公开(公告)号：US10765383B2

公开(公告)日：2020-09-08

申请号：US15743304

申请日：2016-07-12

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Gerhard Martens ,  Ewald Roessl

IPC: G21K1/06 ,  A61B6/06 ,  A61B6/00 ,  G01N23/044 ,  G01N23/20008 ,  G02B5/10 ,  G02B27/09 ,  G21K1/02

Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread Θm between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited. The limitation provides the effect that an angle of reflection Θr of the totally reflected X-ray radiation is limited. Consequently, an X-ray intensity at the object receiving space (6) is increased while constrains are provided, which prevent a large increase of a width of the X-ray radiation provided at the object receiving space (6), which effectively improves an imaging quality of an object of interest being arrangeable at the object receiving space (6).

公开(公告)号：US10557806B2

公开(公告)日：2020-02-11

申请号：US15765726

申请日：2016-10-12

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Roger Steadman Booker ,  Ewald Roessl

IPC: G01N23/04 ,  G01N23/046 ,  A61B6/00 ,  A61B6/03

Abstract: The present invention relates to a dual- or multi-source CT system and method. For suppressing or even completely eliminating the negative effects of cross-scatter, the proposed CT system comprises two x-ray sources (10, 11), two detectors (13, 14), two read-out units (15, 16), a control unit (17) and a reconstruction unit (19). Further, a scatter correction unit (18) is provided or the read-out units (15, 16) are configured to generate scatter-corrected read-out signals from the detected radiation, wherein a scatter-corrected read-out signal is generated from the radiation detected by a detector during a single projection interval (I) including multiple repetitions of three phases, in which the sources are alternately switched on and off and in which the read-out units alternately register primary radiation or cross-scatter radiation.

公开(公告)号：US10539688B2

公开(公告)日：2020-01-21

申请号：US16335819

申请日：2018-08-03

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Roger Steadman Booker ,  Ewald Roessl ,  Walter Ruetten

IPC: G01T1/20 ,  G01T1/208 ,  G01T1/24

Abstract: In a conventional phase-contrast X-ray imaging system, a source grating G0 generates an array of partially coherent line sources which illuminate an object and thereafter phase grating G1. The periodicity in the phase grating is self-imaged at certain instances further away from the X-ray source and sampled by a mechanically movable third absorptive analyzer grating G2 before the demodulated fringe intensity is detected by a conventional X-5 ray detector. This application proposes to directly demodulate the fringe intensity using a structured scintillator having a plurality of slabs in alignment with sub-pixels of an optical detector layer, in combination with electronic signal read-out approaches. Therefore, a mechanically movable third absorptive analyzer grating G2 can be omitted from a phase-contrast X-ray imaging system.

公开(公告)号：US10080533B2

公开(公告)日：2018-09-25

申请号：US15104024

申请日：2014-12-16

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Heiner Daerr ,  Thomas Koehler

IPC: G01T1/24 ,  A61B6/00 ,  A61B6/03 ,  H01J35/10 ,  H05G1/60 ,  H01J35/06 ,  H05G1/56

CPC classification number: A61B6/4241 ,  A61B6/032 ,  A61B6/035 ,  A61B6/405 ,  A61B6/482 ,  A61B6/542 ,  G01T1/247 ,  H01J35/06 ,  H01J35/10 ,  H01J2235/086 ,  H05G1/56 ,  H05G1/60

Abstract: An imaging system (100) includes a radiation source (110) with a focal spot (204) that emits a beam of x-ray photons that traverses an examination region (106). The imaging system further includes a photon counting detector array (122) that detects a sub-set of the x-ray photons that traverse an examination region. The imaging system further includes a controller (116) that generates and transmits a pause signal, in response to a calculated drop in an intensity of the emitted the beam of x-ray photons below a predetermined intensity level, which causes the photon counting detector array to pause detecting the sub-set of the x-ray photons. The imaging system further includes a counter (136) that counts, for each of a plurality of counting periods, the x-ray photons of the sub-set detected by the photon counting detector array in the corresponding counting period.

