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47 条记录 (耗时 0.025 秒)

    Infrared ray clinical thermometer
    44.
    发明授权
    Infrared ray clinical thermometer 有权

    公开(公告)号：US06612735B2

    公开(公告)日：2003-09-02

    申请号：US10157018

    申请日：2002-05-30

    申请人： Shigeru Tomioka ,  Makoto Tabata ,  Hiroyuki Ota

    发明人： Shigeru Tomioka ,  Makoto Tabata ,  Hiroyuki Ota

    IPC分类号： G01K108

    CPC分类号： G01J5/02 ,  G01J5/021 ,  G01J5/026 ,  G01J5/04 ,  G01J5/049

    摘要： An infrared ray clinical thermometer enhanced in fitted probe cover stability is provided with a simple structure. A mechanism for detecting the presence or absence of a fitted probe cover is provided near the root of a probe, and is mainly composed of a slide member as a movable part, a spring as thrusting means for thrusting the slide member, and a switch for making contact with and departing from the slide member. The slide member is movable disposed in a direction nearly perpendicular to the detaching direction of the probe cover, that is, from the inner side to the outer side, and from the outer side to the inner side of the probe.

    Defect analysis memory for memory tester
    45.
    发明授权
    Defect analysis memory for memory tester 失效
    内存测试仪的缺陷分析记忆体

    公开(公告)号：US6154862A

    公开(公告)日：2000-11-28

    申请号：US91931

    申请日：1998-06-24

    申请人： Makoto Tabata ,  Shinya Sato

    发明人： Makoto Tabata ,  Shinya Sato

    IPC分类号： G01R31/28 ,  G01R31/3193 ,  G06F11/22 ,  G11C29/44 ,  G11C29/56 ,  G11C29/00

    CPC分类号： G01R31/31935 ,  G11C29/44 ,  G11C29/56 ,  G06F11/2205

    摘要： In a failure analysis memory for memory testing apparatus which has a failure data storage part composed of a failure data memory and a first memory control part and a mask data storage part composed of a mask data memory and a second memory control part, when the logical comparison result by the testing apparatus is a failure in the test mode, the first memory control part effects control to generate write enable data and write failure data in the failure data memory at the corresponding address and, in the remove mode, effects control to read out failure data from the failure data memory and provide it to the mask data storage part. In the test mode the second memory control part effects control to provide mask data read out of the mask data memory, as an inhibit signal, to a logic comparator of the memory testing apparatus to inhibit it from making a logical comparison and, in the remove mode, the second memory control part effects control to generate a write enable signal from the failure data read out of the failure data memory and apply it to the mask data memory to write therein mask data at the corresponding address.

    摘要翻译： PCT No.PCT / JP97 / 03928 Sec。 371日期：1998年6月24日 102（e）1998年6月24日PCT 1997年10月29日PCT公布。 公开号WO98 / 20498 日期：1998年5月14日在具有由故障数据存储器和第一存储器控制部分构成的故障数据存储部分和由掩模数据存储器和第二存储器控制部分组成的掩模数据存储部分的存储器测试装置的故障分析存储器中 当测试装置的逻辑比较结果是测试模式失败时，第一存储器控制部分进行控制以在相应地址的故障数据存储器中产生写入使能数据和写入故障数据，并且在移除模式下， 影响控制以从故障数据存储器读出故障数据并将其提供给掩码数据存储部分。 在测试模式中，第二存储器控制部分进行控制，以将掩模数据存储器读出的掩模数据作为禁止信号提供给存储器测试装置的逻辑比较器，以阻止其进行逻辑比较，并且在去除 模式，第二存储器控制部分进行控制以从故障数据存储器读出的故障数据产生写使能信号，并将其应用于掩模数据存储器，以在其中写入相应地址处的掩模数据。

    Automatic lapping apparatus for piezoelectric materials
    47.
    发明授权
    Automatic lapping apparatus for piezoelectric materials 失效
    压电材料自动研磨装置

    公开(公告)号：US5136817A

    公开(公告)日：1992-08-11

    申请号：US662444

    申请日：1991-02-28

    申请人： Makoto Tabata ,  Hiroshi Takezawa

    发明人： Makoto Tabata ,  Hiroshi Takezawa

    IPC分类号： B24B37/013 ,  B24B49/04

    CPC分类号： B24B37/013 ,  B24B49/04

    摘要： An automatic lapping apparatus for lapping a piezoelectric material has upper and lower lapping plates, and a carrier disposed between the plates, for holding a piezoelectric material so that it is sandwiched between the plates. The carrier is rotatable to lap the piezoelectric material parallel to the lapping surfaces of the plates while supplying a lapping slurry therebetween. The apparatus also includes a sweep oscillator for applying a sweep signal corresponding to the count of a counter, through an AGC amplifier and a resistor to an electrode supported by one of the plates, a comparing circuit for determining whether the quartz crystal wafer is present underneath the electrode based on the level of the sweep signal applied to the electrode, a memory for storing output data from the comparing circuit at an address corresponding to the count, a dip detector for detecting a dip in the signal applied to the electrode and stopping operation of the counter, a frequency detector for reading the frequency from the sweep oscillator when the dip is detected and the presence of the piezoelectric material underneath the electrode is detected, a frequency determining circuit for determining whether the read frequency is a true resonant frequency of the quartz crystal wafer, a frequency comparator for determining that lapping is completed when the true resonant frequency falls within a predetermined target frequency, and an drive unit control circuit for stopping the carrier when the lapping is completed.

    摘要翻译： 用于研磨压电材料的自动研磨装置具有上下研磨板和设置在板之间的载体，用于保持压电材料以使其夹在板之间。 载体可旋转，以在平行于板的研磨表面的同时搭接压电材料，同时在其间提供研磨浆料。 该装置还包括扫频振荡器，用于通过AGC放大器和电阻器将对应于计数器的计数的扫描信号施加到由一个板支撑的电极，用于确定石英晶片是否存在于下面的比较电路 基于施加到电极的扫描信号的电平的电极，用于在对应于计数的地址存储来自比较电路的输出数据的存储器，用于检测施加到电极的信号的下降的停止检测器和停止操作 所述频率检测器，当检测到所述浸渍时，从所述扫描振荡器读取频率，并且检测到所述电极下方的所述压电材料的存在;频率确定电路，用于确定所述读取频率是否为真实谐振频率 石英晶体晶片，用于确定正确谐振频率时完成研磨的频率比较器 cy落在预定目标频率内，以及驱动单元控制电路，用于在研磨完成时停止载体。