Distributive Cache Accessing Device and Method for Accelerating to Boot Remote Diskless Computers
    52.
    发明申请
    Distributive Cache Accessing Device and Method for Accelerating to Boot Remote Diskless Computers 失效
    分布式缓存访问设备和加速启动远程无盘计算机的方法

    公开(公告)号:US20110258424A1

    公开(公告)日:2011-10-20

    申请号:US12759745

    申请日:2010-04-14

    摘要: A distributive cache accessing device for accelerating to boot remote diskless computers mounted in a diskless computer equipped with WAN-bootable hardware, such as an iSCSI host bus adapter (HBA), allows to access data required to boot the diskless computers or run application programs thereon from an iSCSI target or other diskless computers having the distributive cache accessing device via a network. The retrieved iSCSI data blocks are temporarily stored in the local distributive cache accessing device. If any other diskless computer requests for the iSCSI data blocks, the temporarily stored iSCSI data blocks can be accessible to the diskless computer. Given installation of large number of diskless computers, the network traffic of the iSCSI target is alleviated and booting remote diskless computer is accelerated.

    摘要翻译: 一种用于加速启动安装在具有WAN可引导硬件(例如iSCSI主机总线适配器(HBA))的无盘计算机中的远程无盘计算机的分布式缓存访问设备允许访问引导无盘计算机或在其上运行应用程序所需的数据 从具有经由网络的分配缓存访问设备的iSCSI目标或其他无盘计算机。 检索到的iSCSI数据块临时存储在本地分布式缓存访问设备中。 如果任何其他无盘计算机请求iSCSI数据块,则无盘计算机可以访问临时存储的iSCSI数据块。 考虑到安装大量无盘计算机,iSCSI目标的网络流量得到缓解,引导远程无盘计算机加速。

    CENTRALIZED MBIST FAILURE INFORMATION
    53.
    发明申请
    CENTRALIZED MBIST FAILURE INFORMATION 有权
    集中MBIST失败信息

    公开(公告)号:US20110055644A1

    公开(公告)日:2011-03-03

    申请号:US12549164

    申请日:2009-08-27

    IPC分类号: G11C29/12 G06F11/27

    摘要: Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.

    摘要翻译: 在集成电路中的阵列自检期间收集的故障和修复信息存储在集成电路中的集中式阵列中。 以这种方式,可以读取集中式阵列,以提供集成电路中阵列的故障和修复信息,而不必从每个阵列读取。 此外,故障和修复信息也可能存储在被测阵列中的某些阵列中。

    INPUT DEVICE MODEL TESTING SYSTEM
    54.
    发明申请
    INPUT DEVICE MODEL TESTING SYSTEM 审中-公开
    输入设备模型测试系统

    公开(公告)号:US20110050572A1

    公开(公告)日:2011-03-03

    申请号:US12617296

    申请日:2009-11-12

    IPC分类号: G06F3/033 G06F3/02

    CPC分类号: G06F3/0425 G06F3/03

    摘要: An input device model testing system is provided for testing an input device model that is placed on a working plane. The input device model testing system includes image pickup devices for capturing the input device model and the working plane, a microphone for receiving the clicking sound of the input device model, a computer screen for displaying the working plane image, and a computer host. The computer host includes a model image analyzing program and a working plane image analyzing program. The working plane image and the model image are respectively analyzed by the model image analyzing program and the working plane image analyzing program, so that associated user input instructions are executed.

    摘要翻译: 提供输入设备型号测试系统,用于测试放置在工作平面上的输入设备模型。 输入设备型号测试系统包括用于捕获输入设备型号和工作平面的图像拾取设备,用于接收输入设备型号的咔嗒声的麦克风,用于显示工作平面图像的计算机屏幕和计算机主机。 计算机主机包括模型图像分析程序和工作平面图像分析程序。 通过模型图像分析程序和工作平面图像分析程序分别分析工作平面图像和模型图像,从而执行相关联的用户输入指令。

    Automatic function call in multithreaded application
    55.
    发明申请
    Automatic function call in multithreaded application 有权
    在多线程应用程序中自动调用函数

    公开(公告)号:US20080120590A1

    公开(公告)日:2008-05-22

    申请号:US11603375

    申请日:2006-11-22

    IPC分类号: G06F9/44

    CPC分类号: G06F9/466 G06F8/41

    摘要: In general, in one aspect, the disclosure describes a method to detect a transaction and direct non transactional memory (TM) user functions within the transaction. The non TM user functions are treated as TM functions and added to the TM list.

