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公开(公告)号:US20240386864A1
公开(公告)日:2024-11-21
申请号:US18788302
申请日:2024-07-30
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Lizhong WANG , Guangcai YUAN , Ce NING , Hehe HU , Nianqi YAO , Xin XIE , Yifang HUANG , Liping LEI , Chen XU
IPC: G09G3/36
Abstract: A display substrate and a display panel are provided, the display substrate includes a first gate driver circuit and a second gate driver circuit that are respectively arranged on a first side and a second side of a display region opposite to each other; the first gate driver circuit includes a plurality of first shift register units arranged in a first direction, each first shift register unit includes a first thin film transistor including a first active layer, the first active layer includes a metal oxide semiconductor material; the second gate driver circuit includes a plurality of second shift register units arranged in the first direction, each second shift register unit includes a second thin film transistor having the same function as the first thin film transistor, and the second thin film transistor includes a second active layer, the second active layer includes a metal oxide semiconductor material.
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公开(公告)号:US20240332425A1
公开(公告)日:2024-10-03
申请号:US18028009
申请日:2022-03-30
Applicant: BOE Technology Group Co., Ltd.
Inventor: Jiayu HE , Fangqing WEN , Ce NING , Hehe HU , Nianqi YAO , Kun ZHAO , Zhengliang LI , Jie HUANG , Feifei LI , Yan QU , Liping LEI
IPC: H01L29/786 , H01L25/07
CPC classification number: H01L29/7869 , H01L25/074
Abstract: The present disclosure provides a metal oxide thin film transistor, a semiconductor device and a display device, belongs to the field of display technology, and can solve a problem that current metal oxide thin film transistors have a poor stability. The metal oxide thin film transistor of the present disclosure includes a substrate and a first metal oxide semiconductor layer on the substrate; a material of the first metal oxide semiconductor layer includes a metal oxide doped with a first metal element, an electronegativity difference value between the first metal element and an oxygen element is greater than or equal to an electronegativity difference value between a metal element in the metal oxide and the oxygen element.
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公开(公告)号:US20240304698A1
公开(公告)日:2024-09-12
申请号:US18028114
申请日:2022-03-30
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Jiayu HE , Yan QU , Liping LEI , Ce NING , Zhengliang LI , Hehe HU , Jie HUANG , Nianqi YAO , Kun ZHAO , Feifei LI
IPC: H01L29/49 , G02F1/1368 , H01L27/12 , H01L29/786
CPC classification number: H01L29/4908 , G02F1/1368 , H01L27/1225 , H01L29/7869 , H01L29/78696
Abstract: There is provided a metal oxide thin film transistor, including: a substrate and a metal oxide semiconductor layer on the substrate; a gate and a gate insulating layer between the substrate and the metal oxide semiconductor layer; the gate insulating layer includes a first silicon nitride layer, a second silicon nitride layer and a first silicon oxide layer which are stacked; the first silicon oxide layer is in contact with the metal oxide semiconductor layer, and two surfaces of the second silicon nitride layer are in contact with the first silicon nitride layer and the first silicon oxide layer, respectively; a content of hydrogen atoms of at least a partial region of the second silicon nitride layer is less than 30% of a content of hydrogen atoms of at least a partial region of the first silicon nitride layer. An array substrate and a display device are further provided.
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54.
公开(公告)号:US20240297255A1
公开(公告)日:2024-09-05
申请号:US17919301
申请日:2021-11-29
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Jie HUANG , Ce NING , Zhengliang LI , Hehe HU , Jiayu HE , Nianqi YAO , Kun ZHAO , Feifei LI , Liping LEI
IPC: H01L29/786 , H01L27/12 , H01L29/66
CPC classification number: H01L29/7869 , H01L27/1225 , H01L29/66969
Abstract: The present disclosure provides a thin film transistor, a method for manufacturing the thin film transistor, an array substrate and a display panel. The thin film transistor includes: a substrate; and a gate electrode, a gate insulating layer, an active layer, a source electrode and a drain electrode on the substrate, wherein the active layer includes a first semiconductor layer and a second semiconductor layer sequentially arranged in a direction perpendicular to the substrate, the second semiconductor layer is arranged on a side of the first semiconductor layer away from the gate electrode; an absolute value of a difference between conduction band minimums of a first oxide material and a second oxide material is greater than 0.2 eV.
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公开(公告)号:US20240250178A1
公开(公告)日:2024-07-25
申请号:US18017649
申请日:2022-02-17
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Jiayu HE , Kun ZHAO , Yan QU , Liping LEI , Ce NING , Zhengliang LI , Hehe HU
IPC: H01L29/786 , H01L27/12
CPC classification number: H01L29/7869 , H01L27/1225
Abstract: The present disclosure provides a metal oxide thin film transistor, an array substrate and a display device. A metal oxide thin film transistor in the present disclosure includes: a substrate, a first metal oxide semiconductor layer on the substrate, and a second metal oxide semiconductor layer on a side of the first metal oxide semiconductor layer away from the substrate; a carrier mobility of the first metal oxide semiconductor layer is higher than that of the second metal oxide semiconductor layer; a material of the first metal oxide semiconductor layer includes: a first metal oxide doped with a rear earth element; a difference between an electronegativity of the rare earth element and an electronegativity of oxygen element is greater than or equal to a difference between an electronegativity of a metal element in the first metal oxide and the electronegativity of oxygen element.
