摘要:
An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilicon shape, the spacer width is formed to be small enough near the bridging vertex to allow a silicide bridge to form that creates an electrical coupling between the silicon area and the bridging vertex. Semiconductor devices and circuits are created using the improved semiconductor interconnect scheme using the simplified process.
摘要:
A first through via is electrically insulated from surrounding wafer substrate material. A second through via is not electrically insulated from the surrounding wafer substrate material. This configuration is advantageous when the non-insulated via serves as the path for either Vdd or GND. By not insulating the through via, a first supply voltage (Vdd or GND) is allowed to flow through the surrounding wafer substrate material thereby decreasing the resistance of the first supply voltage path.
摘要:
A method and apparatus including a static random access memory (SRAM) cell implement an enhanced SRAM read performance sort ring oscillator (PSRO). A pair of parallel reverse polarity connected inverters defines a static latch or cross-coupled memory cell. The SRAM cell includes independent left and right wordlines providing a respective gate input to a pair of access transistors used to access to the memory cell. The SRAM cell includes a voltage supply connection to one side of the static latch. For example, a complement side of the static latch is connected to the voltage supply. A plurality of the SRAM cells is assembled together to form a SRAM base block. A plurality of the SRAM base blocks is connected together to form the SRAM read PSRO.
摘要:
A method and a sum addressed content-addressable memory (CAM) compare are provided for implementing an enhanced sum address compare function. True and compliment bit signals applied to the CAM compare are encoded by combining respective ones of the applied true and compliment bit signals. Then the encoded true and compliment bit signals are applied to a critical path dynamic compare circuit. An encoder apparatus encodes true and compliment bit signals that then are applied to the dynamic compare circuit in the critical path.
摘要:
A method and a sum addressed content-addressable memory (CAM) compare are provided for implementing an enhanced sum address compare function. True and compliment bit signals applied to the CAM compare are encoded by combining respective ones of the applied true and compliment bit signals. Then the encoded true and compliment bit signals are applied to a critical path dynamic compare circuit. An encoder apparatus encodes true and compliment bit signals that then are applied to the dynamic compare circuit in the critical path.
摘要:
An improved memory device has a reduced number of wires for carrying local write signals. The improved memory device includes an array of memory cells. A plurality of local true bitlines is coupled to the array of memory cells. A plurality of continuous complement bitlines is coupled to the array of memory cells. The memory device also includes a plurality of write circuits. At least one write circuit is coupled to at least one continuous complement bitline and at least one local true bitline, receives information on a data input from the continuous complement bitline, and controls the local true bitline. At least one local write line is coupled to at least two of the write circuits for providing a write enable signal to the two write circuits.
摘要:
A method and apparatus are provided for laser fuseblow protection in transistors, such as silicon-on-insulator (SOI) transistors. The transistors are connected to a fuse. A pair of diodes are connected in series between a high supply and ground. A common connection of the series connected pair of diodes is connected to a common connection of the fuse and transistors. A charge is shunted to the high supply or ground by the pair of diodes with a first voltage a set value above the high supply and a second voltage a set value below the ground. A pair of protection diodes are provided on each side of the fuse with transistors. The transistors are either connected to one side of the fuse or to both sides of the fuse.
摘要:
Methods and silicon-on-Insulator (SOI) semiconductor structures are provided for implementing transistor source connections for SOI transistor devices using buried dual rall distribution. A SOI semiconductor structure Includes a SOI transistor having a silicide layer covering a SOI transistor source, a predefined burled conduction layer to be connected to a SOI transistor source, and an Intermediate conduction layer between the SOI transistor and the predefined buried conduction layer, A first hole for a transistor source connection to a local interconnect is anisotropically etched in the SOI semiconductor structure to the silcide layer covering the SOI transistor source. A second hole aligned with the local interconnect hole is anisotropically etched through the SOI semiconductor structure to the predefined buried conduction layer. An Insulator is disposed between the second hole and the intermediate conduction layer. A conductor Is deposited in the first and second holes to create a transistor source connection to the predefined burled conduction layer In the SOI semiconductor structure.
摘要:
The present invention is a decoupling capacitor for an integrated circuit. The integrated circuit has a final metal layer which includes a power bus. The decoupling capacitor comprises a dielectric film disposed over the final metal layer and a conductive film disposed over the dielectric layer, whereby capacitance may be provided in the dielectric layer.
摘要:
The present invention is a decoupling capacitor for an integrated circuit. The integrated circuit has a final metal layer which includes a power bus. The decoupling capacitor includes a dielectric film disposed over the final metal layer and a conductive film disposed over the dielectric layer, whereby capacitance may be provided in the dielectric layer.