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    MICROARRAY IMAGING SYSTEM AND ASSOCIATED METHODOLOGY
    41.
    发明申请
    MICROARRAY IMAGING SYSTEM AND ASSOCIATED METHODOLOGY 失效
    微型成像系统及相关方法

    公开(公告)号：US20070263914A1

    公开(公告)日：2007-11-15

    申请号：US11684484

    申请日：2007-03-09

    Applicant: Clark Tibbetts

    Inventor： Clark Tibbetts

    IPC: G06K9/00

    CPC classification number: G01J3/02 ,  G01J3/0229 ,  G01J3/10 ,  G01J3/2846 ,  G01N21/6428 ,  G01N21/6452 ,  G01N21/6456 ,  G01N2201/0626 ,  G01N2201/0631

    Abstract: An apparatus and method are provided for creating an image of a microarray. The apparatus includes at least one light source configured to direct light toward the microarray. The apparatus includes an excitation filter configured to filter the light into a first frequency band towards dichromatic mirror. The dichromatic mirror reflects light onto the microarray causing the microarray to emit electromagnetic energy. The apparatus includes emission filter configured to filter the electromagnetic energy within a second frequency band. The apparatus further includes an imaging unit having a charged coupled device (CCD), the CCD having an imaging surface masked by a pinhole blind such that when the pinhole blind receives electromagnetic energy from the emission filter, an image is created of the entire micro array.

    Abstract translation: 提供了一种用于创建微阵列图像的装置和方法。 该装置包括被配置为将光引向微阵列的至少一个光源。 该装置包括被配置为将光过滤到朝向二色镜的第一频带的激励滤波器。 二色镜将光反射到微阵列上，导致微阵列发射电磁能。 该装置包括被配置为过滤第二频带内的电磁能的发射滤波器。 该装置还包括具有电荷耦合器件（CCD）的成像单元，该CCD具有被针孔掩蔽的成像表面，使得当针孔盲孔从发射滤光片接收电磁能时，产生整个微阵列的图像 。

    Container inspection machine
    42.
    发明授权
    Container inspection machine 失效
    集装箱检验机

    公开(公告)号：US06943877B2

    公开(公告)日：2005-09-13

    申请号：US10610059

    申请日：2003-06-30

    Applicant: Richard D. Diehr ,  Henry F. Raupp

    Inventor： Richard D. Diehr ,  Henry F. Raupp

    IPC: G01B11/30 ,  B07C5/34 ,  B07C5/342 ,  G01N21/84 ,  G01N21/90 ,  G01N21/00

    CPC classification number: B07C5/3422 ,  B07C5/3408 ,  G01N21/90 ,  G01N21/9009 ,  G01N2021/8411 ,  G01N2021/845 ,  G01N2021/8841 ,  G01N2201/0626

    Abstract: A machine for inspecting a container which is being conveyed along a linear path. The machine has spaced left hand and right hand cabinets in front of the linear path with the space therebetween being space in which an operator can stand to be proximate to the linear path. The machine has left hand and right hand inspection stations which include a left-hand assembly located in front of the linear path and a right hand assembly located in front of the linear path. These assemblies are pivotally mounted about vertical axes so that they can be pivoted from a closed position proximate the liner path to a retracted position away from the linear path. At the retracted position an operator can enter the machine and service the inspection stations.

    Abstract translation: 一种用于检查沿着线性路径传送的容器的机器。 机器在线性路径前面具有间隔开的左手和右手柜，其间的空间是操作者能够靠近线性路径的空间。 机器具有左侧和右侧检查站，其包括位于线性路径前方的左侧组件和位于线性路径前方的右侧组件。 这些组件围绕垂直轴线枢转地安装，使得它们可以从靠近衬套路径的关闭位置枢转到远离线性路径的缩回位置。 在缩回位置，操作员可以进入机器并对检查站进行维修。

    Container inspection machine
    43.
    发明申请
    Container inspection machine 失效
    集装箱检验机

