Abstract:
The present invention provides a method for measuring the amount of free sulfurous acid and bound sulfurous acid in a sample using a bacterium belonging to Thiobacillus thiooxidans or Thiobacillus ferrooxidans of in which the sample is treated with acid and/or alkali to give free sulfurous acid alone in the sample. Then, the total amount of free sulfurous acid in the sample is measured by an oxidation reaction of free sulfurous acid to sulfuric acid using a bacterium belonging to Thiobacillus thiooxidans or Thiobacillus ferrooxidans.
Abstract:
A display apparatus includes a first panel having an electrode provided on one surface thereof, a second panel having an electrode provided on the surface thereof facing to the electrode of the first panel, display material intervened between the electrodes of the first and second panels and a spacer disposed between the first and second panels, the peripheral portions of the first and second panels being sealed by sealing material. In this case, one of the first and second panels comprises a substrate and an elastic plate which is sealed to the substrate with its periphery, and fluid is sealed into a space defined by the substrate and elastic plate with such a pressure that the elastic plate contacts the spacer.
Abstract:
Disclosed is a substrate processing apparatus including: a substrate processing unit that performs substrate processing by supplying a processing liquid to a substrate to be processed; a positioning mechanism that contacts the sides of the substrate to determine the position of the substrate; a positioning driver that drives the positioning mechanism; a detector that detects the position of the positioning mechanism; a storage unit that stores the position of the positioning mechanism with respect to a reference substrate serving as a reference of the substrate as a reference position information; and an operator that calculates a difference between the reference position information and the position information of the positioning mechanism detected in the detector and calculates measurement information on the processed substrate based on the difference.
Abstract:
A liquid processing apparatus including: a second housing; a first housing capable of being brought into contact with the second housing; a holding part configured to hold an object to be processed; a rotation driving part configured to rotate the object to be processed held by the holding part; front-side process-liquid supply nozzle configured to supply a process liquid onto a peripheral portion of a front surface of the object to be processed held by the holding part; and a storage part disposed on a side of a rear surface of the object to be processed held by the holding part, the storage part being configured to store the process liquid having been passed through the object to be processed. The respective first housing and the second housing can be moved in one direction, so that the first housing and the second housing can be brought into contact and separated from each other.
Abstract:
A processing system 1 comprises: a processing vessel 30 configured to accommodate an object to be processed W in a processing space 83; a process-fluid generating part 41 configured to generate a process fluid of a predetermined temperature; and a main duct 56 arranged between the process-fluid generating part 41 and the processing vessel 30, the main duct 56 being configured to guide the process fluid supplied from the process-fluid generating part 41. A process-fluid supply duct 171 is arranged on a downstream side of the main duct 56 via a switching valve 70, the process-fluid supply duct 171 being configured to introduce the process fluid into the processing space 83 of the processing vessel 30. A process-fluid bypass duct 172 is arranged on the downstream side of the main duct 56 via the switching valve 70, the process-fluid bypass duct 172 being configured to guide a process fluid, which is not introduced to the process-fluid supply duct 171, so as to bypass the processing space 83. The main duct 56 is provided with a flow-rate adjusting mechanism 65 for adjusting a flow rate of the process fluid flowing through the main duct 56.
Abstract:
Disclosed is a liquid processing apparatus which performs a liquid processing by supplying a chemical liquid from a chemical liquid supplying unit to substrate rotating around a vertical axis, and includes a cover member arranged at an upper surface of substrate to oppose the substrate and have a space therebetween is provided with a gas supplying port, and gas is supplied from gas supplying port toward the space. The gas is discharged from the space through a gap between protrusion at the circumferential edge of cover member protruding downward and the substrate. In addition, lamp heater heating the circumferential edge of substrate is arranged in the space along the circumferential direction of substrate, the chemical liquid supplied from a chemical liquid supplying unit is supplied to a position closer to the circumferential edge side than a position at which lamp heater is provided.
Abstract:
A processing system 1 comprises: a processing vessel 30 configured to accommodate an object to be processed W in a processing space 83; a process-fluid generating part 41 configured to generate a process fluid of a predetermined temperature; and a main duct 56 arranged between the process-fluid generating part 41 and the processing vessel 30, the main duct 56 being configured to guide the process fluid supplied from the process-fluid generating part 41. A process-fluid supply duct 171 is arranged on a downstream side of the main duct 56 via a switching valve 70, the process-fluid supply duct 171 being configured to introduce the process fluid into the processing space 83 of the processing vessel 30. A process-fluid bypass duct 172 is arranged on the downstream side of the main duct 56 via the switching valve 70, the process-fluid bypass duct 172 being configured to guide a process fluid, which is not introduced to the process-fluid supply duct 171, so as to bypass the processing space 83. The main duct 56 is provided with a flow-rate adjusting mechanism 65 for adjusting a flow rate of the process fluid flowing through the main duct 56.
Abstract:
A video display system employs a flat panel of the X-Y matrix type with a brightness control circuit in which both the amplitude and the duration of driving pulses for the display panel are varied in response to variations in the sequentially sampled level of input video signals. In a preferred brightness control circuit, variations in the sequentially sampled level of the input video signals are converted into digitally coded signals which selectively energize respective pulse generators operative to produce pulses of correspondingly weighted durations and amplitudes which overlap in time, and such pulses are combined to provide the amplitude- and width or duration-modulated driving pulses for the display panel.
Abstract:
A flat gas discharge panel comprising two opposed glass plates sealed with a space for gas therebetween and having a plurality of first and second electrodes, respectively mounted on opposite plates in a matrix fashion and further including a plurality of parallel insulator ribs which intersect the first electrodes at right angles and further provide physical separation between the glass plates and the adjacent discharge segments. A plurality of parallel barrier electrodes are mounted on one of the plates in alignment with the insulator ribs so as to maintain the glow from an illuminated section isolated from adjacent sections, and at least two different phosphors for emitting different color lights are mounted in the sections at different positions.