Fabric Die to Fabric Die Interconnect for Modularized Integrated Circuit Devices

    公开(公告)号:US20230378061A1

    公开(公告)日:2023-11-23

    申请号:US18137405

    申请日:2023-04-20

    CPC classification number: H01L23/528 H03K19/17704 H01L23/49816

    Abstract: The presently disclosed programmable fabric die includes a direct fabric die-to-fabric die interconnect interface column disposed in a sector of programmable logic fabric. Each row of the interconnect interface column includes at least one interconnect interface that is electrically coupled to a microbump. The microbump is configured to be electrically coupled to another microbump of another interconnect interface of another fabric die through an interposer. The fabric die may include multiple interconnect interface columns that each extend deep into the sector, enabling low latency connections between the fabric dies and reducing routing congestion. In some embodiments, the fabric die may include interconnect interfaces that are instead distributed throughout logic blocks of the sector.

    Periphery shoreline augmentation for integrated circuits

    公开(公告)号:US11449247B2

    公开(公告)日:2022-09-20

    申请号:US16953138

    申请日:2020-11-19

    Abstract: A multichip package may include at least a main die mounted on a substrate. The main die may be coupled to one or more transceiver dies also mounted on the substrate. The main die may include one or more universal interface blocks configured to interface with an on-package memory device or an on-package expansion die, both of which can be mounted on the substrate. The expansion die may include external memory interface (EMIF) components for communicating with off-package memory devices and/or bulk random-access memory (RAM) components for storing large amounts of data for the main die. Smaller input-output blocks such as GPIO (general purpose input-output) or LVDS (low-voltage differential signaling) interfaces may be formed within the core fabric of the main die without causing routing congestion while providing the necessary clock source.

    Modular interconnection repair of multi-die package

    公开(公告)号:US10665548B2

    公开(公告)日:2020-05-26

    申请号:US16133216

    申请日:2018-09-17

    Inventor: Chee Hak Teh

    Abstract: An integrated circuit device or devices is presented that include internal connection ports to transmit data to or receive data from a first portion of the integrated circuit device. The integrated circuit device(s) also include external connection ports to transmit data to or receive data from outside the integrated circuit device, such as between integrated circuit devices. The integrated circuit device also includes remapping circuitry that remaps from a first connection between a first internal connection port of the internal connection ports and a first external connection port of the external connection ports to a second connection between a second internal connection port of the internal connection ports and a second external connection port of the external connection ports.

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