Method and apparatus for measuring a temperature of a molten metal
    31.
    发明授权
    Method and apparatus for measuring a temperature of a molten metal 有权
    用于测量熔融金属温度的方法和装置

    公开(公告)号:US06227702B1

    公开(公告)日:2001-05-08

    申请号:US09337443

    申请日:1999-06-21

    IPC分类号: G01K1300

    CPC分类号: G01J5/041 G01J5/004 G01K1/125

    摘要: A temperature measuring device comprises: an optical fiber; a metallic protective tube for covering the optical tube to form a metal-covered optical fiber; and a radiation thermometer connected to the metal-covered optical fiber. A heat insulation coating can be formed to cover the protective tube. A level measuring device comprises: an optical fiber; a metallic protective tube for covering the optical tube to form a metal-covered optical fiber; a radiation thermometer connected to the metal-covered optical fiber; transfer device for sending the metal-covered optical fiber to a surface of a molten metal to be measured and retracting to wind the metal-covered optical fiber from the surface; and level determination device for determining a level of the surface of the molten metal based on a temperature change detected by the radiation thermometer and an amount of feed of the optical fiber through the transfer device.

    摘要翻译: 一种温度测量装置,包括:光纤; 用于覆盖光管以形成金属覆盖的光纤的金属保护管; 和连接到金属覆盖的光纤的辐射温度计。 可以形成隔热涂层以覆盖保护管。一种液位测量装置,包括:光纤; 用于覆盖光管以形成金属覆盖的光纤的金属保护管; 连接到金属覆盖的光纤的辐射温度计; 传送装置,用于将金属覆盖的光纤发送到要测量的熔融金属的表面并且从该表面卷绕金属覆盖的光纤; 以及水平确定装置,用于基于由辐射温度计检测的温度变化和通过转印装置的光纤的进给量来确定熔融金属的表面的水平。

    Semiconductor integrated circuit device and method of manufacturing the
same
    32.
    发明授权
    Semiconductor integrated circuit device and method of manufacturing the same 失效
    半导体集成电路器件及其制造方法

    公开(公告)号:US6034912A

    公开(公告)日:2000-03-07

    申请号:US145076

    申请日:1998-09-01

    IPC分类号: G11C5/02 H01L27/02 H03K19/177

    摘要: A memory portion and a logic circuit portion of a semiconductor device are formed on a single semiconductor substrate in which a first logic circuit block and a second logic circuit block are formed in different areas and the second logic circuit is located between a pair of memory blocks. Data stored in the pair of memory blocks are transmitted to the second logic circuit block for processing via a memory peripheral circuit. A result of the data processing is transmitted to the first logic circuit block or an external device via an input/output circuit provided in the second logic circuit block. A clock signal entered at the center portion of the semiconductor chip is supplied to a plurality of first state clock distributing circuits equidistantly disposed from the center portion and then to a plurality of second stage clock distributing circuits at least equidistantly disposed from each of the first state clock distributing circuits. Next, the clock signal is supplied to a plurality of third state clock distributing circuits equidistantly disposed from each of the second stage clock distributing circuits and then supplied to a plurality of final stage clock distributing circuits equidistantly disposed from each of the third stage clock distributing circuits. From these final stage clock distributing circuits, the clock signal is supplied to an area in whose units an internal gate array and a RAM macro cell or a logic macro cell are made replaceable with each other.

    摘要翻译: 半导体器件的存储部分和逻辑电路部分形成在单个半导体衬底上,其中第一逻辑电路块和第二逻辑电路块形成在不同的区域中,并且第二逻辑电路位于一对存储块之间 。 存储在一对存储器块中的数据被发送到第二逻辑电路块,以经由存储器外围电路进行处理。 经由第二逻辑电路块中提供的输入/输出电路将数据处理的结果发送到第一逻辑电路块或外部设备。 输入到半导体芯片的中心部分的时钟信号被提供给从中心部分等距设置的多个第一状态时钟分配电路,然后被提供给至少等距地从第一状态中的每个状态设置的多个第二级时钟分配电路 时钟分配电路。 接下来,时钟信号被提供给从每个第二级时钟分配电路等距离设置的多个第三状态时钟分配电路,然后提供给从每个第三级时钟分配电路等距设置的多个最后级时钟分配电路 。 从这些最终级时钟分配电路,将时钟信号提供给其单位内的内部门阵列和RAM宏小区或逻辑宏小区彼此可替换的区域。

    Method and apparatus for pattern data processing
    34.
    发明授权
    Method and apparatus for pattern data processing 失效
    用于图案数据处理的方法和装置

    公开(公告)号:US5649081A

    公开(公告)日:1997-07-15

    申请号:US384466

    申请日:1995-02-02

    IPC分类号: G06F17/50 G06T19/20 G06T17/50

    CPC分类号: G06T19/20 G06T2219/2021

    摘要: A method and device for pattern processing whereby accurate and effective processing can be carried out as a user desires. A pattern processing device of this invention comprises an information input/output device, an information processing device, and a data storage device; wherein the information processing device comprises pattern processing means, significance describing means, characteristic information input means, characteristic information extraction means, characteristic information describing means, and pattern processing means making reference to characteristic information. Intentions of a user or characteristics of pattern elements or sets of pattern elements are described and added to the pattern data so that this characteristic information can be referred to when pattern data processing is carried out. Thus, it is possible to make accurate representation of pattern data in a computer, and it is also possible to generate or convert patterns as the user desires.

