要翻译: 公开了一种电流镜电路,其包括第一晶体管,其具有连接到第一电位的第一电极,连接到低于第一电位的第二电位的第二电极和连接到高于第二电位的第三电位的第三电极, 第二晶体管,具有连接到第一电位的第一电极和第一晶体管的第一电极,以及连接到第二电位的第二电极,具有连接到第三电位的高电位输入的运算放大器和与第三电位相连的第三电极 第一晶体管和连接到第二晶体管的第三电极的低电位输入,以及具有连接到运算放大器的输出的第一电极的第三晶体管,连接到低电位输入的第二电极和第三晶体管, 第二晶体管的电极和用作输出端子的第三电极。

    On-chip signal waveform measurement apparatus for measuring signal waveforms at detection points on IC chip

    公开(公告)号:US20060197697A1

    公开(公告)日:2006-09-07

    申请号:US11366835

    申请日:2006-03-03

    申请人: Makoto Nagata

    发明人: Makoto Nagata

    IPC分类号: G01S13/00

    CPC分类号: G01R31/2884 G01R31/31924

    摘要: An on-chip signal waveform measurement apparatus mounted on an IC chip measures signal waveforms at detection points on the IC chip. A reference voltage generator successively generates reference voltages different from each other based on a predetermined timing signal, and Signal probing front-end circuits are mounted to correspond to the detection points, respectively, and each buffer-amplifies a voltage at each detection point, compares the buffer-amplified voltage with each reference voltage, and digitizes a comparison result into a binary digital output signal. A multiplexer time-division-multiplexes the binary digital output signals from the signal probing front-end circuits. A data processing unit calculates a judgment output probability for a detected voltage at each detection point detected by the respective signal probing front-end circuits, by counting a number of times of a predetermined binary value of the multiplexed binary digital output signal.

    Complex band-pass ΔΣ AD modulator for use in AD converter circuit
    30.
    发明授权
    Complex band-pass ΔΣ AD modulator for use in AD converter circuit 失效
    用于AD转换器电路的复合带通DeltaSigma AD调制器

    公开(公告)号:US07098828B2

    公开(公告)日:2006-08-29

    申请号:US11157848

    申请日:2005-06-22

    IPC分类号: H03M3/00 H03M1/00 H04B14/06

    摘要: A complex band-pass ΔΣ AD modulator is provided with a subtracter device, a complex band-pass filter, first and second AD converters, and first and second DA converters. The first and second DA converters and first and second logic circuits are sandwiched by first and second multiplexers. At a first timing of a clock signal, the first multiplexer inputs and outputs the first and second digital signals as they are, and at a second timing thereof, the first multiplexer inputs the first and second digital signals, and outputs the first digital signal as a second digital signal and outputs the second digital signal as a first digital signal. The second multiplexer inputs and outputs first and second analog signals similarly. The first and second logic circuits substantially noise-shapes non-linearities of the first and second DA converters by realizing complex digital and analog filters, using high-pass and low-pass element rotation methods.

    摘要翻译: 复数带通DeltaSigma AD调制器具有减法器件,复带通滤波器,第一和第二AD转换器以及第一和第二DA转换器。 第一和第二DA转换器和第一和第二逻辑电路夹在第一和第二多路复用器之间。 在时钟信号的第一定时,第一多路复用器原样输入并输出第一和第二数字信号,并且在其第二定时,第一多路复用器输入第一和第二数字信号,并将第一数字信号作为 第二数字信号并输出​​第二数字信号作为第一数字信号。 第二多路复用器类似地输入和输出第一和第二模拟信号。 通过使用高通和低通元素旋转方法实现复杂的数字和模拟滤波器,第一和第二逻辑电路基本上噪声地形成第一和第二DA转换器的非线性。