公开(公告)号：US09750471B2

公开(公告)日：2017-09-05

申请号：US14889899

申请日：2014-05-10

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Carsten Oliver Schirra ,  Axel Thran ,  Heiner Daerr ,  Ewald Roessl

IPC: G06F19/00 ,  G01N21/00 ,  G01D18/00 ,  A61B6/00 ,  A61B6/03 ,  G01T1/169 ,  G01T7/00 ,  G01T1/161

CPC classification number: A61B6/4241 ,  A61B6/032 ,  A61B6/4233 ,  A61B6/482 ,  A61B6/583 ,  A61B6/585 ,  G01T1/161 ,  G01T1/169 ,  G01T7/005

Abstract: A method includes determining calibration factors for calibrating photon-counting detectors of a spectral imaging system by combining a heuristic calibration of the photon-counting detectors and an analytical calibration of the photon-counting detectors and generating a set of photon-counting calibration factors based on the combining of the a heuristic calibration and the analytical calibration. The photon-counting calibration factors, when applied to measured energy-resolved data from the photon-counting detectors of a spectral CT scan of a subject or object, mitigate spectral distortion caused by a radiation intensity profile shaper that filters a radiation beam of the spectral CT scan.

公开(公告)号：US09717470B2

公开(公告)日：2017-08-01

申请号：US14421008

申请日：2013-08-20

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Gerhard Martens ,  Heiner Daerr ,  Thomas Detlef Istel ,  Ewald Roessl ,  Udo Van Stevendaal

IPC: G01N23/04 ,  A61B6/00 ,  G01N23/20

CPC classification number: A61B6/587 ,  A61B6/484 ,  A61B6/582 ,  A61B6/588 ,  A61B6/589 ,  G01N23/20025 ,  G01N23/20075 ,  G01N2223/643

Abstract: An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.

公开(公告)号：US09640293B2

公开(公告)日：2017-05-02

申请号：US14785644

申请日：2014-11-12

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Thomas Koehler

IPC: G21K1/06

CPC classification number: G21K1/065 ,  G21K1/06 ,  G21K2207/005

Abstract: The invention relates to a grating arrangement and a method for spectral filtering of an X-ray beam (B), the grating arrangement comprising: a dispersive element (10) comprising a prism configured to diffract the X-ray beam (B) into a first beam component (BC1) comprising a first direction (D1) and a second beam component comprising (BC2) a second direction (D2), tilted with respect to the first direction; a first grating (20) configured to generate a first diffraction pattern (DP1) of the first beam component (BC1) and a second diffraction pattern (DP2) of the second beam component (BC2), the second diffraction pattern (DP2) shifted with respect to the first diffraction patter (DP1); and a second grating (30) comprising at least one opening (31) which is aligned along a line (d) from a maximum (MA) to a minimum (MI) of intensity of the first diffraction pattern (DP1) or of the second diffraction pattern (DP2).

公开(公告)号：US09538970B2

公开(公告)日：2017-01-10

申请号：US14370301

申请日：2012-12-26

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Thomas Koehler ,  Ewald Roessl

IPC: A61B6/00

CPC classification number: A61B6/484 ,  A61B6/482

Abstract: A system and method for generating phase image data by using the same detector to simultaneously operate in two different modes to simultaneously obtain first and second x-ray image data with different spectral weightings. The first and second x-ray image data respectively include first and second pixel-wise measurement signal values. The detector is configured to obtain the first x-ray image data in a first measurement mode and obtain the second x-ray image data in a second measurement mode different from the first measurement mode for generating the phase image data. The generated phase image data includes pixel-wise phase values from the first and second x-ray image data and is determined by determining a phase value at a pixel from a first measurement signal value obtained in the first measurement mode at the pixel, and from a second measurement signal value obtained in the second measurement mode at the pixel.

