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公开(公告)号:US20240404604A1
公开(公告)日:2024-12-05
申请号:US18733187
申请日:2024-06-04
Applicant: Micron Technology, Inc.
Inventor: Jie Zhou , Xiangang Luo , Min Rui Ma , Guang Hu
Abstract: Methods, systems, and devices for determining offsets for memory read operations are described. In response to a threshold quantity of pages failing initial reads but being successfully read using a same reference adjustment during re-reads, the offset responsible for the adjustment may be used as a first-applied offset for subsequent re-reads or a baseline offset for subsequent initial reads. After the initial reads begin using the reference adjustment, if a threshold quantity of pages fail initial reads, the offset used for the initial read may be adjusted to be the offset used to perform the successful re-reads. If an updated offset to use a baseline is not identified, the baseline offset may be cleared so the original reference may again be used without adjustment for initial reads.
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公开(公告)号:US20240370181A1
公开(公告)日:2024-11-07
申请号:US18651781
申请日:2024-05-01
Applicant: Micron Technology, Inc.
Inventor: Yuqi Zhu , Guang Hu , Ting Luo , Xiangang Luo
IPC: G06F3/06
Abstract: Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to dynamically allocate blocks from a free block pool. The controller generates a free block pool that includes a collection of full blocks and a collection of partial good blocks (PGBs) of a set of memory components, a size of a full block in the collection of full blocks corresponding to a combination of two or more PGBs of the collection of PGBs. The controller receives a request to write data. The controller allocates an individual full block from the collection of full blocks or an individual PGB from the collection of PGBs based on determining whether the request to write the data has been received from the host device or the controller of the memory sub-system.
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公开(公告)号:US20240345947A1
公开(公告)日:2024-10-17
申请号:US18037631
申请日:2022-09-01
Applicant: Micron Technology, Inc.
Inventor: Xiangang Luo , Jianmin Huang , Xiaolai Zhu , Deping He , Kulachet Tanpairoj , Hong Lu , Chun Sum Yeung
IPC: G06F12/02
CPC classification number: G06F12/0246 , G06F2212/7201 , G06F2212/7205
Abstract: A method includes writing, to a first data structure, indices corresponding to address locations of a logical-to-physical (L2P) data structure that maps a plurality of logical block addresses (LBAs) associated with the L2P data structure, initiating performance of a media management operation involving one or more memory blocks in which data associated with the LBAs is written, and refraining from rewriting particular entries in the L2P table that correspond to LBAs whose index in the first data structure is a particular value during performance of the media management operation.
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公开(公告)号:US20240311057A1
公开(公告)日:2024-09-19
申请号:US18606670
申请日:2024-03-15
Applicant: Micron Technology, Inc.
Inventor: Daniel J. Hubbard , Kishore K. Muchherla , Hong Lu , Xiangang Luo , Akira Goda
IPC: G06F3/06
CPC classification number: G06F3/0679 , G06F3/0614 , G06F3/0659
Abstract: A method can comprise receiving data corresponding to a sequence of write commands to write the data to a memory array comprising a plurality of strings of memory cells. Each string of the plurality of strings comprises: a first group of memory cells coupled to a first group of access lines and corresponding to a first erase block having a first programming characteristic; and a second group of memory cells coupled to a second group of access lines and corresponding to a second erase block having a second programming characteristic. The method can further comprise writing data sequentially to the first erase blocks of the plurality of strings and the second erase blocks of the plurality of strings in an interleaved manner by: writing a first portion of the data to one or more first erase blocks of the plurality of strings; and writing, subsequent to writing the first portion of the data to the one or more first erase blocks, a second portion of the data to one or more second erase blocks of the plurality of strings.
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公开(公告)号:US20240168878A1
公开(公告)日:2024-05-23
申请号:US18386746
申请日:2023-11-03
Applicant: Micron Technology, Inc.
Inventor: Akira Goda , Kishore K. Muchherla , Shyam Sunder Raghunathan , Leo Raimondo , Jung Sheng Hoei , Xiangang Luo , Ashutosh Malshe , Jianmin Huang
IPC: G06F12/02
CPC classification number: G06F12/0246
Abstract: An apparatus can comprise a memory array comprising a plurality of strings of memory cells. Each string of the plurality of strings can comprise: a first group of memory cells coupled to a first group of access lines and corresponding to a first erase block; and a second group of memory cells coupled to a second group of access lines and corresponding to a second erase block. A controller is coupled to the memory array and configured to: perform a programming operation on the first group of memory cells of the first erase block; monitor a quantity of programming and/or erase operations performed on the second group of memory cells subsequent to the programming of the first group of memory cells; and perform an action on the first erase block responsive to the quantity of programming and/or erase operations performed on the second group of memory cells meeting a criteria.
