Technique for sensing the rotational speed and angular position of a rotating wheel using a variable threshold
    21.
    发明授权
    Technique for sensing the rotational speed and angular position of a rotating wheel using a variable threshold 失效
    使用可变阈值感测旋转轮的转速和角位置的技术

    公开(公告)号:US06965227B2

    公开(公告)日:2005-11-15

    申请号:US09747503

    申请日:2000-12-20

    Inventor: Lothar Blossfeld

    CPC classification number: G01P3/481 G01P21/02

    Abstract: To detect the rotational speed and angular position of a rotating wheel, a non-contact sensor (e.g., an optical sensor or a Hall sensor) scans scan marks on the wheel, and generates a pulse train. The amplitude of the pulses is compared in a comparator with a variable switching threshold. To achieve accurate measurement results, and to compensate for offset and long-term drift of the sensor, the switching threshold is adjusted if one or more of the following conditions is met: (i) the difference between the pulse amplitude and the switching threshold exceeds a fixable first maximum, (ii) the difference of the amplitudes of two successive pulses exceeds a fixable second maximum, (iii) the difference of the frequencies of successive pulses exceeds a fixable third maximum. The method is particularly advantageous in a motor vehicle, to detect the rotational speed and angular position for an electronic ignition system, or the rotational speed and angular position of the wheels for an ABS braking system, an anti-skid system, or a vehicle stabilization system.

    Abstract translation: 为了检测旋转轮的旋转速度和角位置,非接触传感器(例如,光学传感器或霍尔传感器)扫描车轮上的扫描标记,并产生脉冲串。 在比较器中将脉冲的幅度与可变切换阈值进行比较。 为了实现精确的测量结果,并且为了补偿传感器的偏移和长期漂移,如果满足以下条件中的一个或多个,则调整切换阈值:(i)脉冲幅度和切换阈值之间的差超过 (ii)两个连续脉冲的幅度差超过可固定的第二最大值,(iii)连续脉冲的频率差超过可固定的第三最大值。 该方法在机动车辆中特别有利,以检测用于电子点火系统的转速和角位置,或用于ABS制动系统,防滑系统或车辆稳定的车轮的转速和角位置 系统。

    Two wire sensor device
    22.
    发明授权
    Two wire sensor device 失效
    两线传感器装置

    公开(公告)号:US06437581B1

    公开(公告)日:2002-08-20

    申请号:US09558286

    申请日:2000-04-25

    Inventor: Lothar Blossfeld

    CPC classification number: G08C19/02

    Abstract: Two-wire sensors for measuring physical quantities have only two connections (A1, A2), which serve to connect the power supply and also to conduct the measuring signals. However, because two-wire sensors have the property of controlled current sources, they can be connected only in parallel. Consequently, for a parallel circuit of n two-wire sensors disposed at different locations, two n lines are required. To reduce the number of lines, a two-wire sensor is provided with an end stage (W), which generates an output voltage (UA), which is a measure of the physical quantity measured by a measuring sensor (S) and which is always greater than an adjustable reference voltage signal (Uref). Because the inventive two-wire sensor therefore has the property of a voltage source, several of them can be connected in series. Consequently, even for a series circuit of several two-wire sensors, only two lines are required.

    Abstract translation: 用于测量物理量的双线传感器只有两个连接(A1,A2),用于连接电源,并进行测量信号。 然而,因为双线传感器具有受控电流源的特性,所以它们只能并联连接。 因此,对于设置在不同位置的n个双线传感器的并联电路,需要两条n线。 为了减少线数,双线传感器设置有终端(W),其产生输出电压(UA),其是由测量传感器(S)测量的物理量的量度,其是 始终大于可调参考电压信号(Uref)。 因为本发明的双线传感器因此具有电压源的特性,其中几个可以串联连接。 因此,即使对于几根双线传感器的串联电路,也只需要两条线。

    Method and apparatus for processing a measurement signal
    23.
    发明授权
    Method and apparatus for processing a measurement signal 失效
    用于处理测量信号的方法和装置

    公开(公告)号:US06320430B1

    公开(公告)日:2001-11-20

    申请号:US09675794

    申请日:2000-09-29

    Inventor: Lothar Blossfeld

    CPC classification number: G01R19/25

    Abstract: A system for processing a signal s(t) from a sensor to recover sensed signal information within the bandwidth of the summation signal, wherein the signal s(t) includes a sensed signal m(t) and an offset signal having a first frequency f1. The system comprises: a sampling device for sampling the signal s(t) at a second frequency f2 that is a multiple of the first frequency f1, to create a sequence of sampled values; and an averaging device for averaging the sequence of sampled values to provide a sequence of averaged sampled values indicative of the sensed signal m(t).

