Monitoring circuit and method
    53.
    发明授权

    公开(公告)号:US10664031B2

    公开(公告)日:2020-05-26

    申请号:US15361405

    申请日:2016-11-26

    Applicant: ARM Limited

    Abstract: Broadly speaking, embodiments of the present techniques provide a voltage monitoring circuit for low power minimum-energy sensor nodes. The circuit comprises sensing circuitry to sense a monitored signal having a plurality of operating signal states; a first comparator having a first input for receiving an upper threshold signal; and a second comparator having a first input for receiving a lower threshold signal, the upper and lower threshold signals defining a range which includes at least one signal state of the plurality of operating states of the monitored signal, wherein the first and second comparators have a bias input for receiving a bias configuration setting, the bias configuration setting being selectable according to an operating signal state of the monitored signal.

    Comparison of a Voltage Signal to a Reference

    公开(公告)号:US20200089266A1

    公开(公告)日:2020-03-19

    申请号:US16130938

    申请日:2018-09-13

    Applicant: Arm Limited

    Abstract: Briefly, embodiments of claimed subject matter relate to comparison of a signal amplitude, such as a signal originating from a battery, for example, with a reference signal. A reference signal may be generated via body-biasing of one or more transistors, for example, which permit operation of the one or more transistors in a sub-threshold state, in which current through the one or more transistors comprises an exponential relationship to an applied voltage. Thus, at least in particular embodiments, detection of low battery voltage or battery overvoltage may be performed utilizing only a very small amount of electrical power

    Periphery body biasing for memory applications

    公开(公告)号:US10586790B2

    公开(公告)日:2020-03-10

    申请号:US15942132

    申请日:2018-03-30

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to an integrated circuit having a core array region with an array of memory devices. The integrated circuit may include a periphery region having periphery logic devices that interface with the array of memory devices. The integrated circuit may include a boundary region having one or more buffer devices coupled to body terminals of the periphery logic devices to drive the body terminals of the periphery logic devices using a body biasing signal provided by the one or more buffer devices.

    Smart surface covering and structure having remotely interrogatable antenna node array for remote integrity checking

    公开(公告)号:US10303906B1

    公开(公告)日:2019-05-28

    申请号:US15825467

    申请日:2017-11-29

    Applicant: Arm Limited

    Abstract: A method, system and surface covering for enabling wireless detection of damage to a structure is disclosed. At least one array having a plurality of nodes are coupled to a surface covering, such as at least one of a wall, ceiling and floor covering for a least a portion of the structure. An electronic reader is operable to wirelessly interrogate the array and read return signals from nodes in the array. The return signals contain data representing an ID for corresponding responsive nodes in the array, and the returned IDs are extracted and compared to a plurality of IDs stored in a data store for nodes in any given array. A mismatch between the returned and stored IDs for the nodes in the array indicates a structural defect in a respective portion of the structure overlaid by the floor/wall covering.

    Brown-out detector
    58.
    发明授权

    公开(公告)号:US10191527B2

    公开(公告)日:2019-01-29

    申请号:US14712614

    申请日:2015-05-14

    Applicant: ARM Limited

    Abstract: Various implementations described herein are directed to an integrated circuit for brown-out detection. The integrated circuit may include a first stage configured to receive an input voltage and provide a first voltage independent of temperature while remaining related to the input voltage. The integrated circuit may include a second stage configured to receive the input voltage, receive the first voltage from the first stage, and up-convert the first voltage as input voltage lowers. The second stage may be configured to provide a second voltage corresponding to a differential voltage of the input voltage and the first voltage. The integrated circuit may include a third stage configured to receive the second voltage and provide a high-gain output voltage corresponding to an error signal.

    Flip-Flop
    59.
    发明申请
    Flip-Flop 审中-公开

    公开(公告)号:US20180278244A1

    公开(公告)日:2018-09-27

    申请号:US15990538

    申请日:2018-05-25

    CPC classification number: H03K3/35625 H03K19/20

    Abstract: A single-phase flip-flop comprising: a master latch comprising: a first circuit to generate a master latch signal in response to a first master logic operation on a flip flop input signal and a first clock signal, and a second circuit to generate a master output signal in response to a second master logic operation on the first clock signal and master latch signal; a slave latch comprising: a third circuit to generate a slave output signal in response to a first slave logic operation on the first clock signal and one of the master output signal and an inverted slave output signal; and wherein the master latch is configured to capture the flip-flop input signal during a first portion of the first clock signal and the slave latch is configured to capture the master output signal during a second portion of the first clock signal.

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