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公开(公告)号:US11822796B2
公开(公告)日:2023-11-21
申请号:US17857780
申请日:2022-07-05
Applicant: Micron Technology, Inc.
Inventor: Tao Liu , Xiangang Luo
IPC: G06F3/06
CPC classification number: G06F3/0625 , G06F3/0604 , G06F3/0652 , G06F3/0679
Abstract: A method includes detecting a power-up event associated with a memory sub-system comprising a plurality of blocks of memory cells having blocks of memory cells associated therewith, responsive to detecting the power-up event and prior to receipt of signaling indicative of a host initiation sequence, determining that a block of memory cells associated with a respective block among the plurality of blocks of memory cells is an open virtual block of memory cells, determining that the respective block associated with the open virtual block of memory cells exhibits greater than a threshold health characteristic value, and selectively performing a media management operation of a respective block of memory cells associated with the open virtual block of memory cells in response to the determination that the respective block exhibits greater than the threshold health characteristic value.
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公开(公告)号:US20230325273A1
公开(公告)日:2023-10-12
申请号:US18207525
申请日:2023-06-08
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Shane Nowell , Mustafa N. Kaynak , Sampath K. Ratnam , Peter Feeley , Sivagnanam Parthasarathy , Devin M. Batutis , Xiangang Luo
IPC: G06F11/07
CPC classification number: G06F11/0793 , G06F11/0751 , G06F11/0727
Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including detecting a read error with respect to data residing in a first block of the memory device, wherein the first block is associated with a voltage offset bin; determining a most recently performed error-handling operation performed on a second block associated with the voltage offset bin; and performing the error-handling to recover the data.
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公开(公告)号:US11783901B2
公开(公告)日:2023-10-10
申请号:US17880980
申请日:2022-08-04
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Shane Nowell , Mustafa N. Kaynak , Karl D. Schuh , Jiangang Wu , Devin M. Batutis , Xiangang Luo
CPC classification number: G11C16/34 , G06F3/0604 , G06F3/0632 , G06F3/0659 , G06F3/0679 , G06F11/076 , G06F11/0727 , G06F11/0793 , G11C16/26 , G11C16/0483
Abstract: A system includes a memory device and a processing device. The processing device performs, at a first frequency, a first scan of a page of a block family that measures a first data state metric and identifies a specific bin corresponding to a measured value for the first data state metric. Processing device updates a bin, to which the page is assigned, to match the specific bin. Processing device performs, at a second frequency higher than the first frequency, a second scan of the page to measure a second data state metric for read operations performed using a threshold voltage offset value from each of multiple bins. Processing device updates the bin, to which the page is assigned for the specified die, to match a second bin having the threshold voltage offset value that yields a lowest read bit error rate from the second scan.
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公开(公告)号:US11776655B2
公开(公告)日:2023-10-03
申请号:US17965481
申请日:2022-10-13
Applicant: Micron Technology, Inc.
Inventor: Sri Rama Namala , Jung Sheng Hoei , Jianmin Huang , Ashutosh Malshe , Xiangang Luo
CPC classification number: G11C29/4401 , G11C29/18 , G11C29/40 , G11C2029/1806 , G11C2029/4002
Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).
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公开(公告)号:US11775181B2
公开(公告)日:2023-10-03
申请号:US17708735
申请日:2022-03-30
Applicant: Micron Technology, Inc.
Inventor: Xiangang Luo , Harish Reddy Singidi , Ting Luo , Kishore Kumar Muchherla
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0653 , G06F3/0679
Abstract: Systems and methods are disclosed, including maintaining an error recovery data structure for a set of codewords (CWs) in a storage system, the error recovery data structure storing indications that specific CWs are correctable or not correctable by specific error handing (EH) steps of a set of multiple EH steps, and determine an order of EH steps for the storage system based on the error recovery data structure. Maintaining the error recovery data structure can include determining if each CW of the set of CWs is correctable by a specific EH step, storing indications of CWs determined correctable by the specific EH step in the error recovery data structure, and, in response to determining that one or more CW in the set of CWs are not indicated as correctable in the error recovery data structure, incrementing the specific EH step.
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