摘要:
There is provided a method of and an apparatus for detecting delay faults in phase-locked loop circuits. A frequency impulse is applied to a phase-locked loop circuit under test as the reference clock, and a waveform of a signal outputted from the phase-locked loop circuit under test is transformed to an analytic signal to estimate an instantaneous phase of the analytic signal. A linear phase is estimated from the estimated instantaneous phase, and the estimated linear phase is removed from the estimated instantaneous phase to obtain a fluctuation term of the instantaneous phase. A delay time is measured from this fluctuation term of the instantaneous phase, and further, a delay fault is detected by comparing a time duration during which the phase-locked loop circuit remains in a state of oscillating a certain frequency with a time duration during which a fault-free phase-locked loop circuit remains in a state of oscillating that certain frequency.
摘要:
A measuring apparatus including a timing jitter estimator which estimates an output timing jitter sequence which indicates the output timing jitter of an output signal based on an output signal output from a DUT in response to an input signal input to the DUT, and a jitter transfer function estimator which estimates a jitter transfer function in the DUT based on the output timing jitter sequence. The jitter transfer function estimator includes an instantaneous phase noise estimator which estimates an instant phase noise of the output signal based on an output signal, and a resampler which generates the output timing jitter sequence by resampling the instantaneous phase noise at predetermined timing.
摘要:
There is provided a clock generator for generating a single-phase clock into which jitter has been injected, having a multi-phase clock generating section for generating a plurality of clock signals having an almost equal phase difference from each other and a jitter injecting section for injecting jitter into the respective clock signals.
摘要:
A wideband signal analyzing apparatus for analyzing an input signal includes frequency-shifting means for generating a plurality of intermediate frequency signals by shifting a frequency of the input signal as much as respectively different frequency-shifting amounts, so that if a frequency band of the input signal is divided into a plurality of frequency bands, each of the frequency bands can be shifted to a predetermined intermediate band, spectrum measuring means for outputting a complex spectrum of each of the intermediate frequency signals, and spectrum reconstructing means for merging the complex spectra.
摘要:
A testing apparatus for testing a device under test (DUT) includes a performance board; a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT based on an output signal output by the DUT; a pin electronics between the main frame and the performance board and performs sending and receiving signals between the main frame and the DUT; a deterministic jitter injecting unit for receiving the output signal without passing through the pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through the pin electronics; and a switching unit for determining whether the input pin of the DUT is provided with the test signal output by the pin electronics or the loop signal output by the deterministic jitter injecting unit.
摘要:
A measuring apparatus for measuring reliability against jitter of an electronic device, including: a jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device based on an output signal output from the electronic device according to an input signal input through a transmission line of which the transmission length is shorter than a predetermined length so that it does not generate a deterministic jitter; a jitter tolerance degradation quantity estimator operable to estimate a quantity of degradation of the jitter tolerance which deteriorates by the deterministic jitter caused in the input signal by transmission through the long transmission line when the input signal is input into the electronic device through the transmission line, of which the transmission length is longer than a predetermined length so that it may cause the deterministic jitter; a system jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device and a jitter tolerance of a system including the long transmission line and the electronic device based on quantity of degradation of the jitter tolerance, is provided.
摘要:
A testing device for testing an electronic device is provided. The testing device includes: a deterministic jitter application unit for applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying the input signal with the deterministic jitter to the electronic device; a jitter amount controller for controlling the magnitude of the deterministic jitter generated by the deterministic jitter application unit; and a determination unit for determining whether or not the electronic device is defective based on an output signal output from the electronic device in accordance with the input signal.
摘要:
A signal under measurement is transformed into a complex analytic signal using Hilbert transformation to estimate an instantaneous phase of the signal under measurement from the complex analytic signal. A least mean square line of the instantaneous phase is calculated to obtain a linear instantaneous phase of the signal under measurement, and a zero-crossing timing of the signal under measurement is estimated using an interpolation method. Then a difference between the instantaneous phase and the linear instantaneous phase at the zero-crossing timing is calculated to estimate a timing jitter sequence. A jitter of the signal under measurement is obtained from the jitter sequence.
摘要:
A clock skew measuring apparatus for measuring a clock skew between a plurality of clock signals to be measured in a device under test, includes: a clock signal selecting element for receiving clock signals and outputting them by selecting one of the clock signals one by one; and a clock skew estimator for receiving a reference signal input to the device under test and the clock signals to be measured selected by the clock signal selecting element one by one and for obtaining the clock skew between the clock signals to be measured.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.