Abstract translation: 一种用于通过使用相同检测器以两种不同模式同时操作以同时获得具有不同频谱权重的第一和第二X射线图像数据来产生相位图像数据的系统和方法。 第一和第二X射线图像数据分别包括第一和第二像素测量信号值。 检测器被配置为以第一测量模式获得第一x射线图像数据，并且以与用于生成相位图像数据的第一测量模式不同的第二测量模式获得第二X射线图像数据。 生成的相位图像数据包括来自第一和第二X射线图像数据的像素相位值，并且通过从在像素处的第一测量模式中获得的第一测量信号值确定像素处的相位值，并且从 在该像素处以第二测量模式获得的第二测量信号值。

公开(公告)号：US09423514B2

公开(公告)日：2016-08-23

申请号：US14359311

申请日：2012-11-23

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Axel Thran ,  Roland Proksa

IPC: G01T1/20

CPC classification number: G01T1/20 ,  G01T1/2008

Abstract: Detection apparatus for detecting radiation The invention relates to a detection apparatus for detecting radiation. The detection apparatus comprises at least two scintillators (14, 15) having different temporal behaviors, each generating scintillation light upon reception of radiation, wherein the generated scintillation light is commonly detected by a scintillation light detection unit (16), thereby generating a common light detection signal. A detection values determining unit determines first detection values by applying a first determination process and second detection values by applying a second determination process, which is different to the first determination process, on the detection signal. The first determination process includes frequency filtering the detection signal. Since the scintillation light of the different scintilla-tors is collectively detected by the same scintillation light detection unit, detection arrangements with, for example, side-looking photodiodes for separately detecting the different scintillation light of the different scintillators are not necessarily required, thereby reducing the technical complexity of the detection apparatus.

Abstract translation: 用于检测辐射的检测装置技术领域本发明涉及一种用于检测辐射的检测装置。 检测装置包括具有不同时间行为的至少两个闪烁体（14,15），每个闪烁体在接收到辐射时产生闪烁光，其中所产生的闪烁光通常由闪烁光检测单元（16）检测，从而产生公共光 检测信号。 检测值确定单元通过对检测信号应用与第一确定处理不同的第二确定处理来应用第一确定处理和第二检测值来确定第一检测值。 第一确定处理包括对检测信号进行频率滤波。 由于不同的闪烁体的闪烁光被同一个闪烁光检测部共同检测，所以不一定需要与例如用于分别检测不同的闪烁体的不同的闪烁体的侧视光电二极管的检测装置，从而减少 检测装置的技术复杂性。

公开(公告)号：US09349494B2

公开(公告)日：2016-05-24

申请号：US14381234

申请日：2013-02-06

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl

IPC: G01N23/04 ,  G21K1/02 ,  A61B6/03 ,  A61B6/06 ,  A61B6/00

CPC classification number: G21K1/02 ,  A61B6/032 ,  A61B6/06 ,  A61B6/4021 ,  A61B6/4035 ,  G01N23/04

Abstract: An imaging system (500) includes a focal spot (508) that rotates along a path around an examination region and emits a radiation beam that traverses a field of view of the examination region and a subject or object therein. The system further includes a detector array (520) that is located opposite the radiation source, across the examination region. The detector array detects radiation traversing the field of view and outputs a signal indicative of the detected radiation. The system further includes a beam shaper that is located between the radiation source and the examination region. The beam shaper rotates with the focal spot and, relative to the focal spot, in an opposite direction of the focal spot with a same angular frequency as the rotating of the focal spot and attenuates the radiation beam which reduces a flux density across the detector array at each rotational angle of the focal spot.

Abstract translation: 成像系统（500）包括焦点（508），其沿着检查区域周围的路径旋转并且发射穿过检查区域的视野的辐射束以及其中的被摄体或物体。 该系统还包括跨越检查区域与辐射源相对定位的检测器阵列（520）。 检测器阵列检测穿过视野的辐射，并输出指示检测到的辐射的信号。 该系统还包括位于辐射源和检查区域之间的光束整形器。 光束整形器与焦点一起旋转并且相对于焦斑以与焦点的旋转相同的角频率与焦点的相反方向旋转，并且衰减辐射束，从而降低了检测器阵列上的通量密度 在焦斑的每个旋转角度。