摘要:
A static random access memory device is comprised of a write mode detector for detecting a signal state transition of a write enable signal changing to an active state, an input data transition detector for detecting a transition of the input data supplied from exterior, during a contamination of the active state of the write enable signal, a power down timer for generating a pulse signal with a predetermined pulse width in response to either of the detecting signals outputted from the write mode detector and input data transition detector, a gate circuit for permitting the output data from a row decoder to be transferred to memory cells during a period that the power down timer generates a pulse signal, and for inhibiting that data transfer during a period that the power down timer rests, and a write circuit control circuit allowing a write circuit to supply write data to the bit line pair during a period that the power down timer generates a pulse signal, and prohibiting that write data transfer during a period that the power timer rests.
摘要:
The coating method contains a spraying step in which a paint is sprayed at least on a coating substrate extending in an upward and downward direction to a film thickness thicker than causing sags of the sprayed paint. The coating substrate on which the paint is sprayed is rotated about the horizontal axis while the sprayed paint is dried until it does not sag any more.The coating apparatus includes a carriage conveying the coating substrate arranged to run along the conveying direction, and the carriage is provided with a supporting base for supporting the coating substrate rotatively about the horizontal axis. One embodiment for rotating the substrate supported by the supporting base is a spring that is disposed on the carriage to rotate the substrate by means of a restoring force produced by the spring. On the passage for conveying the carriage is disposed a force storing mechanism for storing the restoring force in the spring that released the restoring force.Another embodiment therefor is a combination of a chain disposed along the conveying passage for the carriage with a sprocket disposed on the carriage. The sprocket is engageable with the chain and operatively coupled to the coating substrate. By disposing the chain in a fixed manner, on the one hand, the substrate is caused to rotate as the carriage is being conveyed. By dividing the chain, on the other, the substrate is caused to rotate while the conveyance of the carriage is suspended.
摘要:
A semiconductor memory includes a memory cell including inverters (IN1, IN2), control transistors (T3, T4) that control the potential of a ground side terminal (N3) connected to the memory cell, and transfer transistors T1 and T2 that control transfer of data from bit lines (BL, /BL) to the memory cell. In writing data, the control transistors raise the potential of the ground side terminal (N3) to be higher than the ground potential by a predetermined potential. After the transfer transistors transfer data having a potential difference smaller than a potential difference between the power supply potential and the ground potential from the bit lines (BL, /BL) to the memory cell, and cause the memory cell to hold the data, the potential of the ground side terminal (N3) is decreased to the ground potential to write data. Since data written in the memory cell suffices to have a potential difference smaller than the potential difference between the power supply potential and the ground potential, the time required to drive the bit line having a large load capacitance is shortened, the power consumption is decreased, and the power consumption necessary for writing data in the memory cell is reduced.
摘要:
The disclosed semiconductor memory cell can be formed in accordance with the standard process for the logic LSI, so that the manufacturing cost can be reduced and an increased node capacitance can be secured. The drain diffusion layer (D1) of the latch transistor (M1) for constituting the latch of the memory cell is connected to a portion in the first metal layer through the contact (C1); the source diffusion layer (S1) of the latch transistor (M1) is the grounded wire connected to the first metal layer wire through the contacts (C3 and C3a); the poly silicon (P1) of the latch transistor (M1) is connected to the first metal layer wire or the second metal layer wire through the contact (C2); the first metal layer and the second metal layer are connected to each other by the through hole (V1) formed being overlapped with the contact (C3); the gate of the select transistor (M2) having the source connected to the drain diffusion layer (D1) of the latch transistor (M1) is connected to the word line (WL) of the poly silicon layer; the drain of the select transistor (M2) is connected to the first metal layer wiring through the contact (C4) and further connected to the bit lines formed in the second metal layer through the through hole (V2).
摘要:
A parallel-to-serial conversion device capable of improved space efficiency has a corner turn memory array provided in an input section of the device to perform parallel-to-serial conversion by writing in the row direction of the input section and by reading out in the column direction of the input section, write section for selectively writing data into a first pair of memory cells of said corner turn memory array; and readout section for simultaneously reading data from a second pair of memory cells which are different from the first pair of memory cells.
摘要:
A static memory device comprises a memory cell array having of a plurality of sections, each including a plurality of memory cells. A selection signal for selecting one section is generated in accordance with a data writing or reading operation. First and second potentials of high level are generated, and one of the potentials are selectively supplied to pairs of bit lines in one of the plurality of sections. In a data writing operation, the pairs of bit lines are precharged to the first potential, e.g., the supply voltage V.sub.cc, and in a data reading operation, the pair of bit lines is precharged to the second potential, e.g., V.sub.cc -2V.sub.f, where V.sub.f is a forward voltage of a diode.
摘要:
A semiconductor device capable of performing a failure analysis includes a semiconductor substrate having a plurality of circuit elements, and an identification region provided above the semiconductor substrate so as to record identification information such as position information within wafers, information for wafer numbers, etc. The identification information is given by binary coded patterns, fused patterns of fuse elements, etc.
摘要:
The present invention provides a buffer circuit, which comprises a CMOS logic gate circuit in which at least one gate input terminal is input from other circuit, a MOS transistor for controlling a threshold voltage, which is inserted in series into a current path between power source electrodes of the CMOS logic gate circuit including MOS transistors connected to the input terminal, and a control circuit for controlling a gate voltage of the MOS transistor for controlling the threshold voltage such that the logic threshold voltage in the input terminal coincides with a predetermined logic threshold voltage without depending on variation in a power supply voltage, temperature, or a manufacturing process. The logic threshold voltage of the buffer circuit can be maintained constantly without depending on variation in the power supply voltage or temperature.
摘要:
A memory cell array includes a plurality of static memory cells arranged in a matrix form and selectively controlled by means of word lines to output complementary memory data to paired bit lines. An address transition detecting circuit generates an address transition signal in the form of a monostable pulse having a constant length when detecting the transition of an address signal. A bit line initializing circuit initializes the potentials of the paired bit lines in synchronism with the address transition signal. A pulse width extension circuit sets the pulse width of the address transition signal generated from the address transition detecting circuit to be longer in the write mode than in the readout mode.
摘要:
A Bi-CMOS logic circuit having a totem pole-type output buffer, a CMOS logic circuit, and a latch circuit. The output buffer comprises a pull-up NPN bipolar transistor and a pull-down NPN bipolar transistor. The CMOS logic circuit controls the base current of the pull-up NPN bipolar transistor. The latch circuit controls the base current of the pull-down NPN bipolar transistor. The latch circuit includes at least two N-type MOSFETs. The first MOSFET has a gate coupled to the input terminal of the CMOS logic circuit, a drain connected to the node of the first and second NPN bipolar transistors, and a source coupled to the base of said second NPN bipolar transistor. The second MOSFET has a drain coupled to the input terminal of the CMOS logic circuit, a gate connected to the node of the first and second NPN bipolar transistors, and a source coupled to the base of said second NPN bipolar transistor.