Abstract:
A method of programming a nonvolatile memory device comprises counting a number of state pairs in a unit of input data, modulating the unit of input data to reduce the number of state pairs contained therein, and programming the modulated unit of input data in the nonvolatile memory device. Each state pair comprises data with a first state and designated for programming in a memory cell connected to a first word line, and data with a second state and designated for programming in a memory cell connected to a second word line adjacent to the first word line. The memory cell connected to the first word line is adjacent to the memory cell connected to the second word line.
Abstract:
The storage device includes a storage unit configured to store data, an error controlling unit configured to correct an error of the data read out from the storage unit according to at least one read level, and a read level controlling unit configured to control the at least one read level when the error is uncorrectable. The read level controlling unit is configured to measure a distribution of memory cells of the storage unit, configured to filter the measured distribution, and configured to reset the at least one read level based on the filtered distribution.
Abstract:
A nonvolatile memory device performs interleaving of data to be stored in each wordline (memory page), or of data to be stored in multiple wordlines (memory pages). The NVM includes a memory cell array, a storage circuit of a de-interleaving circuit, and a read/write circuit. The storage circuit of the de-interleaving circuit is configured to store program data to be written interleaved into the memory cell array. The read/write circuit is configured to control the interleaved/deinterleaved data input/output between the memory cell array and the storage circuit. The write operation unit size may be the same or different from the read operation unit size. The storage circuit stores the program data of integer k times of a common divisor of a read operation unit size and a write operation unit size of the read/write circuit, wherein k may equal ‘m’ (the number of bits stored in each memory cell of the NVM).
Abstract:
A data processing system includes a memory configured to receive data and an encoder configured to encode data being transferred to the memory. The encoder includes an outer encoder configured to generate an outer codeword by encoding the data being transferred to the memory, and an inner encoder configured to generate a plurality of inner codewords by encoding the outer codeword.
Abstract:
A 1-bit error correction method is provided. In the method, a variable node at which an error has occurred is detected based on a number of unsatisfied check nodes that do not satisfy a parity condition among check nodes connected to each of variable nodes and an error in a bit corresponding to the detected variable node is corrected.
Abstract:
Provided is a memory device. The memory device includes a word line and a plurality of memory cells connected to the word line. The plurality of memory cells forms a page, and the number of sectors configuring the page and the size of each of the sectors can be changed.
Abstract:
An iterative decoding method is disclosed and includes sequentially executing a number of iterative decoding cycles in relation to a parity check equation until the parity check equation is resolved, or a maximum number N of iterative decoding cycles is reached, during execution of the number of iterative decoding cycles, storing in a data buffer minimum estimated values for a set of variable nodes corresponding to a minimum number of bit errors, and outputting the minimum estimated values stored in the data buffer as a final decoding result when the number of iterative decoding cycles reaches N.
Abstract translation:公开了一种迭代解码方法,并且包括相对于奇偶校验方程顺序执行多个迭代解码周期,直到奇偶校验方程被解析为止,或者在执行迭代次数期间达到迭代解码周期的最大数量N 解码周期,在数据缓冲器中存储对应于最小数量的位错误的一组可变节点的最小估计值,并且当迭代解码周期数达到时,输出存储在数据缓冲器中的最小估计值作为最终解码结果 N.
Abstract:
Memory devices and/or methods of managing memory data errors are provided. A memory device detects and corrects an error bit of data read from a plurality of memory cells, and identifies a memory cell storing the detected error bit. The memory device assigns a verification voltage to each of the plurality of first memory cells, the assigned verification voltage corresponding to the corrected bit for the identified memory cell, the assigned verification voltage corresponding to the read data for the remaining memory cells. The memory device readjusts the data stored in the plurality of memory cells using the assigned verification voltage. Through this, it is possible to increase a retention period of the data of the memory device.
Abstract:
A method of encoding multi-bit level data includes: determining a range of an error pattern generated according to a transmission symbol, encoding an M-bit level of a P-bit level corresponding to the transmission symbol based on the range of the error pattern, and excluding encoding of a P-M bit level of the P-bit level. The variable P is a natural number of a value at least two, and the variable M is a natural number less than P.
Abstract:
Disclosed is a flash memory device which includes a memory cell array configured to store data, a randomizer configured to generate a random sequence, to interleave the random sequence using at least one of memory parameters associated with data to be programmed in the memory cell array, and a control logic circuit configured to provide the memory parameters to the randomizer and to control the randomizer.