    摘要翻译: 一种用于图案处理的方法和装置,其可以根据用户期望进行准确和有效的处理。 本发明的图案处理装置包括信息输入/输出装置,信息处理装置和数据存储装置; 其中信息处理装置包括图案处理装置,重要描述装置,特征信息输入装置,特征信息提取装置,特征信息描述装置和参考特征信息的图案处理装置。 描述用户的意图或图案元素或图案元素集合的特征,并将其添加到图案数据中,使得当执行图案数据处理时可以参考该特征信息。 因此,可以在计算机中精确地表示图案数据,并且还可以根据用户期望生成或转换图案。

    Method and apparatus for measuring displacement of molten metal
    35.
    发明授权
    Method and apparatus for measuring displacement of molten metal 失效
    用于测量熔融金属位移的方法和装置

    公开(公告)号:US5507854A

    公开(公告)日:1996-04-16

    申请号:US353888

    申请日:1994-12-12

    摘要: First and second electrodes are inserted into molten metal. A first pseudo random signal is transmitted to the first electrode, and at the same time the first pseudo random signal and a second pseudo random signal which has the same pattern as the first pseudo random signal but which is slightly different in frequency from the first pseudo random signal are multiplied by each other in a first multiplier to thereby calculate a first product value. A signal obtained from the second electrode and the second pseudo random signal are multiplied by each other in a second multiplier to thereby obtain a second product value. The displacement of the molten metal is calculated from the time difference between maximum correlation values respectively appearing in time series patterns of the first and second product values.

    摘要翻译: 将第一和第二电极插入熔融金属中。 第一伪随机信号被发送到第一电极,并且同时具有与第一伪随机信号相同的图案的第一伪随机信号和第二伪随机信号,但是频率与第一伪随机信号的第一伪随机信号略有不同 随机信号在第一乘法器中彼此相乘,从而计算第一乘积值。 从第二电极和第二伪随机信号获得的信号在第二乘法器中彼此相乘,从而获得第二乘积值。 从分别出现在第一和第二乘积值的时间序列图案中的最大相关值之间的时间差计算熔融金属的位移。

    Apparatus for temperature measurement
    36.
    发明授权
    Apparatus for temperature measurement 失效
    温度测量装置

    公开(公告)号:US5213417A

    公开(公告)日:1993-05-25

    申请号:US758606

    申请日:1991-09-12

    IPC分类号: G01K1/14 G01K1/16 G01K13/08

    CPC分类号: G01K13/08 G01K1/143 G01K1/16

    摘要: A temperature measuring apparatus consisting of a sensing element, a retaining element which retains the sensing element and which is made of a thermally conductive and electrically insulative material, a holding element which holds the retaining element, and a contact mechanism which elastically contact the retaining element with the top of the surface of the measured body. The sensing element is composed of a thin film thermistor formed on the electrically insulating layer on a substrate. A film having the thermally conductive and electrically insulative material may be inserted between the measured body and the contact area of the retaining element. The retaining element is composed of the polyimide film and a flexible copper lead foil formed on the film and connected to the electrodes of the sensing element. The contact mechanism is composed of a pressing frame with at least one pressing arm which presses the contact part of the retaining element to the measured body and which is located adjacent to the contact zone.

    摘要翻译: 一种温度测量装置,包括感测元件,保持感测元件并由导热和电绝缘材料制成的保持元件,保持元件的保持元件,以及与保持元件弹性接触的接触机构 与测量体的表面的顶部。 感测元件由形成在基板上的电绝缘层上的薄膜热敏电阻构成。 具有导热和电绝缘材料的膜可以插入测量体和保持元件的接触区域之间。 保持元件由聚酰亚胺膜和形成在膜上并连接到感测元件的电极的柔性铜引线箔构成。 接触机构由具有至少一个按压臂的按压框构成,所述至少一个按压臂将保持元件的接触部分按压到测量体并位于接触区附近。

    Apparatus for measuring film thickness
    37.
    发明授权
    Apparatus for measuring film thickness 失效
    用于测量膜厚度的设备

    公开(公告)号:US4606641A

    公开(公告)日:1986-08-19

    申请号:US645924

    申请日:1984-08-30

    IPC分类号: G01B11/06 G01N21/21

    CPC分类号: G01B11/0641

    摘要: An elliptically polarized monochromatic light is obtained from monochromatic light select unit and is reflected at an interface between an objective film and substrate. An extinction wavelength of the reflected light, when the amount thereof detected at photodetector becomes zero, is detected at control unit and the true thickness of the film is calculated from the detected extinction wavelength.

