摘要:
A microelectronic package comprises a die (210) having attached thereto a first plurality of electrically conductive pads (211). The microelectronic package further comprises a first layer (220) and a second layer (130). The first layer has a first plurality of electrically conductive vias (121) electrically connected to one of the first plurality of electrically conductive pads. The second layer comprises a second plurality of electrically conductive pads (131) located around a perimeter (135) of the second layer and a plurality of electrically conductive traces (132) electrically connected to one of the first plurality of electrically conductive vias and to one of the second plurality of electrically conductive pads. The microelectronic package also comprises a plurality of wirebonds (240), each one of which is electrically connected to one of the second plurality of electrically conductive pads.
摘要:
A structure that may be used in substrate solder bumping comprises a substrate (110), a solder resist layer (120) disposed over the substrate, a plurality of solder resist openings (121) in a surface (122) of the solder resist layer, a conformal barrier layer (130) having a first portion (131) over the surface of the solder resist layer and a second portion (132) in the solder resist openings, a mask layer (140) over the first portion of the conformal barrier layer, and a solder material (150) in the solder resist openings over the metal layer. The conformal barrier layer acts as a barrier against interaction between the solder resist layer and the mask layer during solder reflow.
摘要:
A structure that may be used in substrate solder bumping comprises a substrate (110), a solder resist layer (120) disposed over the substrate, a plurality of solder resist openings (121) in a surface (122) of the solder resist layer, a conformal barrier layer (130) having a first portion (131) over the surface of the solder resist layer and a second portion (132) in the solder resist openings, a mask layer (140) over the first portion of the conformal barrier layer, and a solder material (150) in the solder resist openings over the metal layer. The conformal barrier layer acts as a barrier against interaction between the solder resist layer and the mask layer during solder reflow.
摘要:
A method of providing electrically conductive bumps on electrode pads of a microelectronic substrate. The method includes: providing a microelectronic substrate including electrode pads thereon; disposing a mask onto the substrate such that openings defined in the mask are placed in registration with the electrode pads; providing solder portions onto respective ones of the electrode pads through the mask; reflowing the solder portions in a forming gas atmosphere to form solder bumps on respective ones of the electrode pads; and removing the mask after reflowing.