Abstract:
The transmission delay time of a receiver for receiving a differential signal is reduced. A first amplifier circuit is provided in an input stage of the receiver, and a second amplifier circuit is provided in an output stage of the receiver. The first amplifier circuit is a differential input, differential output amplifier circuit. The second amplifier circuit is a differential input, single-ended output amplifier circuit. A first power supply voltage and a second power supply voltage are input as a high-level power supply voltage and a low-level power supply voltage to the first amplifier circuit and the second amplifier circuit, respectively. The withstand voltage of transistors of a differential pair of the first amplifier circuit is higher than the withstand voltage of another transistor included in the first amplifier circuit and a transistor included in the second amplifier circuit.
Abstract:
An object is to reduce leakage current and parasitic capacitance of a transistor used for an LSI, a CPU, or a memory. A semiconductor integrated circuit included in an LSI, a CPU, or a memory is manufactured using the transistor which is formed using an oxide semiconductor which is an intrinsic or substantially intrinsic semiconductor obtained by removal of impurities which serve as electron donors (donors) from the oxide semiconductor and has larger energy gap than a silicon semiconductor, and is formed over a semiconductor substrate. With the transistor which is formed over the semiconductor substrate and includes the highly purified oxide semiconductor layer with sufficiently reduced hydrogen concentration, a semiconductor device whose power consumption due to leakage current is low can be realized.
Abstract:
A battery-monitoring IC with small power consumption is provided. A power storage device includes a storage element and an IC. The IC monitors the electromotive force of the power storage element. The IC includes a bias circuit, a holding circuit, and an amplifier. The holding circuit includes a first transistor and a capacitor. The amplifier includes a second transistor. The bias circuit is electrically connected to a gate of the second transistor through the first transistor. A first terminal of the capacitor is electrically connected to the gate of the second transistor. A first transistor preferably includes an oxide semiconductor in a channel formation region.
Abstract:
A semiconductor device with a novel structure is provided. A semiconductor device with reduced power consumption is provided. A circuit which is configured to supply a signal from an input terminal to both a gate and a backgate of a transistor in a first state and to only the gate in a second state is provided. With this structure, a current supply capability of the transistor can be changed between operations; accordingly, power consumption can be reduced by the amount needed to charge the backgate.
Abstract:
A decrease in the capacity of a power storage device is inhibited by adjusting or reducing imbalance in the amount of inserted and extracted carrier ions between positive and negative electrodes, which is caused by decomposition of an electrolyte solution of the negative electrode. Further, the capacity of the power storage device can be restored. Furthermore, impurities in the electrolyte solution can be decomposed with the use of the third electrode. A power storage device including positive and negative electrodes, an electrolyte, and a third electrode is provided. The third electrode has an adequate electrostatic capacitance. The third electrode can include a material with a large surface area. In addition, a method for charging the power storage device including the steps of performing charging by applying a current between the positive and negative electrodes, and performing additional applying a current between the third electrode and the negative electrode is provided.
Abstract:
It is an object to provide a semiconductor device having a new productive semiconductor material and a new structure. The semiconductor device includes a first conductive layer over a substrate, a first insulating layer which covers the first conductive layer, an oxide semiconductor layer over the first insulating layer that overlaps with part of the first conductive layer and has a crystal region in a surface part, second and third conductive layers formed in contact with the oxide semiconductor layer, an insulating layer which covers the oxide semiconductor layer and the second and third conductive layers, and a fourth conductive layer over the insulating layer that overlaps with part of the oxide semiconductor layer.
Abstract:
A semiconductor device including a test circuit is miniaturized. The semiconductor device includes r first input terminals (r is an integer of 2 or more), a second input terminal, r functional circuits, a demultiplexer, and a switch circuit. The demultiplexer is a pass transistor logic circuit. R output terminals of the demultiplexer are electrically connected to respective input terminals of the functional circuit and the input terminal is electrically connected to the second input teiminal. Input terminals of the r circuits are electrically connected to the respective first input terminals through the switch circuit. For example, a signal for verification is input to the first input terminal in verification of the functional circuit to operate the demultiplexer. One signal for verification is input to r functional circuits by the demultiplexer.
Abstract:
A circuit which detects an output current from a pixel and an output current from an input device, and converts the output current into data is provided. The current detection circuit includes an integrator circuit, a comparator, a counter, and a latch. The integrator circuit integrates the potential of a first signal during a period determined by a second signal and outputting it as a third signal. The comparator compares the potential of the third signal with a first potential and outputting a fourth signal. The counter outputs the number of pulses included in a fifth signal as a sixth signal during a period determined by the fourth signal. The latch holds the sixth signal. The integrator circuit preferably further includes an operational amplifier and some capacitors. The first signal is supplied from a pixel included in a display device or an input portion included in an input device.
Abstract:
It is an object to provide a semiconductor device having a new productive semiconductor material and a new structure. The semiconductor device includes a first conductive layer over a substrate, a first insulating layer which covers the first conductive layer, an oxide semiconductor layer over the first insulating layer that overlaps with part of the first conductive layer and has a crystal region in a surface part, second and third conductive layers formed in contact with the oxide semiconductor layer, an insulating layer which covers the oxide semiconductor layer and the second and third conductive layers, and a fourth conductive layer over the insulating layer that overlaps with part of the oxide semiconductor layer.
Abstract:
A novel oscillator, an amplifier circuit, an inverter circuit, an amplifier circuit, a battery control circuit, a battery protection circuit, a power storage device, a semiconductor device, an electric device, and the like are provided. The semiconductor device includes an oscillator including a first transistor containing a metal oxide, and a second transistor to a fifth transistor, in which a first potential is supplied to a gate of the second transistor and a gate of the third transistor when the first transistor is turned on, and the first potential is held when the first transistor is turned off. The oscillator supplies a first signal based on the first potential to a first circuit. The first circuit performs at least one of shaping and amplification on the first signal. The second transistor and the fourth transistor are connected in series, and the third transistor and the fifth transistor are connected in series. A source or a drain of the third transistor is electrically connected to a gate of the fourth transistor, and a source or a drain of the fourth transistor is electrically connected to the gate of the third transistor.