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91 条记录 (耗时 0.026 秒)

    IC socket with attached electronic component
    23.
    发明授权
    IC socket with attached electronic component 有权
    IC插座带有电子元件

    公开(公告)号：US08051554B2

    公开(公告)日：2011-11-08

    申请号：US12104038

    申请日：2008-04-16

    申请人： Daisuke Koizumi ,  Shigeyuki Maruyama ,  Kazuhiro Tashiro ,  Naoyuki Watanabe

    发明人： Daisuke Koizumi ,  Shigeyuki Maruyama ,  Kazuhiro Tashiro ,  Naoyuki Watanabe

    IPC分类号： B23P19/00 ,  H01L21/44

    CPC分类号： B25B27/14 ,  H05K7/1061 ,  Y10T29/4913 ,  Y10T29/53174 ,  Y10T29/53178 ,  Y10T29/53183 ,  Y10T29/53187 ,  Y10T29/53191 ,  Y10T29/53943

    摘要： An IC socket in which an electronic component is attached to a predetermined position of the IC socket, the IC socket including a fixed part including a contact pin which is connected to a terminal of the electronic component when a position of the electronic component is aligned to the predetermined position of the IC socket using an electronic component attaching tool, the contact pin including a pair of end portions on an upper surface of the fixed part; a movable part that is movable to the fixed part when the movable part is pushed down to apply a force to the contact pin of the fixed part so as to separate the pair of end portions of the contact pin from each other; and a standard part that is formed on the movable part and engages with the electronic component attaching tool to align a position of the electronic component attaching tool to the standard part when a position of the electronic component is aligned to the predetermined position of the IC socket using the electronic attaching tool, the standard part having a shape which does not substantially depend on an external shape of the electronic component.

    摘要翻译： 一种IC插座，其中电子部件附接到IC插座的预定位置，IC插座包括固定部分，该固定部分包括接触销，当电子部件的位置与电子部件的位置对准时，该接触销连接到电子部件的端子 所述IC插座的预定位置使用电子部件安装工具，所述接触销包括在所述固定部的上表面上的一对端部; 可移动部分，当可移动部分被向下推动时，可移动到固定部分，以向固定部分的接触销施加力，以将接触销的一对端部彼此分离; 以及形成在可动部上并与电子部件安装工具接合的标准部分，当电子部件的位置与IC插座的预定位置对准时，将电子部件安装工具的位置对准标准部件 使用电子连接工具，标准部件具有基本上不依赖于电子部件的外部形状的形状。

    Contact piece member, contactor and contact method
    24.
    发明授权
    Contact piece member, contactor and contact method 有权
    接触件，接触器和接触方式

    公开(公告)号：US07795552B2

    公开(公告)日：2010-09-14

    申请号：US11802315

    申请日：2007-05-22

    申请人： Shigeyuki Maruyama ,  Toru Nishino

    发明人： Shigeyuki Maruyama ,  Toru Nishino

    IPC分类号： H01H1/02

    CPC分类号： G01R1/06755 ,  H01L2924/0002 ,  H01L2924/00

    摘要： In a contactor contact piece members can be arranged at a fine pitch, and a contact can be made surely by a small contact pressure. The contact piece members electrically connect an electronic part to an external circuit. The contact piece member is formed of an electrically conductive material in a generally spherical shape. A molecular density of a central part of the contact piece member is lower than a molecular density of a part near a surface. The electrically conductive material may include at least one of an electrically conductive fine particle, an electrically conductive fiber and an electrically conductive filler.

    摘要翻译： 在接触器中，接触片部件可以以细间距布置，并且可以通过小的接触压力可靠地进行接触。 接触件将电子部件电连接到外部电路。 接触片部件由大致球形的导电材料形成。 接触片构件的中心部分的分子密度低于靠近表面的部分的分子密度。 导电材料可以包括导电细颗粒，导电纤维和导电填料中的至少一种。

    Testing device and testing method of a semiconductor device
    29.
    发明授权
    Testing device and testing method of a semiconductor device 有权
    半导体器件的测试装置和测试方法

    公开(公告)号：US07129726B2

    公开(公告)日：2006-10-31

    申请号：US11211094

    申请日：2005-08-25

    申请人： Kazuhiro Tashiro ,  Yasuyuki Itou ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka

    发明人： Kazuhiro Tashiro ,  Yasuyuki Itou ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2887

    摘要： A testing device can perform a test on an arbitrary one of a plurality of semiconductor devices by pressing the semiconductor devices onto a contactor from a back side of the semiconductor device. A test circuit board has a contactor provided with contact pieces corresponding to external connection terminals of semiconductor devices to be tested. A support board is capable of mounting the semiconductor devices thereon in an aligned state. A stage supports the support board. A press head presses the semiconductor devices to be tested mounted on the support board so as to cause external connection terminals of the semiconductor devices to be tested to contact with the contact pieces of the contactor. The stage is movable to a position at which at least one of the semiconductor devices to be tested, which are mounted on the support board, faces the contactor.

    摘要翻译： 测试装置可以通过将半导体器件从半导体器件的背面按压到接触器上来对多个半导体器件中的任意一个进行测试。 测试电路板具有接触器，该接触器具有与待测试的半导体器件的外部连接端子相对应的接触片。 支撑板能够以对准状态将半导体器件安装在其上。 舞台支持支持板。 压头按压待安装在支撑板上的待测试的半导体器件，以便使半导体器件的外部连接端子被测试以与接触器的接触片接触。 舞台可移动到安装在支撑板上的要测试的半导体器件中的至少一个面向接触器的位置。

    Contactor for electronic parts and a contact method
    30.
    发明申请
    Contactor for electronic parts and a contact method 有权
    电子零件接触器和接触方式

    公开(公告)号：US20060186905A1

    公开(公告)日：2006-08-24

    申请号：US11339836

    申请日：2006-01-26

    申请人： Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    发明人： Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    IPC分类号： G01R31/02

    CPC分类号： G01R1/0466 ,  G01R1/0483

    摘要： A contactor for electronic parts can provide an appropriate and uniform contact with respect to a plurality of electrode terminals in an electronic part such as an IC. Each of a plurality of contact members has a first contact portion on one end thereof and a second contact portion on the other end thereof, the first contract portion having a recessed portion that receives one of the electrode terminals of the electronic part. A base accommodates and supports the plurality of the contact members. The first contact portion is movable in a horizontal direction.

    摘要翻译： 用于电子部件的接触器可以提供相对于诸如IC的电子部件中的多个电极端子的适当且均匀的接触。 多个接触构件中的每一个在其一端具有第一接触部分和另一端的第二接触部分，第一接合部分具有容纳电子部件的电极端子之一的凹部。 基座容纳并支撑多个接触构件。 第一接触部分可沿水平方向移动。