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公开(公告)号:US10163777B2
公开(公告)日:2018-12-25
申请号:US15476905
申请日:2017-03-31
Applicant: INTEL CORPORATION
Inventor: Seok Ling Lim , Eng Huat Goh , Hoay Tien Teoh , Jenny Shio Yin Ong , Jia Yan Go , Jiun Hann Sir , Min Suet Lim
IPC: H01L23/522 , H01L23/528 , H01L23/043
Abstract: Interconnects for semiconductor packages are described. An apparatus may comprise a decoupling capacitor on a logic board, and a conductive interconnect element on the logic board, the conductive interconnect element to connect the decoupling capacitor on the logic board to a power conductor comprising a power pad of a semiconductor package, the conductive interconnect element at a different layer than a ground-potential layer of the logic board. Other embodiments are described and claimed.
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公开(公告)号:US12191281B2
公开(公告)日:2025-01-07
申请号:US17348802
申请日:2021-06-16
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Yang Liang Poh , Seok Ling Lim , Jenny Shio Yin Ong , Jackson Chung Peng Kong
IPC: H01L25/18 , H01L21/48 , H01L21/56 , H01L23/13 , H01L23/31 , H01L23/538 , H01L25/00 , H01L25/065
Abstract: The present disclosure is directed to semiconductor packages, and methods for making them, which includes a substrate with a top surface and a bottom surface, a substrate recess in the bottom surface of the substrate, a first device positioned over the top surface of the substrate, which has the first device at least partially overlapping the substrate recess, a mold material in the substrate recess, which has the mold material overlapping the bottom surface of the substrate adjacent to the substrate recess, a second device positioned in the substrate recess, and a plurality of interconnect vias in the substrate, which has at least one of the plurality interconnect vias coupled to the first and second devices to provide a direct signal connection therebetween that minimizes signal latency.
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公开(公告)号:US12002747B2
公开(公告)日:2024-06-04
申请号:US17680489
申请日:2022-02-25
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jenny Shio Yin Ong , Seok Ling Lim , Kooi Chi Ooi , Jackson Chung Peng Kong
IPC: H01L23/50 , H01G4/12 , H01L23/522 , H01L23/528 , H01L23/538 , H01L25/065 , H01L49/02
CPC classification number: H01L23/5223 , H01G4/1272 , H01L23/5286 , H01L23/5381 , H01L23/5385 , H01L23/5386 , H01L25/0655 , H01L28/60
Abstract: An electronic device and associated methods are disclosed. In one example, the electronic device can include a semiconductor package including a package substrate, a first semiconductor die on the package substrate, a second semiconductor die on the package substrate, a third semiconductor die on the package substrate, and a bridge interconnect at least partially embedded in the package substrate. The bridge interconnect can include a first bridge section coupling the first semiconductor die to the second semiconductor die, a second bridge section coupling the second semiconductor die to the third semiconductor die, and a power-ground section between the first section and the second section, the power-ground section comprising first and second conductive traces coupled to the second semiconductor die.
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公开(公告)号:US20230420379A1
公开(公告)日:2023-12-28
申请号:US17848059
申请日:2022-06-23
Applicant: Intel Corporation
Inventor: Eng Huat Goh , Seok Ling Lim , Hazwani Jaffar , Yean Ling Soon
IPC: H01L23/538 , H01L21/48 , H01L23/498 , H01L23/552 , H01L23/66
CPC classification number: H01L23/5386 , H01L21/4853 , H01L21/486 , H01L23/49816 , H01L23/49833 , H01L23/49838 , H01L23/5381 , H01L23/5385 , H01L23/552 , H01L23/66 , H01L21/4857 , H01L23/49822 , H01L2223/6616 , H01L2223/6627 , H01L2223/6677 , H01L24/08
Abstract: IC device package routing with metallization features comprising a pseudo-stripline architecture in which the stripline structure is provisioned, in part, by a routing structure separate from routing within the package substrate. A signal route within top metallization level of a package substrate may be electrically shielded, in part, with a metallization feature within a redistribution layer (RDL) of a routing structure that couples one or more IC chips to the package substrate. Accordingly, a package substrate may have fewer levels of metallization, reduced thickness, and/or lower cost while the IC device package still offers excellent EMI performance.
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公开(公告)号:US11562954B2
公开(公告)日:2023-01-24
申请号:US16912619
申请日:2020-06-25
Applicant: Intel Corporation
Inventor: Seok Ling Lim , Jenny Shio Yin Ong , Bok Eng Cheah , Jackson Chung Peng Kong
IPC: H01L29/00 , H01L29/76 , H01L23/522 , H01L23/528 , H01L21/768
Abstract: Disclosed embodiments include frame-array interconnects that have a ledge portion to accommodate a passive device. A seated passive device is between at least two frame-array interconnects for semiconductor package-integrated decoupling capacitors.