    Abstract translation: 一种用于处理来自传感器的信号s(t)的系统,用于恢复在求和信号的带宽内的感测信号信息,其中信号s(t)包括感测信号m(t)和具有第一频率f1 。 该系统包括:采样装置,用于以第一频率f1的倍数的第二频率f2对信号s(t)进行采样,以产生采样值序列; 以及用于平均采样值序列以提供指示感测信号m(t)的平均采样值序列的平均装置。

    Collector contact of an integrated bipolar transistor
    24.
    发明授权
    Collector contact of an integrated bipolar transistor 失效
    集成双极晶体管的集电极接触

    公开(公告)号:US4992843A

    公开(公告)日:1991-02-12

    申请号:US433406

    申请日:1989-11-03

    CPC classification number: H01L29/41708 H01L21/743 H01L29/7325

    Abstract: A collector contact (6) is fabricated which is attached on the side to the collector zone (1), and around which a moat (3) is produced which laterally restricts the collector zone (1). The depth of the moat (3) is so dimensioned to be at least equal to the vertical thickness of the collector zone (1). The collector contact (6) comprises a polycrystalline silicon layer which contains dopants of the same conductivity type as the collector zone (1), and covers a highly doped contacting zone (7') which has been diffused from the adjoining collector contact (6).

    Abstract translation: 制造收集器触点(6),该收集器触点(6)附接在收集器区域(1)的一侧,并且围绕该收集器触点(3)横向地限制收集器区域(1)。 护城河(3)的深度的尺寸被设计成至少等于集水区(1)的垂直厚度。 集电极触点(6)包括多晶硅层,其含有与集电区(1)相同的导电类型的掺杂剂,并且覆盖从相邻的集电极触点(6)扩散的高度掺杂的接触区(7'), 。

    Method of making a self-aligned silicide contact using polysilicon
electrode as an etch mask
    25.
    发明授权
    Method of making a self-aligned silicide contact using polysilicon electrode as an etch mask 失效
    使用多晶硅电极作为蚀刻掩模进行自对准硅化物接触的方法

    公开(公告)号:US4882297A

    公开(公告)日:1989-11-21

    申请号:US205589

    申请日:1988-06-13

    Inventor: Lothar Blossfeld

    Abstract: In fabricating the contact, the electrode layer of polycrystalline silicon whose rim portion is bonded via a layer portion of insulating material to the substrate, is used at least throughout the length of a part of its rim portion for the lateral delimitation of a etching process, as an etch mask, in the course of which a frame-shaped layer portion is formed underneath the rim portion of the electrode layer, and the contact area of the substrate as bordering on the layer portion is exposed. Following the deposition of a metal layer of a metal forming a silicide in a thickness smaller than the thickness of the layer portion, and the heating for forming the silicide, the metal which has so far not reacted with the silicon, is removed by using an etching agent selectively dissolving the metal.

    Abstract translation: 在制造接触时,其边缘部分经由绝缘材料的层部分结合到基底上的多晶硅的电极层至少在其边缘部分的整个长度上用于蚀刻工艺的横向限定, 作为蚀刻掩模,其中在电极层的边缘部分下方形成框状层部分,并暴露出与层部分相邻的基板的接触面积。 在形成厚度小于层部分厚度的硅化物的金属的金属层沉积之后,以及用于形成硅化物的加热,迄今未与硅反应的金属通过使用 蚀刻剂选择性地溶解金属。

    Process for manufacturing a monolithic integrated circuit comprising at
least one bipolar planar transistor
    26.
    发明授权
    Process for manufacturing a monolithic integrated circuit comprising at least one bipolar planar transistor 失效
    一种用于制造包括至少一个双极平面晶体管的单片集成电路的工艺

    公开(公告)号:US4778774A

    公开(公告)日:1988-10-18

    申请号:US28472

    申请日:1987-03-20

    Inventor: Lothar Blossfeld

    Abstract: The invention includes a method of manufacture of monolithic integrated VLSI circuits comprising bipolar transistors whose base regions are contacted in a self-aligned manner in proximity to the respective emitter regions by the use of silicide layers. The invention starts out from a process which, when using an insulating masking layer portion covering up the emitter area of the planar transistor, permits the self-aligned fabrication of emitter regions extending to the adjoining base region and to the base contacting region. Further embodiments of the process according to the invention permit the simultaneous manufacture of co-integrated CMOS circuits and of polycrystalline. Si-conductor leads whose resistances are reduced owing to the use of silicide layers.

