Multi-chip package with reduced calibration time and ZQ calibration method thereof

    公开(公告)号:US11217283B2

    公开(公告)日:2022-01-04

    申请号:US17012845

    申请日:2020-09-04

    Abstract: A multi-chip package with reduced calibration time and an impedance control (ZQ) calibration method thereof are provided. A master chip of the multi-chip package performs a first ZQ calibration operation by using a ZQ resistor, and then, the other slave chips simultaneously perform second ZQ calibration operations with respect to data input/output (DQ) pads of the slave chips by using a termination resistance value of a DQ pad of the master chip on the basis of a one-to-one correspondence relationship with the DQ pad of the master chip. The multi-chip package completes ZQ calibration by performing two ZQ calibration operations, thereby decreasing a ZQ calibration time.

    INTERFACE CHIP USED TO SELECT MEMORY CHIP AND STORAGE DEVICE INCLUDING INTERFACE CHIP AND MEMORY CHIP

    公开(公告)号:US20200167298A1

    公开(公告)日:2020-05-28

    申请号:US16425105

    申请日:2019-05-29

    Abstract: An interface chip includes a command decoder configured to decode a command included in data input/output signals based on a clock signal, clock masking circuitry configured to generate a masking clock signal including an edge corresponding to a first edge among first to n-th edges of the clock signal (n being an integer of 2 or more), clock latency circuity configured to transmit, to an external chip, a latency clock signal including edges corresponding to the second to n-th edges of the clock signal, chip select circuitry configured to generate a chip select signal based on an address included in the data input/output signals and the masking clock signal, and chip enable control circuitry configured to receive a chip enable signal indicating a channel for the data input/output signals and transmit the chip enable signal to the external chip based on the chip select signal.

    High voltage switch and a nonvolatile memory device including the same
    48.
    发明授权
    High voltage switch and a nonvolatile memory device including the same 有权
    高压开关和包括其的非易失性存储器件

    公开(公告)号:US09147489B2

    公开(公告)日:2015-09-29

    申请号:US14077769

    申请日:2013-11-12

    CPC classification number: G11C16/30 G11C16/0483 G11C16/12

    Abstract: A high voltage switch of a nonvolatile memory device includes a depletion type NMOS transistor configured to switch a second driving voltage in response to an output signal of the high voltage switch; at least one inverter configured to convert a voltage of an input signal of the high voltage switch into a first driving voltage or a ground voltage, wherein the first and second driving voltages are received from an external device; and a PMOS transistor configured to transfer the second driving voltage provided to a first terminal of the PMOS transistor from the depletion type NMOS transistor to a second terminal of the PMOS transistor as the output signal in response to an output of the at least one inverter, wherein the output of the at least one inverter is transferred to a gate terminal of the PMOS transistor.

    Abstract translation: 非易失性存储器件的高电压开关包括耗尽型NMOS晶体管,其配置为响应于高电压开关的输出信号而切换第二驱动电压; 至少一个反相器,被配置为将高压开关的输入信号的电压转换为第一驱动电压或接地电压,其中从外部装置接收第一和第二驱动电压; 以及PMOS晶体管,被配置为响应于所述至少一个反相器的输出,将提供给所述PMOS晶体管的第一端子的所述第二驱动电压从所述耗尽型NMOS晶体管传送到所述PMOS晶体管的第二端子作为所述输出信号, 其中所述至少一个反相器的输出被传送到所述PMOS晶体管的栅极端子。

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