Electrostatic discharge circuit
    51.
    发明授权
    Electrostatic discharge circuit 有权
    静电放电电路

    公开(公告)号:US06327126B1

    公开(公告)日:2001-12-04

    申请号:US09494055

    申请日:2000-01-28

    IPC分类号: H02H900

    CPC分类号: H01L27/0251

    摘要: A circuit (600) provides Electrostatic Discharge (ESD) protection for internal elements in an integrated circuit during an ESD event. The circuit (600) includes cascoded NMOSFETs (614, 616), with the upper NMOSFET (614) connected to voltage divider circuitry (628). The voltage divider circuitry (628) provides a first bias voltage to the gate of the upper NMOSFET (614) during an ESD event and a second bias voltage during normal operation. Preferably, the first bias voltage is approximately ½ of the drain voltage of the upper NMOSFET (614). Under these bias conditions the cascoded NMOSFETs exhibit a maximum voltage threshold for initiation of parasitic lateral bipolar conduction.

    摘要翻译: 电路(600)在ESD事件期间为集成电路中的内部元件提供静电放电(ESD)保护。 电路(600)包括级联的NMOSFET(614,616),其中上部NMOSFET(614)连接到分压器电路(628)。 分压器电路(628)在ESD事件期间向上NMOSFET(614)的栅极提供第一偏置电压,并在正常操作期间提供第二偏置电压。 优选地,第一偏置电压约为上部NMOSFET(614)的漏极电压的1/2。 在这些偏置条件下,级联的NMOSFET表现出用于启动寄生横向双极传导的最大电压阈值。

    Method of making an SOI integrated circuit with ESD protection
    52.
    发明授权
    Method of making an SOI integrated circuit with ESD protection 失效
    制造具有ESD保护的SOI集成电路的方法

    公开(公告)号:US5773326A

    公开(公告)日:1998-06-30

    申请号:US710702

    申请日:1996-09-19

    摘要: An SOI structure (20) includes a semiconductor layer (15) formed on an insulating substrate (12). The semiconductor layer (15) is partitioned into an ESD protection portion (32) and a circuitry portion (34). A portion of the semiconductor layer (15) in the ESD protection portion (32) and a different portion of the semiconductor layer (15) in the circuitry portion (34) are differentially thinned. A device (60) which implements the desired circuit functions of the SOI structure (20) is fabricated in the circuitry portion (34). An ESD protection device (40) is fabricated in the ESD protection portion (32). The thick semiconductor layer (15) in the ESD protection portion (32) serves to distribute the ESD current and heat over a large area, thereby improving the ability of the SOI structure (20) to withstand an ESD event.

    摘要翻译: SOI结构(20)包括形成在绝缘基板(12)上的半导体层(15)。 半导体层(15)被分隔成ESD保护部分(32)和电路部分(34)。 ESD保护部分(32)中的半导体层(15)的一部分和电路部分(34)中的半导体层(15)的不同部分被差异地变薄。 在电路部分(34)中制造实现SOI结构(20)的所需电路功能的器件(60)。 在ESD保护部分(32)中制造ESD保护装置(40)。 ESD保护部分(32)中的厚半导体层(15)用于在大面积上分布ESD电流和热量,从而提高SOI结构(20)承受ESD事件的能力。

    Moisture alarm
    55.
    发明授权
    Moisture alarm 失效
    水分报警

    公开(公告)号:US4264902A

    公开(公告)日:1981-04-28

    申请号:US119537

    申请日:1980-02-07

    申请人: James W. Miller

    发明人: James W. Miller

    IPC分类号: G01F23/18 G08B21/20 G08B21/00

    CPC分类号: G01F23/18 G08B21/20

    摘要: A moisture alarm comprises a watertight system with three probes extending down as supportive legs and as ballast from a floatable body or case containing audible and/or RF pulsing-alarm circuitry responsive to moisture detected by any or all of the probes; the case is upwardly convex on top to slip from beneath fixed obstacles in rising water; a provision prevents the probe from shorting out when the unit is set on a metal deck; the free ends of the probes, each of which has a set of outer and inner coaxial electrodes, are apertured, providing access for moisture to reach the inner electrode; a mercury switch sounds the alarm when the unit is tipped over in position lifting inner electrodes from the floor but can be over-ridden by a shunt which permits the unit to be operated inverted as a randdrop alarm; a dual ring conductor embodiment is also disclosed.

    摘要翻译: 水分警报器包括一个水密系统,其具有三个探针,其作为支撑腿向下延伸,以及作为镇流器从可浮动的身体或壳体中容纳,该容器包含响应于由任何或所有探针检测到的水分的听觉和/或RF脉冲警报电路; 上面的情况是向上凸起,在上升的水中从固定的障碍物下方滑落; 当单元设置在金属甲板上时,防止探头短路; 探针的自由端各自具有一组外部和内部同轴电极,它们是有孔径的,提供湿气到达内部电极的通路; 当水平开关翻转时,水银开关会发出报警,将地板上的内部电极放置在位置上,但可以通过分流器进行覆盖,从而允许单元作为兰特警报器反转; 还公开了双环导体实施例。

    I/O cell ESD system
    56.
    发明授权
    I/O cell ESD system 有权
    I / O单元ESD系统

    公开(公告)号:US09064938B2

    公开(公告)日:2015-06-23

    申请号:US13905275

    申请日:2013-05-30

    摘要: An integrated circuit including an ESD network including a portion located in ESD subareas of a plurality of I/O cells where the ESD subareas are arranged in a row traversing the plurality of I/O cells. The ESD network includes ESD clamp cells and ESD trigger circuit cells wherein a portion of the network is located in the row. In some examples, the row includes an ESD trigger circuit cell with a portion in one subarea of one ESD subarea of one I/O cell and a second portion in a second ESD subarea of another I/O cell. Also described herein is a method for producing an integrated circuit layout with an ESD network.