    公开(公告)号：US20040262508A1

    公开(公告)日：2004-12-30

    申请号：US10610060

    申请日：2003-06-30

    Inventor： Henry F. Raupp

    IPC: H01J005/02

    CPC classification number: E05D7/12 ,  B07C5/3408 ,  B07C5/3422 ,  E05Y2900/132 ,  G01N21/90 ,  G01N21/9009 ,  G01N2021/8411 ,  G01N2021/845 ,  G01N2021/8841 ,  G01N2201/0626

    Abstract: A machine for inspecting a container which is being conveyed along a linear path. The machine has cabinets situated in front of the conveyor path at either side of a central open area in front of the conveyor path which is to be used by an operator for servicing the conveyor. The interior sides of these cabinets are open for access to electronics and the central opening is closed by a pair of doors which are releasably attached to the sides of the cabinets and can be push in to provide access to the central area and can be pulled from the cabinets to provide access to electronics through the open sides of the cabinets.

    Abstract translation: 一种用于检查沿着线性路径传送的容器的机器。 该机器具有位于输送机路径前方的机柜，该输送机路径位于传送路径前面的中央开口区域的任一侧，该操作面由操作者用于维修输送机。 这些机柜的内部侧面是敞开的，用于进入电子​​设备，中央开口被一对门关闭，门被可释放地连接到机柜的侧面，并且可以被推入以提供通向中心区域的通道，并且可以从 机柜通过机柜的开放侧面提供对电子设备的访问。

    Method and apparatus for adjusting illumination angle
    44.
    发明授权
    Method and apparatus for adjusting illumination angle 有权
    调整照明角度的方法和装置

    公开(公告)号：US06788411B1

    公开(公告)日：2004-09-07

    申请号：US09612763

    申请日：2000-07-10

    Applicant: Gary A. Lebens

    Inventor： Gary A. Lebens

    IPC: G01B1100

    CPC classification number: G01N21/21 ,  G01N21/8806 ,  G01N21/95684 ,  G01N2021/8825 ,  G01N2021/8835 ,  G01N2021/8848 ,  G01N2201/062 ,  G01N2201/0626

    Abstract: In a machine-vision system for inspecting a part or either object, the invention provides a method and apparatus providing illumination with high-speed changing and/or automatic adjustment of not only the illumination's angle, but also the dispersion, intensity, and/or color. Optionally, a light source emits polarized light, a machine-vision imager obtains an image, and a processor receives the image and generates a quality parameter based on the image. One or more of the various means described selectively direct the light in a predetermined pattern based on its polarization and based on the quality parameter of the image. A machine-vision method includes setting one or more illumination parameters, illuminating the object based on the one or more illumination parameters, obtaining an image of the illuminated object, generating a quality parameter based on an image quality of a predetermined region of interest in the image, and iterating using a different illumination parameter.

    Abstract translation: 在用于检查零件或任一物体的机器视觉系统中，本发明提供了一种方法和装置，其提供不仅对照明的角度进行高速变化和/或自动调节的照明，而且还提供了分散，强度和/或 颜色。 可选地，光源发射偏振光，机器视觉成像器获得图像，并且处理器接收图像并基于图像生成质量参数。 所描述的各种装置中的一种或多种选择性地基于其极化并基于图像的质量参数将光指向预定图案。 机器视觉方法包括设置一个或多个照明参数，基于一个或多个照明参数照亮对象，获得被照明物体的图像，基于所述照射对象中的预定感兴趣区域的图像质量生成质量参数 图像，并使用不同的照明参数进行迭代。

    Multiwavelength transilluminator for absorbance and fluorescence detection using light emitting diodes
    45.
    发明申请
    Multiwavelength transilluminator for absorbance and fluorescence detection using light emitting diodes 审中-公开
    多波长透射仪用于使用发光二极管进行吸光度和荧光检测