    摘要翻译: 通常,在一个方面,本公开描述了一种检测事务中的交易和直接非事务性存储器(TM)用户功能的方法。 非TM用户功能被视为TM功能并添加到TM列表中。

    3D VISUAL INTELLIGENT SIMULATION MONITORING SYSTEM AND SIMULATION DISPLAY METHOD THEREOF

    公开(公告)号:US20200169714A1

    公开(公告)日:2020-05-28

    申请号:US16199482

    申请日:2018-11-26

    摘要: The present invention provides a 3D visual intelligent simulation monitoring system and a simulation display method thereof, comprising a plurality of monitoring devices and at least one central control device. The monitoring devices capture video screens and generate a plurality of image signals to the central control device. A signal receiving unit of the central control device receives the image signals of the monitoring devices and transmits to an operational simulation unit, and the operational simulation unit operates the image signals with a location data and a geographic data incorporatively and generates at least one 3D simulation image. Thereby monitoring personnel can directly monitor with the 3D simulation image of the central control device, thus achieving comprehensive viewing and perfect monitoring, and functions of responding and manipulating at the first instant through the central control device.

    Image capturing lens system
    58.
    发明授权
    Image capturing lens system 有权
    摄像镜头系统

    公开(公告)号:US08879169B2

    公开(公告)日:2014-11-04

    申请号:US13546481

    申请日:2012-07-11

    IPC分类号: G02B13/18 G02B9/12 G02B9/04

    CPC分类号: G02B13/0035

    摘要: This invention provides an image capturing lens system comprising three non-cemented lens elements with refractive power: a first lens element with positive refractive power having a convex object-side surface, and both the object-side and image-side surfaces being aspheric; a plastic second lens element with negative refractive power having a concave object-side surface and a convex image-side surface, and both the object-side and image-side surfaces being aspheric; and a plastic third lens element having a convex object-side surface and a concave image-side surface, and both the object-side and image-side surfaces being aspheric. By such arrangement, the space of the image capturing lens system can be allocated much more properly and thereby an image capturing lens system with shorter total track length can be obtained while retaining superior image quality.

    摘要翻译: 本发明提供了一种摄影镜头系统,包括具有屈光力的三个非胶合透镜元件:具有凸起物体侧表面的具有正折光力的第一透镜元件,并且物体侧和像侧表面均为非球面; 具有负折射力的塑料第二透镜元件,具有凹面物侧表面和凸像侧表面,物侧和像侧表面均为非球面; 以及具有凸形物侧表面和凹形图像侧表面的塑料第三透镜元件,并且物体侧和像侧表面都是非球面的。 通过这样的配置,可以更正确地分配图像拍摄透镜系统的空间,从而可以获得具有较短总轨道长度的图像拍摄透镜系统,同时保持优异的图像质量。

    Method for wafer back-grinding control
    60.
    发明授权
    Method for wafer back-grinding control 有权
    晶圆背面磨削控制方法

    公开(公告)号:US08636559B2

    公开(公告)日:2014-01-28

    申请号:US13618836

    申请日:2012-09-14

    IPC分类号: B24B49/00 B24B51/00

    摘要: A method of reducing manufacturing defects of semiconductor wafers during a back-grinding process. The method includes receiving a semiconductor wafer on a chuck table, wherein said chuck table has a surface upon which a front side of the wafer is placed, and wherein said chuck table has one or more holes in surface and one or more sensors placed in said one or more holes. The method further includes grinding at least a portion of a back side of the semiconductor wafer. The method further includes monitoring a parameter, while grinding, measured by the one or more sensors and adjusting the grinding based at least on the monitored parameter.

    摘要翻译: 在后磨工序中减少半导体晶片的制造缺陷的方法。 该方法包括在卡盘台上接收半导体晶片,其中所述卡盘台具有放置晶片前侧的表面,并且其中所述卡盘台具有一个或多个表面孔,并且一个或多个传感器放置在所述 一个或多个孔。 该方法还包括研磨半导体晶片的背面的至少一部分。 该方法还包括在由一个或多个传感器测量的磨削过程中监测参数,并且至少基于所监测的参数来调整磨削。