Negative photosensitive resin composition and negative photosensitive element
    51.
    发明申请
    Negative photosensitive resin composition and negative photosensitive element 审中-公开
    负型感光性树脂组合物和负型感光性元件

    公开(公告)号:US20060177762A1

    公开(公告)日:2006-08-10

    申请号:US10564853

    申请日:2004-07-16

    IPC分类号: G02F1/1337

    CPC分类号: G03F7/027 G02F1/133707

    摘要: An object of the present invention is to provide a negative photosensitive resin composition, which is capable of forming projections for controlling liquid crystal alignment that exhibit a higher level of precision than that attained by projections formed mug a positive photosensitive resin composition, as well as a photosensitive element that uses the above negative photosensitive resin composition, which can be used in a transfer method (laminate system), is easily stored, can be used with no wastage, and exhibits excellent film thickness stability. The present invention relates to a negative photosensitive resin composition comprising an alkali-soluble resin (a), a reactive monomer (b), and a photoreaction initiator (c), wherein 50% or more of the total mass of the blended reactive monomer (b) is a monofunctional reactive monomer, and a negative photosensitive element comprising a negative photosensitive resin composition layer that uses the negative photosensitive resin composition positioned on top of a support.

    摘要翻译: 本发明的目的是提供一种负型感光性树脂组合物,其能够形成用于控制液晶取向的突起,该突出显示比由正型感光性树脂组合物形成的凸部获得的精度更高的精度,以及 使用可以用于转印方法(层叠体系)的上述负型感光性树脂组合物的感光性元件容易地储存,可以不浪费地使用,并且显示出优异的膜厚稳定性。 本发明涉及包含碱溶性树脂(a),反应性单体(b)和光反应引发剂(c))的负型感光性树脂组合物,其中共混反应性单体(的总量)的50% b)是单官能反应性单体,以及含有负性感光性树脂组合物层的负型感光性元件,其使用位于载体顶部的负型感光性树脂组合物。

    Method for appraising the condition of a semiconductor polishing cloth
    55.
    发明授权
    Method for appraising the condition of a semiconductor polishing cloth 失效
    评估半导体抛光布条件的方法

    公开(公告)号:US06495465B2

    公开(公告)日:2002-12-17

    申请号:US09266051

    申请日:1999-03-10

    IPC分类号: H01L21302

    CPC分类号: B24B37/24 B24B49/12

    摘要: The present invention provides a method for appraising the condition of a polishing cloth, and a method for manufacturing semiconductor wafers employing the disclosed appraisal method, allowing acceptably low light point defect numbers of semiconductor wafers to be maintained. The disclosed method comprises polishing the semiconductor wafer using a polishing cloth, washing the wafer, and drying the wafer. The size of particles comprising light point defects is chosen, and the number of light point defects on the semiconductor wafer is counted. Typically, the diameter of particles comprising light point defects is set as 0.12 &mgr;m or greater. The polishing cloth is exchanged when the number of light point defects counted exceeds a prescribed number.

    摘要翻译: 本发明提供了一种用于评价抛光布的状态的方法,以及使用公开的评估方法制造半导体晶片的方法,允许保持半导体晶片的可接受的低光点缺陷数。 所公开的方法包括使用抛光布抛光半导体晶片,洗涤晶片并干燥晶片。 选择包含光点缺陷的粒子的大小,并计数半导体晶片上的光点缺陷的数量。 通常,将包含光点缺陷的粒子的直径设定为0.12μm以上。 当计数的光点缺陷数超过规定数量时,更换抛光布。

    Nonvolatile semiconductor storage device
    56.
    发明授权
    Nonvolatile semiconductor storage device 失效
    非易失性半导体存储器件

    公开(公告)号:US6166950A

    公开(公告)日:2000-12-26

    申请号:US117369

    申请日:1998-07-28

    IPC分类号: G11C11/56 G11C11/34

    摘要: In a nonvolatile semiconductor memory device in which a plurality of threshold values are set to store multi-level data in a memory cell, bits of multi-bit data are separately written into a memory cell according to an address signal or a control signal to effect the reading and erasing. Concretely, the memory array is so constituted that it can be accessed by three-dimensional address of X, Y and Z, and multi-bit data in the memory cell is discriminated by the Z-address.