    摘要翻译: 从单色光选择单元获得椭圆偏振的单色光,并在目标膜和基板之间的界面处反射。 在光电检测器检测到的量为零时,在控制单元处检测反射光的消光波长,并根据检测到的消光波长计算膜的真实厚度。

    Apparatus for non-contact measurement of distance from a metallic body
using a detection coil in the feedback circuit of an amplifier
    38.
    发明授权
    Apparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifier 失效
    用于在放大器的反馈电路中使用检测线圈非接触地测量与金属体的距离的装置

    公开(公告)号:US4030027A

    公开(公告)日:1977-06-14

    申请号:US627463

    申请日:1975-10-30

    IPC分类号: G01B7/02 G01R33/12

    CPC分类号: G01B7/023

    摘要: Apparatus for non-contact measurement of the distance between a detecting coil and a metallic body mounted in confronting relation thereto comprising a differential amplifier to one terminal of which is connected a reference oscillator and to the other terminal of which is connected a feedback circuit. The feedback circuit incorporates the detecting coil and the amplified differential output signal between the AC signals applied to the differential amplifier and the signal supplied to the differential amplifier resulting from the impedance of the detecting coil corresponding to the distance between the detecting coil and the metallic body are thus a measure of the distance. At least one of the parameters of open-loop gain of the differential amplifier and the amount of feedback in the feedback circuit is pre-determined so as to linearize at least for a pre-determined measuring range the output characteristics of the differential amplifier resulting from the variation of the detecting coil impedance caused by the variation of the distance.

    摘要翻译: 用于非接触式测量检测线圈与安装在相对关系中的金属体之间的距离的装置,包括差分放大器,其一端连接基准振荡器,另一端连接反馈电路。 反馈电路将检测线圈和施加到差分放大器的AC信号之间的放大的差分输出信号和由检测线圈的阻抗相对应地提供给差分放大器的信号对应于检测线圈和金属体之间的距离 因此是距离的度量。 预先确定差分放大器的开环增益的参数和反馈电路中的反馈量中的至少一个,以便至少对于预定的测量范围线性化,由差分放大器产生的输出特性 由距离的变化引起的检测线圈阻抗的变化。

    Evaporative cooling method by natural circulation of cooling water
    39.
    发明授权
    Evaporative cooling method by natural circulation of cooling water 失效
    通过冷却水自然循环的蒸发冷却方式

    公开(公告)号:US4024903A

    公开(公告)日:1977-05-24

    申请号:US671396

    申请日:1976-03-29

    CPC分类号: F27D9/00 C21B7/10 F28D5/00

    摘要: In an evaporative cooling method by natural circulation of cooling water by the use of an evaporative cooling device comprising a cooling pipe fitted to an object to be cooled and a steam separator drum arranged above said cooling pipe, said cooling pipe and said steam separator drum being connected together by a downcomer and a riser, the cooling water in said cooling pipe is kept in complete liquid state and part of cooling water is evaporated only in said riser and said steam separator drum by setting parameters to satisfy the following formula:Q/V.sup.. .rho..sup.. c

    摘要翻译: 在通过使用蒸发冷却装置自然循环的蒸发冷却方法中,所述蒸发冷却装置包括安装在待冷却物体上的冷却管和布置在所述冷却管上方的蒸汽分离器鼓,所述冷却管和所述蒸汽分离器鼓为 通过降液管和提升管连接在一起,所述冷却管中的冷却水保持完全液体状态,并且部分冷却水仅在所述提升管和所述蒸汽分离器鼓中通过设定参数来蒸发以满足以下公式:

    Film thickness measuring device and film thickness measuring method
    40.
    发明授权
    Film thickness measuring device and film thickness measuring method 失效
    膜厚测量装置和膜厚测量方法

    公开(公告)号:US08339617B2

    公开(公告)日:2012-12-25

    申请号:US12904494

    申请日:2010-10-14

    IPC分类号: G01B11/28 G01N21/25

    CPC分类号: G01N21/55 G01B11/0625

    摘要: A film thickness measuring device is provided with a light source, a spectroscopic sensor, a processor, and a storage unit, and configured in such a manner that light from the light source vertically enters a plane to be measured provided with a film and the light reflected by the plane to be measured enters the spectroscopic sensor. The storage unit stores theoretical values of reflectivity distributions of respective film thicknesses and theoretical values of color characteristic variables of the respective film thicknesses. The processor finds the thickness of the film of the plane to be measured from the reflectivity distribution measured by the spectroscopic sensor by using the theoretical values of the reflectivity distributions of the respective film thicknesses or the theoretical values of the color characteristic variables of the respective film thicknesses stored in the storage unit.

    摘要翻译: 膜厚测量装置设置有光源,光谱传感器,处理器和存储单元,并且被配置为使得来自光源的光垂直进入设置有被膜的待测平面,并且光 由待测平面反射的光进入光谱传感器。 存储单元存储各个膜厚度的各个膜厚度的反射率分布和各个膜厚度的色彩特性变量的理论值的理论值。 处理器通过使用各个膜厚度的反射率分布的理论值或各个膜的颜色特性变量的理论值,从由光谱传感器测量的反射率分布来求出要测量的平面的膜的厚度 存储在存储单元中的厚度。