摘要:
A memory line driver system may include a first input line to receive a clock-gated signal associated with a first supply power level, a second input line to receive an information signal associated with a second supply power level, and an output to drive a memory cell line according to the first supply power level based on the clock-gated signal and the information signal.
摘要:
For one disclosed embodiment, an apparatus comprises a first p-type device coupled between a cell voltage node and a storage node, an n-type device coupled between the storage node and a reference voltage node, and a second p-type device to couple the storage node to a bit line in response to a signal on a select line. At least one side of diffusion regions in a substrate to form both the first p-type device and the second p-type device are substantially aligned. Other embodiments are also disclosed.
摘要:
A method and device for reducing power during an instruction lane divergence includes idling an inactive execution lane during the lane divergence.
摘要:
A heterogeneous cache structure provides several memory cells into different ways each associated with different minimum voltages below which the memory cells produce substantial state errors. Reduced voltage operation of the cache may be accompanied by deactivating different ways according to the voltage reduction. The differentiation between the memory cells in the ways may be implemented by devoting different amounts of integrated circuit area to each memory cell either by changing the size of the transistors comprising the memory cell or devoting additional transistors to each memory cell in the form of shared error correcting codes or backup memory cells.
摘要:
The number of power-gating transistors on an integrated circuit used for power reduction in a sleep mode is controlled during a wake state to adjust the current flow and hence voltage drop across the power-gating transistors as a function of aging of these transistors and/or a function of temperature of the integrated circuit. In this way, the supply voltage to the integrated circuit may be better tailored to minimize current leakage when the integrated circuit is young or operating at low temperatures.
摘要:
A field effect transistor includes a partial SiGe channel, i.e., a channel including a SiGe channel portion, located underneath a gate electrode and a Si channel portion located underneath an edge of the gate electrode near the drain region. The SiGe channel portion can be located directly underneath a gate dielectric, or can be located underneath a Si channel layer located directly underneath a gate dielectric. The Si channel portion is located at the same depth as the SiGe channel portion, and contacts the drain region of the transistor. By providing a Si channel portion near the drain region, the GIDL current of the transistor is maintained at a level on par with the GIDL current of a transistor having a silicon channel only during an off state.
摘要:
Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.
摘要:
A memory system having a selectable configuration for sense amplifiers is included. The memory system can include bit cells and a switch module coupled to the bit cell and to a first portion of a sense amplifier. The switch module can connect, disconnect or cross couple the bit cell to the sense amplifier based on a test for the input offset voltage of first portion of the sense amplifier. A similar configuration can be implemented by a second portion of the sense amplifier. The system can also include a programmer module to configure a setting of the switch module and can include a column select module to couple the bit cells to the sense amplifiers based on what column of bit cell is to be read. Other embodiments are also disclosed.
摘要:
In some embodiments, an array of sleep transistors is provided, wherein a combination of said transistors may be enabled during an active mode to reduce leakage depending on the leakage characteristics of a chip or associated chip.
摘要:
Methods and apparatus to reduce aging effect on memory are described. In one embodiment, a modified version of data is stored in a portion of a storage unit during a first time period.