Abstract:
A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.
Abstract:
Force sensing probes for use in scanning probe microscopes and a method for coating such probes with a film comprising a magnetostrictive material are provided. The probes may be magnetized by placing them in a magnetic field which can be oriented in any direction with respect to the probes. The magnetostrictive effect leads to a compression or expansion of the magnetic film, altering its length by the strength of the applied field. This in turn causes the probe, which in a preferred embodiment is in the form of a cantilever, and the applied magnetic film, to deflect or bend. The consequent motion of the probe is much greater than that obtained by direct application of a magnetic force and the effect is not sensitive to the direction of the applied field.
Abstract:
A magnetic force sensor for detecting a magnetic force of a magnetic sample having a given magnetization direction comprises a magnetic probe having a tip portion. The tip portion is coated with a film of hard-magnetic material effective to maintain the magnetization direction of the probe constant and parallel to the given magnetization direction of the sample. A biasing member has the magnetic probe attached thereto at a free end thereof and is resiliently deflectable in response to the magnetic force between the magnetic probe and the magnetic sample. When the magnetic probe is scanned across the magnetic sample, the distribution of the magnetic force on the magnetic sample is effectively detected.
Abstract:
Techniques for ultrahigh density writing on an erasable magnetic medium include using a micromachined mechanism having two probes for writing to the medium. Use of the two probe embodiment eliminates the need to change the magnetic orientation of the probe. In another embodiment, a single probe is provided which is heated to the vicinity of its Curie temperature to enable the magnetic orientation of the probe to be switched. The probe may be heated to its Curie temperature through the use of a heating element or a focused laser. In another embodiment of the present invention, either the magnetic orientation of the probe or the magnetic orientation of the medium may be switched through the combination of a static magnetic field, a radio frequency magnetic field and, under certain circumstances, the magnetic field of the probe. In all cases, the writing techniques enable information to be written to a magnetic medium in a manner which enables the information to be erased and the medium rewritten.
Abstract:
In accordance with a first aspect of the present invention, the sensitivity of a magnetically modulated AC-AFM is substantially improved by the use of a ferrite-core solenoid for modulating the magnetic cantilever of the ACAFM. In accordance with a second aspect of the present invention, the detection system for a magnetically modulated AC-AFM incorporates AC coupling of the signal from the position sensitive detector/beam deflection detector in order to remove the DC component of the signal, resulting in significantly improved dynamic range over systems utilizing DC coupling. High frequency modulation signals are detected through the use of fast analog multipliers which, after active filtering, give a low frequency signal which may be processed by digital electronics. In accordance with a third aspect of the present invention, operation of the microscope at small amplitudes of oscillation leaves small asperities on the tip intact and results in dramatic improvement in resolution.
Abstract:
A magnetic memory device comprises: a vertically magnetic recording medium; a probe formed of an electrically conductive as well as soft-magnetic material, a pointed end of the probe faces the magnetically recording medium across a gap; a magnetic flux detecting element for detecting a magnetic flux caught by the probe, where the magnetic flux is from a data recorded on the magnetically recording medium; a vertical controller for keeping the gap constant by the use of a tunnel current flowing via said gap into the probe while a voltage is applied across the gap; and a scan mechanism for scanning the probe along the magnetically recording medium. The magnetic memory device may further comprises an exciting coil for magnetizing the probe so as to write a data in the magnetically recording medium. The probe may be recessed from the scanning position when the probe is not in operation.
Abstract:
A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits.
Abstract:
The present invention discloses a method of measuring magnetic fields on magnetically recorded media. The method entails replacing the metal tip typically used with a scanning tunneling microscope with a flexible thin-film nickel of iron magnetic probe. The present invention describes a mathematical equation that relates probe position to magnetic field strength. In order to establish a tunneling current between the magnetic probe and the magnetically recorded media, any protective layer on the magnetically recorded media is removed. The magnetic probe and the magnetically recorded media may be coated with at least three-hundred angstroms of gold in order to reduce spurious probe deflections due to oxide growths on either the magnetic probe or the magnetically recorded media. The scanning tunneling microscope is designed to maintain a constant tunneling current between the probe and the item being scanned. The present invention uses the scanning tunneling microscope to scan the recording tracks of magnetically recorded media. Any change in the magnetic field of the magnetically recorded media will cause a change in the tunneling current. The microscope will change the position of the probe in order to maintain a constant tunneling current. These changes in position are recorded as an image. A mathematical equation that relates probe position to magnetic field strength is then used to extract the magnetic fields of the magnetically recorded media from the recorded image of probe positions.
Abstract:
A modified hybrid Hall effect device is provided which is the combination of a conventional Hall effect device and a second Hall effect device having a Hall plate coupled to a ferromagnetic layer. The hybrid Hall effect device can be used to determine the independent magnetic field vector components comprising a vector magnetic field, such as for determining the {circumflex over (x)} and the {circumflex over (z)} components of a magnetic field, or for measuring the total magnitude of a vector magnetic field of any orientation. The modified Hall Effect device can be adapted for use as a magnetic field sensor for the detection of macroscopic objects that have associated magnetic fields, or for microscopic objects that have been tagged by microscopic magnetic particles. In one specific form, a plurality of hybrid Hall devices are electrically connected together to form an array in which a plurality of rows of hybrid Hall devices are electrically coupled to each other along a current axis, and the array is used for the detection of microscopic objects.
Abstract:
A scanning magnetism detector includes a probe made of a solid material formed of a single crystal having spin polarization and electrical conductivity properties. When the probe is brought into proximity with a magnetic substance, a surface condition of the magnetic substance can be detected by measuring tunnel current flow between the probe and the surface of the magnetic substance.