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公开(公告)号：US10859598B1
公开(公告)日：2020-12-08
申请号：US16288060
申请日：2019-02-27
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Karl A. Rinder , Daniel G. Knierim
Abstract: A method for electrically connecting a test and measurement instrument to a via of a printed circuit board, PCB, the method comprising: dispensing a UV-curable conductive adhesive into a back-drilled hole formed in the PCB, the back-drilled hole extending to the via, such that the dispensed adhesive contacts the via; curing the dispensed adhesive by applying a UV light source to the dispensed adhesive; and connecting a test and measurement instrument to the cured adhesive using a conductive member.
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公开(公告)号：US20200256893A1
公开(公告)日：2020-08-13
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US20180372655A1
公开(公告)日：2018-12-27
申请号：US15693371
申请日：2017-08-31
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
IPC: G01N22/00
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US20180131381A1
公开(公告)日：2018-05-10
申请号：US15818702
申请日：2017-11-20
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
CPC classification number: H03M1/121 , G01R13/0236 , G01R13/0272 , G01R19/2506 , H03M1/1215
Abstract: A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal, a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers, and a linear time-periodic filter configured to receive the digitized mixed signal from each of the digitizers and output a time-interleaved signal. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from a sample rate of at least one of the digitizers.
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公开(公告)号：US09559663B2
公开(公告)日：2017-01-31
申请号：US14745711
申请日：2015-06-22
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
CPC classification number: H03H11/265 , H01P9/00 , H03H7/185 , H03H7/345 , H03K5/133 , H03K2005/00045
Abstract: An electronically variable analog delay line including at least one segment with an electronically variable inductance. The at least one segment includes a signal path, a ground return path, and a plurality of switches configured to vary the inductance of the segment.
Abstract translation: 电子可变模拟延迟线，其包括具有电子可变电感的至少一个段。 所述至少一个段包括信号路径，接地返回路径以及被配置为改变所述段的电感的多个开关。
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Patent Agency Ranking
公开(公告)号：US20160373087A1
公开(公告)日：2016-12-22
申请号：US14745711
申请日：2015-06-22
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
CPC classification number: H03H11/265 , H01P9/00 , H03H7/185 , H03H7/345 , H03K5/133 , H03K2005/00045
Abstract: An electronically variable analog delay line including at least one segment with an electronically variable inductance. The at least one segment includes a signal path, a ground return path, and a plurality of switches configured to vary the inductance of the segment.
Abstract translation: 电子可变模拟延迟线，其包括具有电子可变电感的至少一个段。 所述至少一个段包括信号路径，接地返回路径以及被配置为改变所述段的电感的多个开关。
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公开(公告)号：US09194888B2
公开(公告)日：2015-11-24
申请号：US13649303
申请日：2012-10-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。
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公开(公告)号：US20140049328A1
公开(公告)日：2014-02-20
申请号：US13928889
申请日：2013-06-27
Applicant: Tektronix, Inc.
Inventor： Patrick A. Smith , Daniel G. Knierim
IPC: H03K3/03
CPC classification number: H03K3/0315 , H03K3/0322
Abstract: A ring oscillator timer circuit can include a plurality of electrical components arranged in a cascaded combination of delay stages connected in a closed loop chain. The timer circuit can begin oscillation a programmable number of gate delays after receiving a start signal. In some examples, the number of gate delays can be programmed to fractional values. In further examples, the ring oscillator timer circuit can include a counter having an input electrically coupled to an output of a reset component.
Abstract translation: 环形振荡器定时器电路可以包括以连接在闭环链中的延迟级的级联组合布置的多个电气部件。 定时器电路可以在接收到启动信号之后开始振荡可编程的门延迟数量。 在一些示例中，门延迟的数量可以编程为分数值。 在另外的例子中，环形振荡器定时器电路可以包括具有电耦合到复位部件的输出的输入的计数器。
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公开(公告)号：US20240353447A1
公开(公告)日：2024-10-24
申请号：US18645352
申请日：2024-04-24
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Charles Adrian Hwang , Mark A. Norris
IPC: G01R13/02
CPC classification number: G01R13/0218
Abstract: A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die
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公开(公告)号：US20240159824A1
公开(公告)日：2024-05-16
申请号：US18510644
申请日：2023-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Joshua J. O'Brien
IPC: G01R31/28
CPC classification number: G01R31/2884
Abstract: An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
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