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公开(公告)号:US20240221851A1
公开(公告)日:2024-07-04
申请号:US17996293
申请日:2021-11-30
Applicant: BOE Technology Group Co., Ltd.
Inventor: Yunsik IM , Shunhang ZHANG , Fuqiang LI , Changfeng LI , Liwei LIU , Hehe HU , Ce NING , Hui ZHANG , Hongrun WANG , Zhuo LI
CPC classification number: G11C19/28 , G09G3/20 , G09G2310/0267 , G09G2310/0286
Abstract: The present disclosure provides a shift register unit, a gate driving circuit and a display device. The shift register unit provided by the present disclosure includes: an input sub-circuit, an output sub-circuit, at least one pull-down control sub-circuit, at least one pull-down sub-circuit, at least one first noise reduction sub-circuit, and a reverse bias sub-circuit; the reverse bias sub-circuit is configured to control transistors in at least part of sub-circuits connected to a pull-up node to be in a reverse bias state through a power voltage signal in response to a potential of the pull-up node, or control the transistors in at least part of the sub-circuits connected to the pull-up node to be in the reverse bias state through a cascade signal in response to a potential of a cascade signal terminal.
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公开(公告)号:US20240215332A1
公开(公告)日:2024-06-27
申请号:US17908224
申请日:2021-11-04
Applicant: BOE Technology Group Co., Ltd.
Inventor: Jiayu HE , Ce NING , Zhengliang LI , Hehe HU , Fengjuan LIU , Wei LIU , Tianmin ZHOU , Kun ZHAO
IPC: H10K59/124 , H10K39/34 , H10K59/12
CPC classification number: H10K59/124 , H10K39/34 , H10K59/1201
Abstract: The present disclosure provides a display substrate and a preparation method thereof, and a display apparatus. The display substrate includes a circuit layer disposed on a base substrate, an emitting structure layer and a photoelectric structure layer disposed on a side of the circuit layer away from the base substrate, the circuit layer includes at least one impurity absorption layer and at least one transistor, the transistor includes an active layer, and at least one insulation layer is provided between the impurity absorption layer and the active layer; an atomic ratio of a silicon element to a nitrogen element in the impurity absorption layer is 1:5 to 1:35.
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公开(公告)号:US20230299208A1
公开(公告)日:2023-09-21
申请号:US18322981
申请日:2023-05-24
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Lizhong WANG , Tianmin ZHOU , Hehe HU , Xiaochun XU , Nianqi YAO , Dapeng XUE , Shuilang DONG
IPC: H01L29/786 , H01L27/12 , H01L29/66
CPC classification number: H01L29/7869 , H01L27/1225 , H01L29/66969 , H01L27/127
Abstract: An oxide thin film transistor includes: a gate electrode, a metal oxide active layer and a source-drain metal layer, which are on a base substrate. The metal oxide active layer includes a first metal oxide layer and a second metal oxide layer stacked on the first metal oxide layer in a direction away from the base substrate; the first metal oxide layer is a carrier transport layer; the second metal oxide layer is a carrier isolation layer; an electron transfer rate of the carrier transport layer is greater than an electron transfer rate of the carrier isolation layer. The first metal oxide layer includes a primary surface facing toward the base substrate and a primary surface away from the base substrate; the first metal oxide layer further includes a lateral surface around the primary surfaces; the second metal oxide layer covers the lateral surface of the first metal oxide layer.
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59.
公开(公告)号:US20220223745A1
公开(公告)日:2022-07-14
申请号:US17761549
申请日:2021-05-18
Applicant: BOE Technology Group Co., Ltd.
Inventor: Jiayu HE , Ce NING , Zhengliang LI , Hehe HU , Jie HUANG , Nianqi YAO , Zhi WANG , Feng GUAN
IPC: H01L29/786 , H01L29/417 , H01L29/06 , H01L29/66
Abstract: A thin film transistor, a manufacturing method thereof, a display substrate, and a display device are provided. The thin film transistor includes: a substrate, an active layer, a gate, a source and a drain. The active layer is arranged on the substrate and formed as a grid, including silicon nanowires extending along a first direction, the active layer includes source and drain regions oppositely arranged along the first direction, and a channel region located therebetween. The gate is arranged on the substrate, and an orthographic projection of the gate onto the substrate overlaps with orthographic projections for silicon nanowires in the channel region onto the substrate. The source and drain are arranged on the substrate, the source contacts silicon nanowires in the source region, and the drain contacts silicon nanowires in the drain region.
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60.
公开(公告)号:US20210210516A1
公开(公告)日:2021-07-08
申请号:US16074282
申请日:2018-01-19
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Ke WANG , Hehe HU , Xinhong LU
IPC: H01L27/12
Abstract: A thin film transistor and a method for fabricating the same, an array substrate and a display device are provided. The thin film transistor includes an active layer and a protective layer being provided on and in direct contact with the active layer, the protective layer is provided corresponding to a channel region of the thin film transistor; the protective layer is made of an oxygen-enriched metallic oxide insulation material which will not introduce any new element into the active layer. In the thin film transistor and the method for fabricating the same, the array substrate and the display device provided by the present disclosure, the active layer can be protected from being damaged by the etchant for forming the source/drain, and no new element will be introduced into the active layer; thus the characteristics and the stability of the thin film transistor is improved.
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