    摘要翻译: PCT No.PCT / JP96 / 01907 Sec。 371日期:1998年7月28日 102(e)1998年7月28日PCT PCT 1996年7月10日PCT公布。 公开号WO98 / 01861 日期1998年1月15日在其中设定多个阈值以将多电平数据存储在存储单元中的非易失性半导体存储器件中,多位数据的位根据地址信号被单独写入存储单元, 一个控制信号来实现读取和擦除。 具体地说,存储器阵列被构造成可以通过X,Y和Z的三维地址来访问,存储器单元中的多位数据由Z地址区分。

    Method of determining three dimensional position of object and apparatus
therefor
    58.
    发明授权
    Method of determining three dimensional position of object and apparatus therefor 失效
    确定物体及其装置的三维位置的方法

    公开(公告)号:US5802202A

    公开(公告)日:1998-09-01

    申请号:US364184

    申请日:1994-12-27

    IPC分类号: G06T7/00 G06K9/00

    CPC分类号: G06T7/004

    摘要: A method of determining the three-dimensional position of an object in a specific position with respect to a predetermined standard position includes storing position data representative of a distinctive part of the object as if the object is virtually located in a predetermined standard position, formularizing a relation between the specific and standard positions in terms of a standard three-dimensional co-ordinate system as an equation including a positional deviation as an unknown parameter, and determining a restrictive condition for the position of the distinctive part of the object located in the specific position. The equation is solved under a condition in which the position of the distinctive part satisfies the restrictive condition to find a positional deviation.

    摘要翻译: 确定相对于预定标准位置的特定位置中的物体的三维位置的方法包括存储表示物体的特征部分的位置数据,就像物体实际上位于预定标准位置一样,形成 以标准三维坐标系作为包含作为未知参数的位置偏差的方程式的特定标准位置之间的关系,以及确定位于特定位置的物体的特征部分的位置的限制条件 位置。 在特征部分的位置满足限制条件以找到位置偏差的条件下求解该方程。

    Semiconductor wafer case
    59.
    发明授权
    Semiconductor wafer case 失效
    半导体晶圆盒

    公开(公告)号:US5725100A

    公开(公告)日:1998-03-10

    申请号:US749972

    申请日:1996-11-14

    申请人: Naoki Yamada

    发明人: Naoki Yamada

    摘要: A semiconductor wafer case provides high resistance to vibration. The semiconductor wafer can be easily accessed from the case. The semiconductor wafer case includes a case body and a holder in which blade-type presser feet are provided. An end of each of the presser feet has a V-shaped cross-section. Spaces are provided between presser feet (32a, 33a) and presser feet (32b, 33b). Two holders of the same shape are provided at opposite sides of the case body so that the holders can hold the semiconductor wafer horizontally.

    摘要翻译: 半导体晶片盒提供高抗振动性。 可以从壳体容易地接近半导体晶片。 半导体晶片壳体包括壳体和设置有叶片式压脚的保持器。 每个压脚的端部具有V形横截面。 压脚(32a,33a)和压脚(32b,33b)之间设有空间。 具有相同形状的两个保持器设置在壳体的相对侧,使得保持器能够水平地保持半导体晶片。

    Suspension control apparatus
    60.
    发明授权
    Suspension control apparatus 失效
    悬架控制装置

    公开(公告)号:US5445405A

    公开(公告)日:1995-08-29

    申请号:US229747

    申请日:1994-04-19

    摘要: A suspension control apparatus comprises a sprung velocity measuring device for measuring a sprung velocity, a relative velocity measuring device for measuring a relative velocity between the sprung and unsprung velocities, a controller for mode-converting, weighting and inversely mode-converting the sprung velocity and relative velocity, and having a dead zone setting circuit for changing over a control value when the polarity of the velocity difference is inverted at a first time, in order to calculate a velocity ratio and determine a target damping force, and an actuator for controlling the opening area in the variable throttle mechanism communicating with the cylinder piston apparatus of absorber was disclosed. The suspension control apparatus has the effect that there is no delay in controlling and any shock and the generation of hunting is prevented.

    摘要翻译: 悬架控制装置包括用于测量弹簧速度的弹簧速度测量装置,用于测量弹簧和非簧载速度之间的相对速度的相对速度测量装置,用于模式转换,加权和逆模式转换弹簧速度的控制器,以及 相对速度,并且具有用于当速度差的极性在第一时间反转时改变控制值的死区设置电路,以便计算速度比并确定目标阻尼力,以及用于控制速度差的致动器 公开了与吸收器的气缸活塞装置连通的可变节流机构中的开口面积。 悬架控制装置的作用是控制和任何冲击都没有延迟,并且防止产生狩猎。