TWO-TIER DEFECT SCAN MANAGEMENT
    21.
    发明公开

    公开(公告)号:US20240069765A1

    公开(公告)日:2024-02-29

    申请号:US17894794

    申请日:2022-08-24

    CPC classification number: G06F3/0629 G06F3/0625 G06F3/0679

    Abstract: A system can include a processing device operatively coupled with the one or more memory devices, to perform operations that include writing data to the one or more memory devices and performing one or more scan operations on a management unit containing the data to determine a current value of a chosen data state metric. Each scan operation can be performed using a corresponding predetermined read-time parameter value. The operations can include determining whether the current value of the chosen data state metric satisfies a criterion, and can also include, responsive to determining that the current value of the chosen data state metric satisfies the criterion, selecting a remedial operation by determining whether redundancy metadata is included in a fault tolerant data stripe on the one or more memory devices. The operations can also include performing the remedial operation with respect to the management unit.

    Memory device including dynamic programming voltage

    公开(公告)号:US11742034B2

    公开(公告)日:2023-08-29

    申请号:US17745415

    申请日:2022-05-16

    CPC classification number: G11C16/3404 G11C16/10 G11C16/26 G11C16/30

    Abstract: Some embodiments include apparatus and methods using access lines, first memory cells coupled to an access line of the access lines, and a control unit including circuitry. The control unit is configured to apply a first voltage to the access line; check first threshold voltages of the first memory cells after applying the first voltage; obtain offset information based on a determination that at least one of the first threshold voltages is greater than a selected voltage; generate a second voltage, the second voltage being a function of the first voltage and the offset information; and apply the second voltage to one of the access lines during an operation of storing information in second memory cells.

    MEMORY ACCESS MANAGMENT
    26.
    发明申请

    公开(公告)号:US20230063057A1

    公开(公告)日:2023-03-02

    申请号:US17458835

    申请日:2021-08-27

    Abstract: A method includes detecting an occurrence of an event associated with a memory sub-system comprising blocks of non-volatile memory cells. The method further includes responsive to detecting the occurrence of the event, providing signaling to disable at least a portion of the memory sub-system, an interface coupled to the memory sub-system, or both.

    RESUMPTION OF PROGRAM OR ERASE OPERATIONS IN MEMORY

    公开(公告)号:US20220165340A1

    公开(公告)日:2022-05-26

    申请号:US17102876

    申请日:2020-11-24

    Abstract: A system includes a memory component and a processing device, operatively coupled with the memory component, to send a read command to the memory component while a program or erase operation being executed by the memory component is suspended. The processing device, operatively coupled with the memory component, can then send an auto resume command to the memory component to automatically resume execution of the program or erase operation after the read command is executed.

    CACHE RELEASE COMMAND FOR CACHE READS IN A MEMORY SUB-SYSTEM

    公开(公告)号:US20220138108A1

    公开(公告)日:2022-05-05

    申请号:US17452764

    申请日:2021-10-28

    Abstract: A memory device includes a page cache comprising a cache register, a memory array configured with a plurality of memory planes, and control logic, operatively coupled with the memory array. The control logic receives, from a requestor, a cache release command indicating that data associated with a first subset of the plurality of memory planes and pertaining to a previous read command was received by the requestor. Responsive to the cache release command, the control logic returns to the requestor, data from the cache register and associated with a second subset of the plurality of memory planes and pertaining to the previous read command, while concurrently copying data associated with the first subset of the plurality of memory planes and pertaining to a subsequent read command into the cache register.

    Apparatus for programming memory cells using multi-step programming pulses

    公开(公告)号:US11238937B2

    公开(公告)日:2022-02-01

    申请号:US16935740

    申请日:2020-07-22

    Inventor: Eric N. Lee

    Abstract: Memories having a controller configured to apply a particular multi-step programming pulse to a selected access line of a programming operation, enable for programming memory cells that have a particular desired data state for the programming operation and are deemed to have a threshold voltage lower than a first threshold voltage level while applying a first step of a multi-step programming pulse to the selected access line, and enable for programming memory cells that have the particular desired data state for the programming operation and are deemed to have a threshold voltage lower than a second threshold voltage level and higher than the first threshold voltage level while applying a second step of the multi-step programming pulse, lower than the first step of the multi-step programming pulse, to the selected access line.

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