    公开(公告)号：US20030230728A1

    公开(公告)日：2003-12-18

    申请号：US10460580

    申请日：2003-06-11

    Inventor： Zhengshan Dai ,  Xue-Feng Wang ,  Richard Sheridan

    IPC: G01N021/64

    CPC classification number: G01N21/6452 ,  G01N21/253 ,  G01N21/31 ,  G01N21/6456 ,  G01N2201/0626 ,  G01N2201/0627

    Abstract: Systems, devices and methods are provided for viewing a pattern of biological material stained with dyes capable of absorbing, scattering or fluorescing light when illuminated by light emitting diodes (LEDs). The system includes a light source containing multiple light source arrays of different LED types emitting light at different wavelengths optimized for detecting specific dyes, a diffuser, a detector or viewer, and optional optical filters to ensure that the only light reaching the detector or viewer is light produced by fluorescence of the various dyes within a specific wavelength band. The optical filters are optional for detecting or viewing absorbance and light scatter. The different arrays of LED types can be selected in any combination during illumination and their intensity is adjustable over a range from 0-100%. A system and method is also provided for comparing patterns for two or more dyes contained in a single material.

    Abstract translation: 提供了系统，装置和方法，用于观察用能够在被发光二极管（LED）照射时吸收，散射或发出荧光的染料染色的生物材料的图案。 该系统包括光源，其包含不同LED类型的多个光源阵列，其发射针对特定染料，扩散器，检测器或观察器优化的不同波长的光，以及可选的光学滤光器，以确保到达检测器或观察者的唯一光是 由特定波长带内的各种染料的荧光产生的光。 光学滤光片是可选的，用于检测或观察吸光度和光散射。 可以在照明期间以任何组合选择不同的LED类型，并且其强度可在0-100％的范围内调节。 还提供了用于比较包含在单一材料中的两种或多种染料的图案的系统和方法。

    Machine vision
    46.
    发明申请
    Machine vision 失效
    机器视觉

    公开(公告)号：US20020114505A1

    公开(公告)日：2002-08-22

    申请号：US10120382

    申请日：2002-04-12

    Inventor： James Mahon ,  Niall Burke ,  Adrian Boyle ,  Karl Stanley ,  Brian Farrell ,  Peter Conlon

    IPC: G06K009/00

    CPC classification number: G01N21/95684 ,  G01N21/8806 ,  G01N2201/0626

    Abstract: An illumination head (1) for machine vision has an annular support (2) with first, second, third, and fourth illumination sections (3, 4, 5, and 6). The third section (5) has three sets of LEDs (12, 13, 14) arranged in a pattern so that each set illuminates at approximately the same angle. Each set is driven in succession so that a series of three monochrome images at the same angle are captured. These are superimposed by an image processor to provide a color image, although the camera is monochrome. More information can be obtained in such a color image and the high resolution and robustness of monochrome cameras is availed of.

    Abstract translation: 用于机器视觉的照明头（1）具有带有第一，第二，第三和第四照明部分（3,4,5和6）的环形支撑件（2）。 第三部分（5）具有三组LED（12,13,14），它们以一种图案排列，使得每组LED以大致相同的角度照亮。 每组被连续驱动，从而捕获相同角度的一系列三个单色图像。 这些是由图像处理器叠加以提供彩色图像，尽管相机是单色的。 可以在这样的彩色图像中获得更多的信息，并且利用单色相机的高分辨率和鲁棒性。

    ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME
    48.
    发明申请
    ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME 审中-公开

    公开(公告)号：US20180017486A1

    公开(公告)日：2018-01-18

    申请号：US15430916

    申请日：2017-02-13

    Applicant: Jang-Il SER

    Inventor： Jang-Il SER

    IPC: G01N21/47

    CPC classification number: G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N2021/4716 ,  G01N2021/4733 ,  G01N2021/556 ,  G01N2201/0626 ,  G01N2201/0634 ,  G01N2201/0638 ,  G01N2201/0655

    Abstract: An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.

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