摘要:
The information processing apparatus includes: a specification information reception unit that receives specification information for specifying a predetermined one of a plurality of resources; a determination unit that determines a device managing the resource specified by the specification information from among a plurality of devices based on the specification information received by the specification information reception unit; a specification information notification unit that sends the specification information to the device that has been determined, by the determination unit, to manage the resource specified by the specification information; an association unit that associates plural pieces of resource information with one another based on the sent resource information; and a resource information processing unit that executes predetermined processing for the resource information based on the association among the plural pieces of resource information associated by the association unit.
摘要:
Based on past failure sign appearance situations and past failure occurrence situations, failure occurrence probability which varies with a time elapse after failure sign appearance is calculated, and also, based on maintenance cost information of an operations management objective system, a short-term troubleshooting cost required for responding to a failure associated with the failure sign appeared in the system is calculated. Furthermore, based on the past failure sign appearance situations and the past failure occurrence situations, and also, the maintenance cost information and the failure occurrence probability, a short-term first preventive maintenance cost required for preventive maintenance of the failure associated with the failure sign, and also, the failure occurrence probability and a short-term second preventive maintenance cost for when preventive maintenance performance is postponed until next failure sign appearance, are calculated. Then, options in which the short-term first preventive maintenance cost, the short-term second preventive maintenance cost and the troubleshooting cost are associated with the failure occurrence probability, are prepared to be offered via an output device.
摘要:
When a problem occurs in a computer system, the following processing is performed. That is, a troubleshooting procedure that includes, at least, operation content and input request for system information, presented to an operator, and in which command to acquire system information related to the input request from the information source of the system information are assigned to the input request, is referenced. Furthermore, in accordance with the command, system information is collected from an information source where system information exists. Then, after those input request for system information have been removed from the troubleshooting procedure, the resultant troubleshooting procedure is presented to the operator. Thus, the workload of the operator in the troubleshooting operation can be significantly reduced, and the time until the operation is completed is shortened, making rapid troubleshooting possible.
摘要:
An information management device for performing an information update process from a virtual integrated management device that manages a plurality of device configuration information management devices to the device configuration information management devices, comprises a meta information management unit and an update processing unit. The meta information management unit, which is used to store meta information, indicates from which device configuration information management devices managed information comes. The update processing unit is used to narrow down the device configuration information management devices having information. The information is the basis of information on an update process such as registration, update and deletion based on the meta information, and giving a request for the update process, such as registration, update and deletion only to the device configuration information management devices narrowed down.
摘要:
A supporting apparatus includes a configuration-information storage unit having stored therein dependencies among devices in association with a list of the devices. When information about a device where a failure has occurred is input, a dependency among devices including the faulty device is obtained from the configuration-information storage unit. Based on the obtained dependency among devices including the faulty device and information about the faulty device, learning data with the dependency and a cause of failure being associated with each other is created. Then, based on the created learning data, a solution procedure indicative of a procedure for specifying the cause of failure is generated by using, for example, algorithm ID3.
摘要:
In object collaboration via a message, various message types are dealt with. Furthermore, synchronization processing between objects is conducted easily and flexibly. A message type is previously classified and arranged hierarchically. A message/action reaction table 103 arranged on the message type basis is held in a message/action reaction relationship storing part 102. A received message is subjected to matching by a message type classifying/matching part 107. When the received message is matched with a message type dealt with by the message/action reaction relationship storing part 102, the message is given to an action executing part 104. When the received message is not matched with a message type dealt with by the message/action reaction relationship storing part 102, the message is discarded.
摘要:
A policy that relates attributes of an agent to a role is distributed to each agent on a network. A field connector generates an internal field in accordance with an instruction of a security manager. A ROLE manager uses attribute information from an attribute manager, and assigns each agent a ROLE in accordance with the attributes of each agent, and installs a ROLE method table and a ROLE execution part. When receiving a message from an external network, each agent searches for a corresponding ROLE by referring to the ROLE method table, and executes the ROLE. Thus, collaboration among agents is realized through a virtual communication channel based on the exchange of a message.
摘要:
A memory test is carried out on semiconductor integrated circuit devices including a semiconductor memory at low cost with efficiency. In a test burn-in system, twenty-four test boards are processed in sequence with time differences, and the test boards are circulated one by one. In this case, the memory test is conducted with the sequence of single board processing: the test is started with a test board in which semiconductor integrated circuit devices have been embedded, and semiconductor integrated circuit devices are discharged, beginning with a test board that has undergone the test.
摘要:
A collective retrieval function of a DMC (or DMP) device requests a DMS device having a “sufficient search capability” to conduct retrieval using a retrieval function provided in the DMS device, whereas the DMC (or DMP) conducts retrieval from a DMS device not having the “sufficient search capability” by using “retrieval-by-index” in place of retrieval performed by the DMS device. Thus, because requests for retrieval and retrieval-by-index are actively switched according to whether the DMS device to be subjected to the collective retrieval has the “sufficient search capability”, it is possible to conduct collective retrieval irrespective of whether the DMS device has the “sufficient retrieval capability”.
摘要:
The fabrication of a semiconductor integrated circuit device involves testing using a pushing mechanism that is constructed by forming, over the upper surface of a thin film probe, a reinforcing material having a linear expansion coefficient (thermal expansion coefficient) almost equal to that of a wafer to be tested; forming a groove in the reinforcing material above a contact terminal; placing an elastomer in the groove so that a predetermined amount projects out of the groove; and disposing a pusher and another elastomer to sandwich the pusher between the elastomers. With the use of such a probe, it is possible to improve the throughput of wafer-level electrical testing of a semiconductor integrated circuit.