Abstract:
An apparatus and method is provided that reduces the propagation delay in a conductor carrying an electrical signal from a first area of a circuit to a second area of the circuit. The conductor is fabricated to include a first conductor extending from the first area to the second area. The conductor also includes a second conductor extending substantially parallel and along the first conductor and electrically connected to the first conductor. A third and additional conductors may also be used which extend substantially parallel and along the first conductor and are electrically connected to the first conductor. The additional second conductor (and any additional conductors) reduces the capacitance of the conductor thereby reducing the propagation delay in the conductor (increasing the speed of the signal). The additional conductor(s) effectively “shield” the first conductor from some capacitance that the first conductor would normally “see” without the use of such additional conductors.
Abstract:
Devices, systems, and methods reduce levels of pro-inflammatory or anti-inflammatory stimulators or mediators in blood by selective adsorption. The devices, systems, and methods are useful in situations where abnormal levels of or unregulated or excessive interaction among pro-inflammatory or anti-inflammatory stimulators or mediators occur, or during events that do induce or have the potential for inducing abnormal production of pro-inflammatory or anti-inflammatory stimulators or mediators. The devices, systems, and methods serve to prevent, control, reduce, or alleviate the severity of the inflammatory response and disease states that are associated with abnormal levels of or unregulated or excessive interaction among pro-inflammatory or anti-inflammatory stimulators or mediators.
Abstract:
A row driver circuit receives a supply voltage and operates to develop a boosted voltage having a magnitude that is equal to the sum of an incremental boost voltage and a magnitude of the supply voltage. The magnitude of the incremental boost voltage is a function of the magnitude of the supply voltage to maintain the boosted voltage at an approximately constant value independent of variations in the supply voltage. A method of generating a boosted voltage includes detecting a value of a supply voltage, generating an incremental boost voltage having a value that is a function of the detected supply voltage, and adding the generated incremental boost voltage to the supply voltage to generate the boosted voltage.
Abstract:
Devices, systems, and methods reduce levels of pro-inflammatory or anti-inflammatory stimulators or mediators in physiologic fluid by selective adsorption. The devices, systems, and methods are useful in situations where abnormal levels of or unregulated or excessive interaction among pro-inflammatory or anti-inflammatory stimulators or mediators occur, or during events that do induce or have the potential for inducing abnormal production of pro-inflammatory or anti-inflammatory stimulators or mediators. The devices, systems, and methods serve to prevent, control, reduce, or alleviate the severity of the inflammatory response and disease states that are associated with abnormal levels of or unregulated or excessive interaction among pro-inflammatory or anti-inflammatory stimulators or mediators.
Abstract:
A particle detection system exhibits an increased ability to detect the presence of submicron diameter particles and to distinguish between noise and pulse output signals generated by small diameter particles on which a light beam is incident. This increased ability results from the incorporation of a light reflector, a pair of detector elements that detect correlated portions of the light beam that have been scattered in multiple directions, and a coincidence circuit that determines whether each detector element in the pair concurrently generates a pulse output signal exceeding a predetermined threshold. Sample particles are counted only when both detector elements concurrently detect scattered light components.
Abstract:
A memory device having redundancy is disclosed. The memory device includes an array of memory cells organized into rows and columns of memory cells, each row of memory cells including a plurality of addressable memory cells and redundant memory cells, the array of memory cells including row lines and column lines, each row line being coupled to memory cells in a distinct row of memory cells, each column line being coupled to memory cells in a distinct column of memory cells, and column input/output lines. The memory device further includes a redundancy circuitry for selectively coupling column lines to column input/output lines of the array of memory cells and selectively decoupling at least one column line from the column input/output lines, based upon an address value received by the memory device during a memory access operation.
Abstract:
A method of peritoneal dialysis includes introducing a dialysis solution into a peritoneal cavity; allowing the dialysis solution to dwell in the peritoneal cavity for a period of time to provide diffusion through an inner lining of an abdominal cavity with exchange of components between a microcirculation of a peritoneum and a dialysis fluid; withdrawing the dialysis solution from the peritoneal cavity with toxins; passing the dialysis solution with toxins through an absorbent polymeric material which has a size, shape, and structure selected so as to remove the toxins in a molecular range of 300-30,000 Dalton from the spent dialysis solution; and returning the thusly purified peritoneal dialysis solution to the patient.
Abstract:
A method and apparatus for testing a random access memory device, such as a dynamic random access memory device embedded within an integrated circuit chip. The apparatus includes one or more rows of transistors, each of which is connected to a bit line pair of the memory device and to a data line. Data is placed onto the bit lines by driving the data line to a predetermined voltage level and turning on the transistors in the transistor row. Data placed on the bit lines forms a test pattern that may be subsequently written into any row of memory cells. By directly controlling the bit lines of the memory device in this way, test patterns may be quickly and easily stored in the memory device for functional verification thereof.
Abstract:
A method and apparatus for testing a random access memory device, such as a dynamic random access memory device embedded within an integrated circuit chip. The apparatus includes one or more rows of transistors, each of which is connected to a bit line pair of the memory device and to a data line. Data is placed onto the bit lines by driving the data line to a predetermined voltage level and turning on the transistors in the transistor row. Data placed on the bit lines forms a test pattern that may be subsequently written into any row of memory cells. By directly controlling the bit lines of the memory device in this way, test patterns may be quickly and easily stored in the memory device for functional verification thereof.
Abstract:
A bit line recovery circuit for random access memory. The circuit includes a pair of pull-up devices, each of which is connected to a bit line of a bit line pair. Pass gates are disposed between a sense amplifier and the bit lines. The pull-up devices are cross-coupled such that the gate node of the pull-up devices are connected to the sense amplifier on the opposed side of the pass gates in order to rapidly turn on the appropriate pull-up device following a memory cell read operation.