    摘要翻译: 一种包括ESD网络的集成电路,其包括位于多个I / O单元的ESD子区域中的部分,其中ESD子区域布置成穿过多个I / O单元的行。 ESD网络包括ESD钳位单元和ESD触发电路单元,其中网络的一部分位于该行中。 在一些示例中,行包括ESD触发电路单元,其具有一个I / O单元的一个ESD子区域的一个子区域中的一部分,以及另一个I / O单元的第二ESD子区域中的第二部分。 本文还描述了一种用于产生具有ESD网络的集成电路布局的方法。

    DISTRIBUTION OF ELECTROSTATIC DISCHARGE (ESD) CIRCUITRY WITHIN AN INTEGRATED CIRCUIT
    57.
    发明申请
    DISTRIBUTION OF ELECTROSTATIC DISCHARGE (ESD) CIRCUITRY WITHIN AN INTEGRATED CIRCUIT 有权
    集成电路中静电放电(ESD)电路的分布

    公开(公告)号:US20100165522A1

    公开(公告)日:2010-07-01

    申请号:US12345507

    申请日:2008-12-29

    IPC分类号: H02H9/04 G06F17/50

    摘要: Embodiments of the present disclosure provide an integrated circuit (IC) or semiconductor device. This semiconductor device includes a number of I/O pads or bumps on an outer surface of the semiconductor device, a number of electrostatic discharge (ESD) protection cells and functional modules. Individual ESD protection cells couple to and are downstream of individual I/O pads. Functional modules coupled to and are downstream of individual ESD protection cells. The ESD protection cells protect circuitry within the functional module from electrostatic discharge events. A rail clamp may provide an ESD discharge path between a first power supply bus and a second power supply bus. The ESD protection cells may be collected in groups to form clusters (with linear or irregular placement patterns). These clusters may be distributed autarchically across the semiconductor device overlapping one or more functional modules or within spaces or gaps between the functional modules.

    摘要翻译: 本公开的实施例提供集成电路(IC)或半导体器件。 该半导体器件包括在半导体器件的外表面上的多个I / O焊盘或凸块,多个静电放电(ESD)保护电池和功能模块。 单独的ESD保护电池耦合到各个I / O焊盘并且位于各个I / O焊盘的下游 功能模块耦合到单个ESD保护单元的下游。 ESD保护单元保护功能模块内的电路免受静电放电事件的影响。 导轨夹可以在第一电源总线和第二电源总线之间提供ESD放电路径。 ESD保护电池可以以组形式收集以形成簇(具有线性或不规则布置图案)。 这些集群可以跨越跨越半导体器件的一个或多个功能模块或者在功能模块之间的空间或间隙中自发地分布。

    Aerodynamic lift enhancement gate valve
    58.
    发明授权
    Aerodynamic lift enhancement gate valve 失效
    气动升力增强闸阀

    公开(公告)号:US07673576B2

    公开(公告)日:2010-03-09

    申请号:US11471928

    申请日:2006-06-21

    申请人: James W. Miller

    发明人: James W. Miller

    IPC分类号: B63H9/04 B63H9/06 B63B35/79

    CPC分类号: B63H9/06 B63H9/0607

    摘要: An aerodynamic lift enhancing gate valve assembly comprising an airfoil blade disposed at a leading edge of a sail, forming a gate between the trailing edge of the airfoil blade and the leading edge of the sail. The airfoil blade captures wind and redirects it over the cambered surface of the sail to enhance the aerodynamic lift of the sail. The pressure of the wind captured by the airfoil blade is regulated by springs or elastic bands. In operation, the chord of the airfoil blade remains substantially parallel to the chord of the sail.

    摘要翻译: 一种气动升力增强闸阀组件,包括设置在帆的前缘的翼型叶片,在翼型叶片的后缘和帆的前缘之间形成门。 翼型叶片捕获风并将其重定向在帆的弧形表面上,以增强帆的空气动力学提升。 由翼型叶片捕获的风的压力由弹簧或弹性带限制。 在操作中,翼型叶片的翼弦大致平行于帆的弦。

    I/O cell ESD system
    60.
    发明授权
    I/O cell ESD system 有权
    I / O单元ESD系统

    公开(公告)号:US07446990B2

    公开(公告)日:2008-11-04

    申请号:US11056617

    申请日:2005-02-11

    IPC分类号: H02H9/00

    CPC分类号: H01L27/0251 H01L27/0292

    摘要: An ESD protection system for I/O cells of an integrated circuit. The I/O cells of a bank of cells include a first type of I/O cells having ESD trigger circuits and a second type of I/O cells having ESD clamp devices. In one embodiment, the ESD trigger circuits of the first type are located at the same area of an active circuitry floor plan as the area in the floor plan for the ESD clamp devices of the I/O cells of the second type.

    摘要翻译: 集成电路的I / O单元的ESD保护系统。 一组单元的I / O单元包括具有ESD触发电路的第一类型的I / O单元和具有ESD钳位装置的第二类型的I / O单元。 在一个实施例中,第一类型的ESD触发电路位于与第二类型的I / O单元的ESD钳位装置的平面图中的区域有关的电路平面图的相同区域。