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公开(公告)号:US11527467B2
公开(公告)日:2022-12-13
申请号:US17089749
申请日:2020-11-05
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Seok Ling Lim , Jackson Chung Peng Kong , Jenny Shio Yin Ong , Kooi Chi Ooi
IPC: H01L23/538 , H01L23/498 , H01L23/00 , H01L21/48 , H01L23/13 , H01L23/552
Abstract: According to the various aspects, a multi-chip semiconductor package includes a package substrate, an interconnect frame extending beyond a first side edge of the package substrate, the interconnect frame including a bottom surface positioned over and coupled to a top surface of the package substrate, a first semiconductor device positioned at least partially over and coupled to the interconnect frame, and a second semiconductor device positioned on the bottom surface of the interconnect frame alongside of the package substrate. The interconnect frame further includes a redistribution layer and a frame construct layer, and a plurality of vias coupled to the redistribution layer, with the frame construct layer further includes a recessed area, and the first semiconductor device is positioned in the recessed area.
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公开(公告)号:US20220392835A1
公开(公告)日:2022-12-08
申请号:US17680489
申请日:2022-02-25
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jenny Shio Yin Ong , Seok Ling Lim , Kooi Chi Ooi , Jackson Chung Peng Kong
IPC: H01L23/522 , H01L23/538 , H01L23/528 , H01L49/02 , H01G4/12 , H01L25/065
Abstract: An electronic device and associated methods are disclosed. In one example, the electronic device can include a semiconductor package including a package substrate, a first semiconductor die on the package substrate, a second semiconductor die on the package substrate, a third semiconductor die on the package substrate, and a bridge interconnect at least partially embedded in the package substrate. The bridge interconnect can include a first bridge section coupling the first semiconductor die to the second semiconductor die, a second bridge section coupling the second semiconductor die to the third semiconductor die, and a power-ground section between the first section and the second section, the power-ground section comprising first and second conductive traces coupled to the second semiconductor die.
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公开(公告)号:US11462488B2
公开(公告)日:2022-10-04
申请号:US17090926
申请日:2020-11-06
Applicant: Intel Corporation
Inventor: Seok Ling Lim , Bok Eng Cheah , Jackson Chung Peng Kong , Jenny Shio Yin Ong
IPC: H01L23/00 , H01L23/14 , H01L21/48 , H01L23/498 , H01L23/16
Abstract: According to the various aspects, a package substrate with a heterogeneous substrate core including a first core layer that is coextensive with the package substrate and extends through a first section and a second section of the substrate core, in which the first section is adjacent to and thicker than the second section. The first section having at least a second layer and/or a third layer to provide the difference in thickness with the second section.
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公开(公告)号:US11430764B2
公开(公告)日:2022-08-30
申请号:US17024056
申请日:2020-09-17
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Seok Ling Lim , Jenny Shio Yin Ong , Jackson Chung Peng Kong , Kooi Chi Ooi
IPC: H01L25/065 , H01L23/538 , H01L23/66
Abstract: An electronic device and associated methods are disclosed. In one example, the electronic device includes a semiconductor article having a package substrate, a first semiconductor die coupled to the package substrate, a second semiconductor die coupled to the package substrate and adjacent the first semiconductor die, and a bridge component therebetween coupling the first semiconductor die to the second semiconductor die. The bridge component can include a bridge substrate, a conductive trace therein, and a passive component coupled to the conductive trace.
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公开(公告)号:US11367673B2
公开(公告)日:2022-06-21
申请号:US17089750
申请日:2020-11-05
Applicant: Intel Corporation
Inventor: Seok Ling Lim , Bok Eng Cheah , Jackson Chung Peng Kong , Jenny Shio Yin Ong
IPC: H01L23/49 , H01L23/498 , H01L21/48 , H01L21/768 , H01L23/48 , H01L25/16 , H01L23/00
Abstract: According to various examples, a device is described. The device may include an interposer. The device may also include a plurality of first through-silicon-vias disposed in the interposer, wherein the plurality of first through-silicon-vias have a first diameter. The device may also include a plurality of second through-silicon-vias disposed in the interposer, wherein the plurality of second through-silicon-vias have a second diameter larger than the first via diameter. The device may also include a first recess in the interposer positioned at bottom ends of the plurality of second through-silicon-vias.
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