摘要:
A high speed, low-to-high voltage CMOS driver circuit has a CMOS output stage, an intermediate voltage translation stage, and an input stage. The input and intermediate stages are designed to generate mutually exclusive control signals which activate the PMOS and NMOS transistors of the output stage. The control signals operably turn "off" the active transistor before turning "on" the inactive transistor. Independent control signals substantially reduce or eliminate crossing current in the output stage to thereby reduce energy power waste.
摘要:
A semiconductor dynamic random-access memory (DRAM) device embodying numerous features that collectively and/or individually prove beneficial and advantageous with regard to such considerations as density, power consumption, speed, and redundancy is disclosed. The device is a 64 Mbit DRAM comprising eight substantially identical 8 Mbit partial array blocks (PABs), each pair of PABs comprising a 16 Mbit quadrant of the device. Between the top two quadrants and between the bottom two quadrants are column blocks containing I/O read/write circuitry, column redundancy fuses, and column decode circuitry. Column select lines originate from the column blocks and extend right and left across the width of each quadrant. Each PAB comprises eight substantially identical 1 Mbit sub-array blocks (SABs). Associated with each SAB are a plurality of local row decoder circuits functioning to receive partially decoded row addresses from a column predecoder circuit and generating local row addresses supplied to the SAB with which they are associated. Various pre- and/or post-packaging options are provided for enabling a large degree of versatility, redundancy, and economy of design. Programmable options of the disclosed device are programmable by means of both laser fuses and electrical fuses. In the RAS chain, circuitry is provided for simulating the RC time constant behavior of word lines and digit lines during memory accesses, such that memory access cycle time can be optimized. Test data compression circuitry optimizes the process of testing each cell in the array. On-chip topology circuitry simplifies the testing of the device.
摘要:
A data bus is described which has integrated circuits, such as memory circuits, coupled thereto. The integrated circuits include an input buffer circuit adapted to receive and latch high speed data transmissions. The input buffer circuit equilibrates a sensing circuit, samples input data, senses the sampled input data, and latches the sensed data during different phases of an input clock cycle. An input buffer circuit is described which has two receiver circuits for receiving data transmissions having a higher speed data transmissions.
摘要:
A voltage regulator (10) that regulates an input voltage. The voltage regulator (10) includes a current source (20) that generates a reference current. The voltage regulator also includes a voltage translation circuit (30), coupled to and responsive to the current source (20), that increases the input voltage to generate a differential voltage signal. The voltage regulator (10) further includes a differential comparator circuit (40) coupled to the voltage translation circuit (30) that generates a control signal based on the differential voltage from the voltage translation circuit (30) to indicate when the input voltage should be adjusted.
摘要:
An integrated circuit memory device has multiple subarray partitions which can be independently isolated from the remaining circuitry on the integrated circuit. Subarrays of the integrated circuit can be independently tested. Should a subarray of the integrated circuit be found inoperable it is electrically isolated from the remaining circuitry on the integrated circuit so that it cannot interfere with the normal operation of the remaining circuitry. Defects such as power to ground shorts in a subarray which would have previously been catastrophic can be electrically isolated allowing the remaining functional subarrays to be utilized. Integrated circuit repair by isolation of inoperative elements eliminates the current draw and other performance degradations that have previously been associated with integrated circuits with defects repaired through the incorporation of redundant elements alone.
摘要:
A power regulation circuit features an improved regulation circuit for use with a voltage multiplier circuit, such as a Vccp pump for a DRAM. The power regulation circuit includes: a high-gain differential comparator, dual input level translators, and a constant current bias generator. The dual input level translators lower the respective voltage levels of a reference voltage level and the output of the power regulation circuit, which is monitored to provide the desired regulation. The translated input signals are coupled as inputs to the differential comparator. Translation keeps the inputs within the input common mode range of the differential comparator. The differential comparator acts in concert with the constant current bias generator to regulate the output of the power regulation circuit at a constant and steady level. Using current mirrors, the constant current bias generator provides a fixed voltage for ensuring that approximately the same amount of current passes through each of the dual level translators. Feedback is provided from the output of the regulation circuit to the differential comparator to provide the desired level of hysterisis control.
摘要:
A self-timing antifuse programming controller optimizes programming of one or many antifuses. A programming current through the antifuse is monitored until it reaches a current trip point, thereby initiating a delay period. The delay period is determined by charging a capacitor with a scaled replicate of the antifuse current until a trip point voltage is reached. Antifuses which are more resistive receive a longer programming time. The current trip point and delay period are independently programmable. The antifuse programming controller also flags completion of antifuse programming allowing expeditious programming of further antifuses in an array of antifuses to minimize overall programming time.
摘要:
A CMOS driver device including an output stage having a first PMOS transistor and an NMOS transistor serially connected between a first voltage and ground and having a second PMOS transistor and the NMOS transistor serially connected between the second voltage and ground. The driver device further includes control logic for mutually exclusively controlling the first PMOS transistor and the second PMOS transistor such that during a first time period an output of the output stage is driven to the first voltage and that during a second subsequent time period the output is driven to the second voltage. The control logic further includes logic for mutually exclusively controlling the first and second PMOS transistors and the NMOS transistor such that prior to enabling one of the first and second PMOS transistors, the NMOS transistor is disabled.
摘要:
An integrated memory circuit is described which includes a charge pump for producing a pumped voltage and a ring oscillator coupled to the charge pump. The ring oscillator is used to operate the charge pump, such that pump cycles are activated on the edges of the oscillator output. The ring oscillator includes an oscillator enable circuit which is controlled by a regulator to maintain a controlled pump voltage. The oscillator enable circuit immediately shuts the ring oscillator off when the pump voltage reaches a pre-determined upper voltage limit so that additional oscillator cycles are eliminated, thereby, reducing the chance of an overshoot in the pump voltage. The oscillator enable circuit turns the oscillator on when the pump voltage decreases to a predetermined lower level.
摘要:
A band gap voltage reference circuit operates between a positive supply voltage and ground. The inputs to a difference amplifier of the band gap reference circuit are biased above the voltage drop of the base-emitter junctions of the band gap reference. The bias voltage is then subtracted from the difference amplifier output by a second difference amplifier. In addition, a bootstrap circuit assures a nonzero output from the first difference amplifier. Other embodiments wherein the band gap reference circuit is more generally a summing circuit are disclosed.