Abstract:
Circuits, integrated circuits, and methods are disclosed for bimodal disable circuits. In one such example method, a counter is maintained, with the counter indicating a logic level at which an output signal will be disabled during at least a portion of one of a plurality of disable cycles. The logic level indicated by the counter is transitioned. An input signal is provided as the output signal responsive to the enable signal indicating that the output signal is to be enabled, and the output signal is disabled at the logic level indicated by the counter responsive to the enable signal indicating that the output signal is to be disabled.
Abstract:
Circuits, integrated circuits, and methods are disclosed for bimodal disable circuits. In one such example method, a counter is maintained, with the counter indicating a logic level at which an output signal will be disabled during at least a portion of one of a plurality of disable cycles. The logic level indicated by the counter is transitioned. An input signal is provided as the output signal responsive to the enable signal indicating that the output signal is to be enabled, and the output signal is disabled at the logic level indicated by the counter responsive to the enable signal indicating that the output signal is to be disabled.
Abstract:
Locked loops, delay lines, delay circuits, and methods for delaying signals are disclosed. An example delay circuit includes a delay line including a plurality of delay stages, each delay stage having an input and further having a single inverting delay device, and also includes a two-phase exit tree coupled to the delay line and configured to provide first and second output clock signals responsive to clock signals from inputs of the delay stages of the plurality of delay stages. Another example delay circuit includes a delay line configured to provide a plurality of delayed clock signals, each of the delayed clock signals having a delay relative to a previous delayed clock signal equal to a delay of a single inverting delay device. The example delay circuit also includes a two-phase exit tree configured to provide first and second output clock signals responsive to the delayed clock signals.
Abstract:
Circuits, integrated circuits, and methods are disclosed for bimodal disable circuits. In one such example method, a counter is maintained, with the counter indicating a logic level at which an output signal will be disabled during at least a portion of one of a plurality of disable cycles. The logic level indicated by the counter is transitioned. An input signal is provided as the output signal responsive to the enable signal indicating that the output signal is to be enabled, and the output signal is disabled at the logic level indicated by the counter responsive to the enable signal indicating that the output signal is to be disabled.
Abstract:
A memory device includes a stack of eight memory dies having an 8N architecture and a stack of four memory dies having a 4N architecture. A first half and a second half of the stack of eight memory dies can each include 32 channels divided equally across the first half of dies and across the second half of dies. Banks of each of the 32 channels on the first half of dies can be associated with respective first pseudo channels. Banks of each of the 32 channels on the second half of dies can be associated with respective second pseudo channels. The stack of four memory dies can include the 32 channels divided equally amongst the dies, and the banks of each of the 32 channels on the stack of four memory dies can be divided equally across the respective first and second pseudo channels.
Abstract:
A device includes a clock input circuit that when in operation receives a clock signal and transmits an internal clock signal based on the clock signal. The device also includes an internal clock generator coupled to the clock input circuit to receive the internal clock signal, wherein the internal clock generator comprises clock adjustment circuitry that when in operation generates a phase controlled internal clock signal having subsequent clock edges based upon a single clock edge of the internal clock signal, wherein the phase controlled internal clock signal comprises a first frequency as a multiple of a second frequency of the internal clock signal.
Abstract:
Pulse detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is unacceptable. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus an unacceptable pulse.
Abstract:
Glitch detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is a glitch. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus a problematic glitch.
Abstract:
A jitter generator may include a duty cycle code generator that generates a duty cycle control signal and an input buffer that outputs a signal based on its duty cycle. The input buffer may be coupled to the duty cycle code generator and to a source of a clock signal. After receiving the clock signal, the input buffer outputs the clock signal having jitter relative to the clock signal received from the source. The jitter may be added at least in part by components of the input buffer offsetting different transitions of the clock signal according to the duty cycle. Jitter may be added when the duty cycle changes in response to changes in the duty cycle control signal, such as in response to number generator circuitry of the duty cycle code generator update its output number, in response to a mode change received from a controller, or the like.
Abstract:
Glitch detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is a glitch. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus a problematic glitch.