摘要:
A method of configuring a stacked integrated circuit (“IC”) having a first IC die with configurable logic and a second IC die electrically coupled to the first IC die through an array of inter-chip contacts includes: providing a frame having frame data and a frame address in a frame header to the first IC die; storing the frame data in a frame data register of the first IC die; processing the frame header to determine whether a frame destination is in the first IC die or the second IC die; in response to determining that the frame destination is in the second IC die, providing the frame address to the second IC die through an inter-chip frame address bus including a first plurality of the array of inter-chip contacts; and writing the frame data from the frame data register of the first IC die to the frame destination through an inter-chip frame data bus including a second plurality of the array of inter-chip contacts.
摘要:
Partial configuration of programmable circuitry with validation for an integrated circuit is described. An integrated circuit with programmable circuitry is obtained. The programmable circuitry is configured with a first bitstream in a non-dynamic mode of operation, after which the integrated circuit includes a configuration controller coupled to a buffer, an internal configuration access port, and an error checker. A portion of a second bitstream is loaded into the buffer for a dynamic partial configuration mode of operation. The portion of the second bitstream loaded into the buffer is validated with the error checker as being acceptable, after which the portion of the second bitstream is instantiated in the programmable circuitry via the internal configuration access port.
摘要:
A semiconductor device includes a field-programmable gate array (“FPGA”) die (202) having a frame address bus (604), a frame data bus (608), and a second integrated circuit (“IC”) die (204) attached to the FPGA die. An inter-chip frame address bus (605) couples at least low order frame address bits of a frame address of a frame between the FPGA die and the second IC die. The inter-chip frame address bus includes a first plurality of contacts (614) formed between the FPGA die and the second IC die. An inter-chip frame data bus couples frame data of the frame between the FPGA die and the second IC die. The inter-chip frame data bus includes a second plurality of contacts (616) formed between the FPGA die and the second IC die.
摘要:
Methods and structures utilizing multiple configuration bitstreams to program integrated circuits (ICs) such as programmable logic devices, thereby enabling the utilization of partially defective ICs. A user design is implemented two or more times, preferably utilizing different programmable resources as much as possible in each configuration bitstream. The resulting user configuration bitstreams are stored along with associated test bitstreams in a memory device, e.g., a programmable read-only memory (PROM). Under the control of a configuration control circuit or device, the test bitstreams are loaded into a partially defective IC and tested using an automated testing procedure. When a test bitstream is found that enables the associated user design to function correctly in the programmed IC, i.e., that avoids the defective programmable resources in the IC, the associated user bitstream is loaded into the IC, the configuration procedure terminates, and the programmed IC begins to function according to the user design.
摘要:
A defect is automatically isolated in an integrated circuit device having programmable logic and interconnect circuits. A sequence of configurations is created to route data in a pattern through the programmable logic and interconnect circuits. Each configuration within the sequence is determined (e.g., generated or selected from a plurality of pre-generated configurations) as a function of output data from a prior configuration in the sequence. For each configuration in the sequence, the programmable logic and interconnect circuits are configured with the configuration and an automatic test instrument routes data in the pattern through the programmable logic and interconnect circuits. For each configuration in the sequence, the output data from the programmable logic and interconnect circuits is assessed. For each configuration in the sequence, the assessed output data isolates the defect to a portion of the pattern for the configuration that is within the portion for a prior configuration in the sequence.
摘要:
Apparatus for integrating capacitors in stacked integrated circuits are described. One aspect of the invention relates to a semiconductor assembly having a carrier substrate, a plurality of integrated circuit dice, and at least one metal-insulator-metal (MIM) capacitor. The integrated circuit dice are vertically stacked on the carrier substrate. Each MIM capacitor is disposed between a first integrated circuit die and a second integrated circuit die of the plurality of integrated circuit dice. The at least one MIM capacitor is fabricated on at least one of a face of the first integrated circuit die and a backside of the second integrated circuit die.
摘要:
An external storage device may transmit encrypted configuration data to a PLD during a configuration operation without transmitting the encryption key to the PLD and without retaining decryption information in the PLD. During a set-up operation, the encryption key is provided to the PLD, which generates an ID code upon power-up. The PLD generates a correction word in response to the encryption key and the ID code. The correction word is output from the PLD, which is powered-down, and is stored with the encrypted configuration data in the storage device. Then, during a configuration operation, the PLD is powered-on and re-generates the ID code. The correction word and the encrypted configuration data are transmitted to the PLD, which generates a decryption key in response to the re-generated ID code and the correction word.
摘要:
Methods of enabling the use of defective programmable devices. The method comprises performing functional testing for each programmable device of a plurality of programmable devices; identifying each programmable device of the plurality of programmable devices having a defective portion of programmable blocks; identifying, for each programmable device which is identified to have a defective portion of programmable blocks, a location of the defective portion; and storing, for each programmable device which is identified to have a defective portion of programmable blocks, the location of the defective portion on the programmable device.
摘要:
Described are programmable logic devices that decrypt proprietary configuration data using on-chip decryption keys. The keys are stored in a key memory that can be operated in a secure mode or a non-secure mode. The non-secure mode allows the decryption keys to be read or written freely; the secure mode bars read and write access to the decryption keys. The programmable logic device supports secure and non-secure modes on a key-by-key basis, allowing users to write, verify, and erase individual keys without affecting others.
摘要:
A circuit board includes a large scale logic device and at least one outrigger device wherein signals having a transmission delay budget that exceed a threshold value are produced to the outrigger device for coupling to circuit devices of the circuit board that are external to the large scale logic device. One embodiment of the invention comprises a plurality of outrigger devices that communicate with the large scale logic device by way of parallel data buses, as well as multi-gigabit transceiver data lines. Logic within the outrigger devices is generally limited to signal routing and transmission logic. The large scale logic device further comprises logic to transmit and receive signals to and from the outrigger devices in a way that is transparent to internal logic of the large scale logic device.