    Abstract translation: 本发明包括制造单片集成VLSI电路的方法,其包括双极晶体管,其基极区域通过使用硅化物层以自对准的方式接近相应的发射极区域而接触。 本发明从以下过程开始,当使用覆盖平面晶体管的发射极区域的绝缘屏蔽层部分允许自对准制造延伸到相邻基极区域和基极接触区域的发射极区域。 根据本发明的方法的其它实施方案允许同时制造共同集成的CMOS电路和多晶。 由于使用硅化物层,电阻降低的Si导体引线。

    Method for manufacturing bipolar planar transistors
    27.
    发明授权
    Method for manufacturing bipolar planar transistors 失效
    制造双极平面晶体管的方法

    公开(公告)号:US4483738A

    公开(公告)日:1984-11-20

    申请号:US576866

    申请日:1984-02-03

    Inventor: Lothar Blossfeld

    CPC classification number: H01L29/66295 H01L21/0337

    Abstract: A method of manufacturing bipolar transistors is described. The emitter areas are protected by means of an oxidation masking layer and subsequently after applying a photo-resist layer which defines the base areas two implantation processes of ions of the base zone conductivity type are performed. The one is performed with low doping dose and high acceleration voltage sufficient to render the masking layer penetrable and the other with high doping dose and low acceleration voltage as to render the masking layer impenetrable.

    Abstract translation: 描述制造双极晶体管的方法。 通过氧化屏蔽层来保护发射极区域,并且随后在施加限定基极区域的光致抗蚀剂层之后,执行基极区导电类型的离子的两个注入工艺。 以低掺杂剂量和足够高的加速电压进行该掩模层的渗透,另一个以高掺杂剂量和低加速电压进行,以使掩蔽层不可穿透。

    Process for manufacturing a monolithic integrated solid-state circuit
comprising at least one bipolar planar transistor
    28.
    发明授权
    Process for manufacturing a monolithic integrated solid-state circuit comprising at least one bipolar planar transistor 失效
    包括至少一个双极平面晶体管的单片集成固态电路的制造方法

    公开(公告)号:US4477965A

    公开(公告)日:1984-10-23

    申请号:US404931

    申请日:1982-08-03

    Inventor: Lothar Blossfeld

    CPC classification number: H01L29/66272 H01L29/7322 Y10S438/919 Y10S438/98

    Abstract: The invention proposes a process for manufacturing a monolithic integrated circuit comprising at least one bipolar transistor in which the dopings of the regions are inserted into the substrate (2) exclusively by way of ion implantations. The invention deals with the problem of the current gain value variations during mass-production. This problem is solved in that during the implantation of the base dopings, in which the base area (32) is defined by means of a photoresist mask (5), the emitter area (11) is covered with an oxidation masking layer portion (71), with the ions of the base region (3) being implanted into the substrate surface once at a low accelerating energy and a great dose, with the oxidation masking layer portion (71) serving as the mask and, the next time, at a high accelerating energy and a relatively small dose, in the course of which the oxidation masking layer portion (1) is penetrated.

    Abstract translation: 本发明提出了一种用于制造单片集成电路的方法,其包括至少一个双极晶体管,其中仅通过离子注入将区域的掺杂插入到衬底(2)中。 本发明涉及量产期间当前增益值变化的问题。 这个问题的解决之处在于,在通过光致抗蚀剂掩模(5)限定基底区域(32)的基底掺杂的注入过程中,发射区域11被氧化屏蔽层部分71覆盖 ),其中基底区域(3)的离子以低加速能量和大剂量注入基板表面,氧化掩模层部分(71)用作掩模,并且下一次在 高加速能量和相对小的剂量,其中氧化掩模层部分(1)被穿透。

    Planar diffusion method for an I.sup.2 L circuit including a bipolar
analog circuit part
    29.
    发明授权
    Planar diffusion method for an I.sup.2 L circuit including a bipolar analog circuit part 失效
    用于I {HU 2 {B L电路的平面扩散方法,包括双极模拟电路部分

    公开(公告)号:US4043849A

    公开(公告)日:1977-08-23

    申请号:US625339

    申请日:1975-10-23

    CPC classification number: H01L21/2252 H01L21/8226 H01L27/0244 Y10S148/087

    Abstract: This relates to a method of producing a monolithic integrated I.sup.2 L circuit including a bipolar analog circuit part. In order to realize good current gain values in the I.sup.2 L transistors as well as high collector breakdown voltages in the analog circuit part, the base zone of the analog circuit part is prediffused prior to diffusion of the I.sup.2 L base and injector regions. After such prediffusion, excessive doping material from the diffusion masking layer is removed and simultaneously windows in the diffusion mask over the I.sup.2 L base and injector regions are opened. Next, doping material having a lower concentration than that which was used for the prediffusion of the analog base region is prediffused into the exposed regions of the substrate. This results in an expanded prediffused base region in the analog circuit part.

    Abstract translation: 这涉及制造包括双极模拟电路部分的单片集成I2L电路的方法。 为了在I2L晶体管中实现良好的电流增益值以及模拟电路部分中的高集电极击穿电压,模拟电路部分的基极区在I2L基极和注入器区域扩散之前被预扩散。 在这样的预扩散之后,去除来自扩散掩蔽层的过量的掺杂材料,并且同时打开I2L基极和注入器区域上的扩散掩模中的窗口。 接下来,将具有比用于模拟基区的预扩散的浓度低的掺杂材料预先扩散到衬底的暴露区域中。 这导致模拟电路部分中扩展的预扩展基区。

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