Abstract:
A complementary read-only memory (ROM) cell includes a transistor; and a bit line and a complementary bit line adjacent to the transistor; wherein a drain terminal of the transistor is connected to one of the bit line and the complementary bit line based on data programmed in the ROM cell.
Abstract:
A video window detector includes a region characteristic determiner to generate at least one characteristic value for at least one region of a display output; a characteristic map generator to generate an image map from the at least one characteristic value for at least one region of the display output; and a window detector to detect at least one video window dependent on the image map.
Abstract:
According to an embodiment, a method of generating a clock pulse includes receiving a leading edge at a clock input at a time when an enable signal is active, generating an edge at a clock output based on the received leading edge at the clock input, latching a logic value corresponding to the edge at the clock output, preventing changes at the clock input from affecting the latched logic value after the logic value is latched, resetting the latched logic value after a first delay time, and maintaining the reset logic value until a second edge is received at the clock input. The second edge at the clock input matches the leading edge at the clock input.
Abstract:
Repair control logic for a safe memory having redundant elements is provided. The repair control logic includes comparison logic including, for each bit slice of a memory array, a comparator circuit configured to determine whether a location value of an associated bit slice of the memory array is greater than a location value of a defective bit slice of the memory array, and data switching logic including, for each bit slice of the memory array, a switching circuit, responsive to a determination that the location value of the associated bit slice is greater than the location value of the defective bit slice, to switch data from the associated bit slice to an adjacent bit slice of the memory array.
Abstract:
A stand-alone DC power network is provided with a DC to DC power converter only, and does not have a converter that will convert AC to DC. In addition, each of the different terminals that provides the DC voltage at different levels will be ranked according to priority as to which ones are the most important to supply the full voltage to, and which ones are of secondary importance in the event there is insufficient power in the system to provide full voltage at the specified current for the different loads. A processor monitors the voltage and current at each of the terminals, and in the event a current is attempted to be drawn from the system which would cause a first priority terminal to be reduced in voltage, the processor will instead reduce the power provided to the second priority terminal and ensure that the first priority terminal does not have a significant reduction in the specified voltage or the amount of current supplied to that terminal at the specified voltage.
Abstract:
The On-Chip Clock (OCC) circuit is for testing an integrated circuit having logic blocks connected in scan chains. An OCC controller is configured to receive a plurality of clock signals and output a plurality of shift/capture clock signals for use by the scan chains of logic blocks, the plurality of shift/capture clock signals including at least two consecutive at-speed capture clock pulses. An OCC monitor is configured to provide a verification of OCC operation based upon the at least two consecutive at-speed capture clock pulses. The OCC monitor may include a plurality of registers configured to provide delayed pulses based upon the at least two consecutive at-speed capture clock pulses, a counter configured to count differences between the delayed pulses, and an output register coupled to the counter and configured to provide a static data verification (e.g. output on an integrated circuit pad) for the test engineer.
Abstract:
Repair control logic for a safe memory having redundant elements is provided. The repair control logic includes comparison logic including, for each bit slice of a memory array, a comparator circuit configured to determine whether a location value of an associated bit slice of the memory array is greater than a location value of a defective bit slice of the memory array, and data switching logic including, for each bit slice of the memory array, a switching circuit, responsive to a determination that the location value of the associated bit slice is greater than the location value of the defective bit slice, to switch data from the associated bit slice to an adjacent bit slice of the memory array.
Abstract:
A dual rail SRAM array includes a plurality of columns of memory cells each coupled between two bit lines. A sense amplifier is coupled between each pair of bit lines. Capacitors are positioned between the sense amplifier outputs and the bit lines, thereby separating the sense amplifier from the bit lines. The memory cells are powered with an array supply voltage. The sense amplifier is powered with a peripheral supply voltage. During a read operation of the memory array, the bit lines are precharged to the array supply voltage. The sense amplifier is precharged to the peripheral supply voltage or to an intermediate voltage.
Abstract:
An IC Card comprises a first device, including a first processor and a first memory unit, to communicate with a handset, and a second device. The second device includes a second processor and a second memory unit, to communicate via a wireless communication with an electronic apparatus external to the handset, the second device providing predetermined services. Each predetermined service is programmed to receive a wireless message from a respective electronic apparatus, to execute a predetermined elaboration operation, and to return a result to the respective electronic apparatus. The second memory unit stores a plurality of additional programs for executing additional elaborations operations, each program being associated to one of the predetermined services. The second device has a run-time environment for executing the additional programs when the corresponding predetermined services receives the wireless message.
Abstract:
A system for power measurement in an electronic device includes a sensing unit, an analog-to-digital converter (ADC) and a controller. The sensing unit senses voltage across a power source and modulates a carrier signal based on the sensed voltage. The ADC converts a combination of the modulated carrier signal and audio signals received by the electronic device to generate a digitized combined signal and provides the digitized combined signal to the controller. The controller separates digitized modulated carrier signal and digitized audio signals. The digitized modulated carrier signal is demodulated to generate an output signal that provides a measure of the power consumed by the electronic device.