摘要:
A temperature measuring device comprises: an optical fiber; a metallic protective tube for covering the optical tube to form a metal-covered optical fiber; and a radiation thermometer connected to the metal-covered optical fiber. A heat insulation coating can be formed to cover the protective tube. A level measuring device comprises: an optical fiber; a metallic protective tube for covering the optical tube to form a metal-covered optical fiber; a radiation thermometer connected to the metal-covered optical fiber; transfer device for sending the metal-covered optical fiber to a surface of a molten metal to be measured and retracting to wind the metal-covered optical fiber from the surface; and level determination device for determining a level of the surface of the molten metal based on a temperature change detected by the radiation thermometer and an amount of feed of the optical fiber through the transfer device.
摘要:
A memory portion and a logic circuit portion of a semiconductor device are formed on a single semiconductor substrate in which a first logic circuit block and a second logic circuit block are formed in different areas and the second logic circuit is located between a pair of memory blocks. Data stored in the pair of memory blocks are transmitted to the second logic circuit block for processing via a memory peripheral circuit. A result of the data processing is transmitted to the first logic circuit block or an external device via an input/output circuit provided in the second logic circuit block. A clock signal entered at the center portion of the semiconductor chip is supplied to a plurality of first state clock distributing circuits equidistantly disposed from the center portion and then to a plurality of second stage clock distributing circuits at least equidistantly disposed from each of the first state clock distributing circuits. Next, the clock signal is supplied to a plurality of third state clock distributing circuits equidistantly disposed from each of the second stage clock distributing circuits and then supplied to a plurality of final stage clock distributing circuits equidistantly disposed from each of the third stage clock distributing circuits. From these final stage clock distributing circuits, the clock signal is supplied to an area in whose units an internal gate array and a RAM macro cell or a logic macro cell are made replaceable with each other.
摘要:
A temperature measuring device includes an optical fiber; a metallic protective tube for covering the optical fiber to form a metal-covered optical fiber; and a radiation thermometer connected to the metal-covered optical fiber. A heat insulation coating may be added to cover the metallic protective tube.
摘要:
A method and device for pattern processing whereby accurate and effective processing can be carried out as a user desires. A pattern processing device of this invention comprises an information input/output device, an information processing device, and a data storage device; wherein the information processing device comprises pattern processing means, significance describing means, characteristic information input means, characteristic information extraction means, characteristic information describing means, and pattern processing means making reference to characteristic information. Intentions of a user or characteristics of pattern elements or sets of pattern elements are described and added to the pattern data so that this characteristic information can be referred to when pattern data processing is carried out. Thus, it is possible to make accurate representation of pattern data in a computer, and it is also possible to generate or convert patterns as the user desires.
摘要:
First and second electrodes are inserted into molten metal. A first pseudo random signal is transmitted to the first electrode, and at the same time the first pseudo random signal and a second pseudo random signal which has the same pattern as the first pseudo random signal but which is slightly different in frequency from the first pseudo random signal are multiplied by each other in a first multiplier to thereby calculate a first product value. A signal obtained from the second electrode and the second pseudo random signal are multiplied by each other in a second multiplier to thereby obtain a second product value. The displacement of the molten metal is calculated from the time difference between maximum correlation values respectively appearing in time series patterns of the first and second product values.
摘要:
A temperature measuring apparatus consisting of a sensing element, a retaining element which retains the sensing element and which is made of a thermally conductive and electrically insulative material, a holding element which holds the retaining element, and a contact mechanism which elastically contact the retaining element with the top of the surface of the measured body. The sensing element is composed of a thin film thermistor formed on the electrically insulating layer on a substrate. A film having the thermally conductive and electrically insulative material may be inserted between the measured body and the contact area of the retaining element. The retaining element is composed of the polyimide film and a flexible copper lead foil formed on the film and connected to the electrodes of the sensing element. The contact mechanism is composed of a pressing frame with at least one pressing arm which presses the contact part of the retaining element to the measured body and which is located adjacent to the contact zone.
摘要:
An elliptically polarized monochromatic light is obtained from monochromatic light select unit and is reflected at an interface between an objective film and substrate. An extinction wavelength of the reflected light, when the amount thereof detected at photodetector becomes zero, is detected at control unit and the true thickness of the film is calculated from the detected extinction wavelength.
摘要:
Apparatus for non-contact measurement of the distance between a detecting coil and a metallic body mounted in confronting relation thereto comprising a differential amplifier to one terminal of which is connected a reference oscillator and to the other terminal of which is connected a feedback circuit. The feedback circuit incorporates the detecting coil and the amplified differential output signal between the AC signals applied to the differential amplifier and the signal supplied to the differential amplifier resulting from the impedance of the detecting coil corresponding to the distance between the detecting coil and the metallic body are thus a measure of the distance. At least one of the parameters of open-loop gain of the differential amplifier and the amount of feedback in the feedback circuit is pre-determined so as to linearize at least for a pre-determined measuring range the output characteristics of the differential amplifier resulting from the variation of the detecting coil impedance caused by the variation of the distance.
摘要:
In an evaporative cooling method by natural circulation of cooling water by the use of an evaporative cooling device comprising a cooling pipe fitted to an object to be cooled and a steam separator drum arranged above said cooling pipe, said cooling pipe and said steam separator drum being connected together by a downcomer and a riser, the cooling water in said cooling pipe is kept in complete liquid state and part of cooling water is evaporated only in said riser and said steam separator drum by setting parameters to satisfy the following formula:Q/V.sup.. .rho..sup.. c
摘要:
A film thickness measuring device is provided with a light source, a spectroscopic sensor, a processor, and a storage unit, and configured in such a manner that light from the light source vertically enters a plane to be measured provided with a film and the light reflected by the plane to be measured enters the spectroscopic sensor. The storage unit stores theoretical values of reflectivity distributions of respective film thicknesses and theoretical values of color characteristic variables of the respective film thicknesses. The processor finds the thickness of the film of the plane to be measured from the reflectivity distribution measured by the spectroscopic sensor by using the theoretical values of the reflectivity distributions of the respective film thicknesses or the theoretical values of the color characteristic variables of the respective film thicknesses stored in the storage unit.