Abstract:
A data processing system includes a processing unit that forms a base die and has a group of through-silicon vias (TSVs), and is connected to a memory system. The memory system includes a die stack that includes a first die and a second die. The first die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads. The group of micro-bump landing pads are connected to the group of TSVs of the processing unit using a corresponding group of micro-bumps. The first die has a group of memory die TSVs. The subsequent die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads connected to the group of TSVs of the first die. The first die communicates with the processing unit using first cycle timing, and with the subsequent die using second cycle timing.
Abstract:
A power grid provides power to one or more modules of an integrated circuit device via a virtual power supply signal. A test module is configured to respond to assertion of a test signal so that, when the power grid is working properly and is not power gated, an output of the test module matches the virtual power supply. When the power grid is not working properly, the output of the test module is a fixed logic signal that does not vary based on the power gated state of the one or more modules.
Abstract:
A canary circuit with passgate transistor variation is described herein. The canary circuit includes a memory canary circuit that has a plurality of bitcells. Each bitcell has at least a passgate transistor that is driven by a wordline voltage. The canary circuit further includes a regulator circuit that outputs a wordline voltage that accounts for a predetermined offset of a threshold voltage of the passgate transistor. In an embodiment, the regulator circuit is a subtractor circuit that generates the wordline voltage from a reference voltage based in part on the threshold voltage variation of the passgate transistor.
Abstract:
An integrated circuit (IC) generates clock delay control signals based on its operational voltage level. The clock delay control signals are routed to corresponding clock gating logic that controls the synchronous capturing of the outputs of corresponding signal paths. The clock gating logic delays the clock signal used by the corresponding flip-flop in response to an assertion of the corresponding received clock delay control. Thus, the clock signal used to capture the outputs of certain signal paths may be delayed under certain voltage conditions. This selective clock path delay for different signal paths enables the IC to use a higher clock frequency, or more reliably latch the path outputs at a certain clock frequency, even though different signal paths may exhibit different relative path delays under different operating voltage conditions.
Abstract:
A multipurpose wordline underdrive circuit includes a wordline driver and a pulldown network. The pulldown network includes a first current-carrying terminal electrically coupled to the wordline driver and a second current-carrying terminal electrically coupled to a control signal. The pulldown network also includes a current-regulation terminal electrically coupled to an additional control signal. Various other devices, systems, and methods are also disclosed.
Abstract:
An apparatus and method for providing efficient floor planning, power, and performance tradeoffs of memory accesses. A dual read port and single write port memory bit cell uses two asymmetrical read access circuits for conveying stored data on two read bit lines. The two read bit lines are pre-charged to different voltage reference levels. The layout of the memory bit cell places the two read bit lines on an opposed edge from the single write bit line. The layout uses a dummy gate placed over both p-type diffusion and n-type diffusion between the edges. The layout has a same number of p-type transistors as n-type transistors despite using asymmetrical read access circuits. The layout also has a contacted gate pitch that is one more than the number of p-type transistors.
Abstract:
An apparatus and method for providing efficient floor planning, power, and performance tradeoffs of memory accesses. Adjacent bit cells in a column of an array use a split read port such that the bit cells do not share a read bit line while sharing a write bit line. The adjacent bit cells include asymmetrical read access circuits that convey data stored by latch circuitry of a corresponding bit cell to a corresponding read bit line. The layout of adjacent bit cells provides a number of contacted gate pitches per bit cell that is less than a sum of the maximum number of metal gates in layout of each of the adjacent bit cells divided by the number of adjacent bit cells.
Abstract:
An integrated circuit includes one or more processing units that execute instructions that employ a register file, control logic creates a pre-startup register free list, prior to normal operation of at least one of the processing units, that includes a list of registers devoid of undefective registers. In some implementations, no column and row repair information is provided to register file repair logic. In certain examples, the register file is configured as a repair-less register file. During normal operation of the one or more processing units, the integrated circuit employs the pre-startup register free list to select registers in a register file for the executing instructions. Associated methods are also presented.
Abstract:
A read path for reading data from a memory includes a sense amplifier having data (SAT) and data complement (SAC) output nodes and a latch. The latch includes an input tri-state inverter including first and second PMOS transistors connected between VDD and an intermediate node, and first and second NMOS transistors connected between VSS and the intermediate node. A gate connection of the first PMOS and NMOS transistors is connected to the SAT node; a gate connection of the second PMOS transistor is connected to a sense amplifier enable complement input; and a gate connection of the second NMOS transistor is connected to a sense amplifier enable input. The latch also includes an output driver with an input connected to the intermediate node and an output connected to a data output node. The latch thus has two gate delays between the SAT node and the data output node.
Abstract:
A timing circuit includes an input for receiving the control signal from a logic circuit operating with a first supply voltage and an output for supplying a control signal to a circuit operating with a second supply voltage different from the first supply voltage. The timing circuit also includes a plurality of delay elements connected in series between the input and output and supplied with the first supply voltage, and one or more NFET footer transistors that couple respective delay elements to a negative supply rail, the NFET footer transistors having the second supply voltage applied to their gates. A memory apparatus employing such a circuit is provided.