On-die cross-temperature management for a memory device

    公开(公告)号:US12067290B2

    公开(公告)日:2024-08-20

    申请号:US17591406

    申请日:2022-02-02

    IPC分类号: G06F3/06

    摘要: Control logic in a memory device receives a request to read data from a memory array of a memory device, the request comprising an indication of a segment of the memory array where the data is stored, and determines whether a write temperature associated with the data is stored in a flag byte corresponding to the segment of the memory array. Responsive to determining that the write temperature associated with the data is stored in the flag byte, the control logic determines a cross-temperature for the data based on the write temperature and a read temperature at a time when the request to read the data is received, determines a program/erase cycle count associated with the segment of the memory array, and determines, based on the cross-temperature and the program/erase cycle count, whether to perform a corrective action to calibrate a read voltage level to be applied to the memory array to read the data from the segment.

    APPARATUS AND METHODS FOR PERFORMING SUCCESSIVE ARRAY OPERATIONS IN A MEMORY

    公开(公告)号:US20230298680A1

    公开(公告)日:2023-09-21

    申请号:US18110489

    申请日:2023-02-16

    IPC分类号: G11C16/34 G11C16/10 G11C16/20

    摘要: Memories might include a controller configured to cause the memory to prepare a first plurality of memory cells of a block of memory cells for programming from an initialization state of the block of memory cells, program the first data to the first plurality of memory cells, and, in response to receiving a write command associated with a second address corresponding to the block of memory cells and with second data before successfully verifying programming of the first data to the first plurality of memory cells, prepare a second plurality of memory cells of the block of memory cells corresponding to the second address for programming without returning the block of memory cells to the initialization state after programming the first data to the first plurality of memory cells.

    SELECTIVELY PROGRAMMING RETIRED WORDLINES OF A MEMORY DEVICE

    公开(公告)号:US20230214133A1

    公开(公告)日:2023-07-06

    申请号:US18090449

    申请日:2022-12-28

    IPC分类号: G06F3/06

    摘要: A memory device comprises an array of memory cells organized into a plurality of wordlines, and a processing device to perform processing operations that receive a program command specifying a memory unit and data comprising first received data, where the plurality of wordlines includes one or more first active data wordlines and a group of consecutive retired wordlines. The processing operations also program the specified data to the memory unit by programming the first received data to the one or more first active data wordlines, identifying a first retired boundary wordline that is in the group of consecutive retired wordlines and is adjacent to one of the first active data wordlines, generating a first data pattern comprising a first plurality of threshold voltage levels, and programming the first data pattern to the first retired boundary wordline.

    EXPRESS PROGRAMMING USING ADVANCED CACHE REGISTER RELEASE IN A MEMORY SUB-SYSTEM

    公开(公告)号:US20230065421A1

    公开(公告)日:2023-03-02

    申请号:US17675526

    申请日:2022-02-18

    摘要: Control logic in a memory device initiates an express programming operation to program the set of memory cells to a target programming level of a set of programming levels. A set of data associated with the express programming operation is stored in a cache register. At a first time during the execution of the express programming operation, a prediction operation is executed to determine a prediction result corresponding to a programming status of the set of memory cells. The prediction result is compared to a threshold level to determine whether a condition is satisfied. The release of the set of data from the cache register is caused in response to satisfying the condition.