Silicon carbide semiconductor device having junction field effect transistor and method for manufacturing the same
    43.
    发明授权
    Silicon carbide semiconductor device having junction field effect transistor and method for manufacturing the same 有权
    具有结场效应晶体管的碳化硅半导体器件及其制造方法

    公开(公告)号:US07005678B2

    公开(公告)日:2006-02-28

    申请号:US10984953

    申请日:2004-11-10

    CPC classification number: H01L29/66068 H01L29/1608 H01L29/8083 Y10S438/931

    Abstract: A silicon carbide semiconductor device includes: a semiconductor substrate including a base substrate, a first semiconductor layer, a second semiconductor layer and a third semiconductor layer, which are laminated in this order; a cell portion disposed in the semiconductor substrate and providing an electric part forming portion; and a periphery portion surrounding the cell portion. The periphery portion includes a trench, which penetrates the second and the third semiconductor layers, reaches the first semiconductor layer, and surrounds the cell portion so that the second and the third semiconductor layers are divided by the trench substantially. The periphery portion further includes a fourth semiconductor layer disposed on an inner wall of the trench.

    Abstract translation: 碳化硅半导体器件包括:依次层叠的包括基底基板,第一半导体层,第二半导体层和第三半导体层的半导体基板; 设置在所述半导体衬底中并提供电气部件形成部分的单元部分; 以及围绕单元部分的周边部分。 周边部分包括穿透第二和第三半导体层的沟槽到达第一半导体层,并且围绕电池部分,使得第二和第三半导体层基本上被沟槽划分。 外围部分还包括设置在沟槽的内壁上的第四半导体层。

    Silicon carbide semiconductor device having junction field effect transistor and method for manufacturing the same
    47.
    发明申请
    Silicon carbide semiconductor device having junction field effect transistor and method for manufacturing the same 有权
    具有结场效应晶体管的碳化硅半导体器件及其制造方法

    公开(公告)号:US20050151158A1

    公开(公告)日:2005-07-14

    申请号:US10984953

    申请日:2004-11-10

    CPC classification number: H01L29/66068 H01L29/1608 H01L29/8083 Y10S438/931

    Abstract: A silicon carbide semiconductor device includes: a semiconductor substrate including a base substrate, a first semiconductor layer, a second semiconductor layer and a third semiconductor layer, which are laminated in this order; a cell portion disposed in the semiconductor substrate and providing an electric part forming portion; and a periphery portion surrounding the cell portion. The periphery portion includes a trench, which penetrates the second and the third semiconductor layers, reaches the first semiconductor layer, and surrounds the cell portion so that the second and the third semiconductor layers are divided by the trench substantially. The periphery portion further includes a fourth semiconductor layer disposed on an inner wall of the trench.

    Abstract translation: 碳化硅半导体器件包括:依次层叠的包括基底基板,第一半导体层,第二半导体层和第三半导体层的半导体基板; 设置在所述半导体衬底中并提供电气部件形成部分的单元部分; 以及围绕单元部分的周边部分。 周边部分包括穿透第二和第三半导体层的沟槽到达第一半导体层,并且围绕电池部分,使得第二和第三半导体层基本上被沟槽划分。 外围部分还包括设置在沟槽的内壁上的第四半导体层。

    Method of manufacturing silicon carbide semiconductor device using active and inactive ion species
    49.
    发明授权
    Method of manufacturing silicon carbide semiconductor device using active and inactive ion species 有权
    使用有源和非活性离子物质制造碳化硅半导体器件的方法

    公开(公告)号:US06297100B1

    公开(公告)日:2001-10-02

    申请号:US09408185

    申请日:1999-09-29

    Abstract: In a vertical MOSFET, an inactive ion species is ion-implanted into a J-FET portion, a surface channel layer, and/or a base region. The inactive ion species fill intrinsic carbon vacancies or interact with interstitial Si atoms, which are possible origin or responsible for B-diffusion from the base region. Accordingly, the B-diffusion caused by the intrinsic carbon vacancies when the base region is formed is suppressed. The width of the J-FET portion is prevented from being decreased, thereby preventing an increase in resistance of the J-FET portion. Also, the conductive type of the surface channel layer is prevented from being inverted by diffused impurities.

    Abstract translation: 在垂直MOSFET中,将非活性离子种离子注入到J-FET部分,表面沟道层和/或基极区域中。 非活性离子物质填充本征碳空位或与间隙Si原子相互作用,这是可能的起源或负责来自碱性区域的B扩散。 因此,抑制了形成基极区域时由本征碳空位引起的B扩散。 防止J-FET部分的宽度减小,从而防止J-FET部分的电阻增加。 此外,通过扩散的杂质防止了表面通道层的导电类型的反转。

    METHODS, DEVICES AND SYSTEMS FOR TREATING NEOINTIMAL GROWTH

    公开(公告)号:US20250073014A1

    公开(公告)日:2025-03-06

    申请号:US18909484

    申请日:2024-10-08

    Abstract: The present invention relates generally to medical compositions, methods and devices/systems for treating vascular diseases. More particularly, the invention relates to medical methods, devices and kits for distributing drug to surrounding vascular tissue to treat neointimal growth. More specifically, the described invention is intended to overcome shortcomings of existing treatments for peripheral artery disease (PAD). Devices and methods of the present invention are specifically intended to treat patients with PAD involving the infrapopliteal (tibial) arteries, e.g., patients having a clinical indication for treatment below the knees (e.g., claudication and/or critical limb ischemia (CLI), and patients with complex disease states, for reducing one or more of morbidity; treatment complications in treated patient populations, a reduction in target lesion revascularization (TLR) rates; and a reduction in patients populations requiring any type of leg amputation.

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