摘要:
In a method of erasing a non-volatile memory device an electric field is applied between a plurality of word lines and a substrate to erase memory cells in a memory block simultaneously. After a first time period elapses, the electric field applied between a first portion of the plurality of word lines and the substrate is maintained to erase memory cells, while the electric field between a second portion of the plurality of word lines and the substrate is removed or reduced.
摘要:
A non-volatile semiconductor memory device comprises first and second sub-memory arrays and a strapping line disposed between the first and second sub-memory arrays. A programming operation of the first sub-memory array is performed by simultaneously applying a programming voltage to odd and even bit lines connected to memory cells within the first sub-memory array.
摘要:
A nonvolatile memory device includes a memory cell array having multiple memory cells arranged at intersections of word lines and bit lines, a first page region configured with at least two adjacent memory cells coupled to a word line, and a second page region configured with at least two adjacent memory cells coupled to the word line. The nonvolatile memory devices also includes a first common source line connecting with the memory cells of the first page region, and a second common source line connecting with the memory cells of the second page region. The first and second common source lines are controlled independently.
摘要:
A NAND flash memory device includes a control circuit configured to apply, during a program operation, a first word line voltage to non-selected ones of a plurality of serially-connected memory cells, a second word line voltage greater than the first word line voltage to a selected one of the plurality of memory cells, and a third word line voltage lower than the first word line voltage to a dummy memory cell connected in series with the plurality of memory cells. In other embodiments, a control circuit is configured to program a dummy memory cell before and/or after each erase operation on a plurality of memory cells connected in series therewith. In still other embodiments, a control circuit is configured to forego erasure of a dummy memory cell while erasing a plurality of memory cells connected in series therewith.
摘要:
A non volatile memory device and method of operating including providing a verification voltage to a gate of a selected memory cell within multiple memory cells and providing a first pass voltage to a gate of a non-selected memory cell within the memory cells during a program verification operation; and providing a read voltage to the gate of the selected memory cell and providing a second pass voltage to the gate of the non-selected memory cell during a read operation. The second pass voltage is greater than the first pass voltage.
摘要:
The invention provides a metal bit structure of Twin MONOS memory cell with large channel width and its operational method for high-speed applications using a metal bit array.
摘要:
A page buffer for a non-volatile semiconductor memory device includes a switch configured to couple a first bitline coupled to a first memory cell to a second bitline coupled to a second memory cell, a first latch block coupled to the first bitline and configured to transfer a first latch data to the first memory cell, and a second latch block coupled to the second bitline and the first latch block, and configured to transfer a second latch data to the second memory cell.
摘要:
A NAND flash memory having a cell string structure includes a wordline configured to transfer a wordline voltage to a memory cell. A selection line is configured to transfer a selection voltage to a selection transistor connected to the memory cell and at least one shielding line is interposed between the wordline and the selection line and is operable to reduce capacitance-coupling between the wordline and the selection line during a programming operation.
摘要:
A complementary pass transistor based flip-flop (CP flip-flop) having a relatively small layout area and operable at a high speed with reduced power consumption is provided. The CP flip-flop does not need an additional circuit for retaining latched data in a sleep mode. The CP flip-flop receives a clock signal, delays the clock signal for a predetermined time period, and detects the delay time period from the clock signal. The CP flip-flop receives input data for the predetermined delay time and latches the input data until new input data is received. The CP flip-flop is advantageous in that the design of timing for retaining data can be simplified.
摘要:
A memory device includes a memory cell array having a plurality of memory cells, and a page buffer unit including a plurality of page buffers configured to store a plurality of pieces of data sequentially read from some of the plurality of memory cells at different read voltage levels, respectively, and to perform a logic operation on the plurality of pieces of data, respectively. The memory device further includes a counting unit configured to count the number of memory cells that exist in each of a plurality of sections defined by the different read voltage levels, based on results of the logic operation.