摘要:
With a recording medium causing a computer to execute a color adjustment program used for the color adjustment of a display, weights are assigned to the adjustment amounts of colors included in an adjustment range in correspondence with a positional relationship with a target color in color space, and the adjustment amount of the target color, when information about the target color to be adjusted, the adjustment amount indicating the amount of the color adjustment made to the target color, and the adjustment range for deciding the range of colors to be adjusted along with the target color are input. According to the weights, colors after the adjustment for the target color and the colors included in the adjustment range are calculated, and a three-dimensional region corresponding to the calculated colors is drawn in the color space.
摘要:
A control apparatus of an audio-visual display apparatus is provided, wherein only one remote control unit in a plurality of remote control units has a control right for controlling the audio-visual display apparatus, the control apparatus determines whether a signal is received from a remote control unit with the control right until a scrambling determination time elapses from a time when detecting that an operation command is received from a remote control unit without the control right; and deprives the remote control unit with the control right of the control right and provides the control right to other remote control unit if a signal is not received from the remote control unit with the control right within the scrambling determination time.
摘要:
A wireless base station receiving packet signals at every timeslot from a plurality of wireless terminals, has a calculating unit calculating, from one packet signal, a parameter used for a process of demodulating the packet signal, a storage unit stored with the parameter, and an averaging processing unit calculating, when executing the demodulating process of the packet signal at a certain timeslot with respect to one of the plurality of wireless terminals, an average value from the parameter obtained from the packet signal and from the parameters stored in the storage unit and obtained from the packet signals at one or more timeslots allocated to one of the plurality of wireless terminals and discontinuous from the certain timeslot, and outputting the average value as the parameter used for the demodulating process.
摘要:
A pattern inspection method in which an image can be detected without an image detection error caused by an adverse effect to be given by such factors as ions implanted in a wafer, pattern connection/non-connection, and pattern edge formation. A digital image of an object substrate is attained through microscopic observation thereof, the attained digital image is examined to detect defects, while masking a region pre-registered in terms of coordinates, or while masking a pattern meeting a pre-registered pattern, and an image of each of the defects thus detected is displayed. Further, each of the defects detected using the digital image attained through microscopic observation is checked to determine whether its feature meets a pre-registered feature or not. Defects having a feature that meets the pre-registered feature are so displayed that they can be turned on/off, or they are so displayed as to be distinguishable from the other defects.
摘要:
The pattern defect inspection apparatus and its method of the present invention comprises: a recipe setting unit for setting an inspection recipe and/or a review recipe; an illumination optical system including: a laser light source for emitting ultraviolet laser light; a quantity-of-light adjusting unit for adjusting a quantity of the ultraviolet laser light emitted from the laser light source; and an illumination range forming unit for forming on a sample an illumination range of the ultraviolet laser light; a coherence reducing system; and a detection optical system including: a condensing optical system; a diffracted-light control optical system; and a detecting unit.
摘要:
An operation assisting system enhances the operator's willingness to participate in energy-saving efforts. The operation assisting system stores information about the actual operation of operated equipment carried out by the operator, evaluates the stored operation information, and displays the results of evaluation. The evaluation results relate to the cost concerning the operated equipment, the cost of supplying energy to the operation target facility, the cost concerning the operated equipment, the amount of emission of carbon dioxide, nitride oxide, and global warming substances, the amount of primary energy consumption, the crude oil-converted amount of energy consumption, the amount of excess or shortage of supply of energy, or electric power quality.
摘要:
The pattern defect inspection apparatus and its method of the present invention comprises: a recipe setting unit for setting an inspection recipe and/or a review recipe; an illumination optical system including: a laser light source for emitting ultraviolet laser light; a quantity-of-light adjusting unit for adjusting a quantity of the ultraviolet laser light emitted from the laser light source; and an illumination range forming unit for forming on a sample an illumination range of the ultraviolet laser light; a coherence reducing system; and a detection optical system including: a condensing optical system; a diffracted-light control optical system; and a detecting unit.
摘要:
A control system for cogeneration system provides operation combination calculating means which calculates the combination of operations capable of keeping the voltage of the distribution line within a predetermined tolerance within voltage tolerance based on following (1)-(3). (1) the predicted value of the electric power demand of each customer calculated by electric power demand predicted value calculating means; (2) the impedance of the distribution line recorded by distribution line information recording means; and (3) the combination of cogeneration systems to be operated, as calculated by operation combination calculating means.
摘要:
The present invention provides an image detection system capable of picking up a high resolution image of the surface condition of a circuit pattern-formed wafer without being affected by steep pattern steps, discontinuous reflectance distributions and optically transparent substances which are formed after resist patterns are formed and removed. A defect detection apparatus using such an image detection apparatus is also provided by the invention. The present invention is implemented by a configuration comprising a scanning stage having a sample mounted thereon, an image pickup system for picking up a surface image of the sample, height detection means for detecting the surface height of the sample at plural points including two points which are respectively on the opposite sides of the image pickup position in the scanning direction, sample height calculation means for calculating the height of the sample at the image pickup position by using the detected heights and focusing means for focusing the image pickup system by using the calculated sample height.
摘要:
In the present invention, a reference conductive layer and a first surface conductive layer are respectively provided on a surface and a back face of a first base film. The first base film includes a first via hole penetrating the first surface conductive layer. After a first electroless plating layer and a first conductive material are sequentially grown on a surface of the first base film, a first coating conductive layer composed of the first electroless plating layer, the first conductive material and the first surface conductive layer, is etched to have a reduced thickness. Then, the first coating conductive layer is patterned to form a first wiring layer. In this manner, a desired pattern width can be obtained even in the case where the first coating conductive layer is patterned by isotropic etching such as wet etching.