摘要:
In an output buffer circuit including Inverter 1 to Inverter 3, Delay Circuit 1 to Delay Circuit 3 for delaying an input signal for a specific time, Buffer 1 to Buffer 3, and a function for transmitting a logic signal to a transmission path and in accordance with an amount of signal attenuation in the transmission path, creating at a transmission side a waveform including four or more kinds of signal voltages, the preemphasis amount is made variable and the ON resistance Rs of the buffer is made constant. Selector circuit 1 to Selector circuit 3 are situated before the buffers, the inverter, capable of selecting through selector logic a signal to be inputted to the buffer, inverts a data signal, and the preemphasis amount and the number of preemphasis taps are adjusted through a selection signal for the selector logic.
摘要:
In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is converted to a nonlinear characteristic to data with a linear scale according to a table memory for reverse-log conversion. A known voltage value is inputted into the log amplifier to perform measurement, and calibration of the table memory is performed by storing the voltage value and the voltage value data after A/D-converted.
摘要:
In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP′ are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH′ of the even side and the decision edge HL of the odd side, respectively.
摘要:
An ultra-thin resin molded semiconductor device of high reliability with low cost and with easy repair at time of mounting. A plurality of these semiconductor devices are stacked to provide a semiconductor module which has a higher function than semiconductor devices in the same volume, and a card type module utilizing assembled by the stacked semiconductor module is provided. In manufacturing the semiconductor module, an extremely thin lead frame and an LSI chip are directly connected together, and the mirror surface of the LSI chip is exposed by using a low viscosity epoxy resin to have a thin molding. The mirror surface is grinded to have a further thin thickness of the whole structure of the semiconductor device. A part of the lead frame is formed as a reinforcing member, a heat radiation path, a light shielding part for shielding the LSI from harmful light beams, or a positioning base for mounting a substrate. The above ultra-thin resin molded semiconductor devices are interconnected together in a stacked layout to provide a stacked semiconductor module, and to provide a card type device having a higher function.
摘要:
In a digital circuitry apparatus in which clock distribution can be performed with high accuracy even in the case where variations in delay time are caused by variations in the apparatus operating condition, programmed input data set to delay circuits are corrected by a circuit portion for measuring the delay time of a phase shifting adjustment delay circuit with respect to variations in delay time caused by variations in the apparatus operating condition, a first arithmetic operation circuit for calculating the rate of variation on the basis of measured values, and a second arithmetic operation circuit for calculating the quantity of variation on the basis of the rate of variation.
摘要:
A wave formatter for generating an output waveform used in a logic circuit testing system is disclosd. The wave formatter includes a data generator for outputting in parallel a plurality of data signals having a polarity and a type in response to a control signal for determining the polarity of the data signals and a control data signal for determining the type of the data signals which are received on external input lines of the data generator in synchronism with a test cycle clock. The data generator decodes the control data signals to produce the plurality of data signals in parallel. A shift data supply is provided which receives the plurality of data signals from the data generator and samples the plurality of data signals to output in parallel data signals in response to the test cycle clock. A timing control is provided with external lines for receiving clock input signals and which generate a signal for controlling an operation mode of a shift register on the basis of the clock input signals which are externally supplied to the external lines. A shift register receives the data in parallel with the shift data supply and the signal for controlling an operation mode and outputs the output waveform serially as a function of the signal for controlling an operation mode.
摘要:
An output buffer includes inverters, a delay circuit for delaying an input signal, buffers and switches. The output buffer transmits a logic signal to a transmission path and, in accordance with an amount of signal attenuation in the transmission path, creates a waveform including four or more kinds of signal voltages. The buffers are redundantly connected in parallel, and the number of buffers concurrently turn ON is controlled by respective switches provided in series with output resistors of the buffers. By selecting the buffers of switches which are turned ON, the preemphasis amount and a number of preemphasis taps are adjusted through a selector logic selection signal so that the preemphasis amount is made variable and the ON resistance of the buffers is made constant.
摘要:
A semiconductor device according to the present invention has a liquid crystal driver circuit, and when gray-scale voltage thereof is tested, the gray-scale voltage (Vx) generated in a gray-scale voltage generator circuit provided therein is compared with reference voltage (e.g., Vx+ΔV) generated for testing the gray-scale voltage and the test result is output as binarized voltage from external terminals of the semiconductor device. This can speed up the gray-scale voltage test even in the case of higher gray scale in the liquid crystal driver circuit or increased number of output terminals of the semiconductor device. Therefore, it becomes possible to reduce the time and cost required for the test.
摘要:
In an output buffer circuit including Inverter 1 to Inverter 3, Delay Circuit 1 to Delay Circuit 3 for delaying an input signal for a specific time, Buffer 1 to Buffer 3, and a function for transmitting a logic signal to a transmission path and in accordance with an amount of signal attenuation in the transmission path, creating at a transmission side a waveform including four or more kinds of signal voltages, the preemphasis amount is made variable and the ON resistance Rs of the buffer is made constant. Selector circuit 1 to Selector circuit 3 are situated before the buffers, the inverter, capable of selecting through selector logic a signal to be inputted to the buffer, inverts a data signal, and the preemphasis amount and the number of preemphasis taps are adjusted through a selection signal for the selector logic.
摘要:
A problem, which one of the inventions included in the present application solves, is to provide a semiconductor device that can simultaneously test a plurality of output pins by less channels of a semiconductor test equipment in number than the integrated output pins of the semiconductor device. Representative one of the inventions has such a configuration that an LCD driver, which is the semiconductor device having a function of driving a gate line of a liquid crystal display panel, comprises: an exclusive-OR circuit for inverting polarities of positive and negative voltages for driving the gate line; a tri-state type inverter circuit capable of changing and controlling, to a high-impedance state, an output circuit for driving the gate line; and at least one of test control terminals TEST for controlling the exclusive-OR circuit and the tri-state type inverter circuit. When a test is conducted, only one terminal of the gate output outputs a positive voltage VGH or negative voltage VGL and the other terminal is set to a high-impedance state, whereby the plurality of gate outputs are simultaneously tested.