Microscope apparatus
    63.
    发明授权
    Microscope apparatus 有权
    显微镜装置

    公开(公告)号:US07385693B2

    公开(公告)日:2008-06-10

    申请号:US11153361

    申请日:2005-06-16

    Applicant: Mitsuru Namiki

    Inventor: Mitsuru Namiki

    CPC classification number: G01J3/2889 G01J3/02 G01J3/0208 G01J3/453 G02B21/16

    Abstract: A microscope apparatus includes a microscope, and a time-resolved spectroscopy unit, a first light-guiding unit for guiding light from the speetroscopy unit into the microscope, a second light-guiding unit for guiding the light from the microscope into the spectroscopy unit. The microscope includes an illuminating optical system and an observing optical system. The time-resolved spectroscopy unit includes an ultrashort optical pulse source, a beam splitter for splitting the ultrashort optical pulse into a reference beam and another beam, an optical system for generating a pump beam and a probe beam from the beam other than the reference beam, and an imaging device for time-resolved spectroscopy for capturing an interference pattern formed by the light guided by the second light-guiding unit and the reference beam. A two-dimensional lightwave conversion optical system is interposed between the second light-guiding unit and the imaging device.

    Abstract translation: 显微镜装置包括显微镜和时间分辨光谱单元,用于将来自光刻单元的光引导到显微镜中的第一导光单元,用于将来自显微镜的光引导到光谱单元中的第二导光单元。 显微镜包括照明光学系统和观察光学系统。 时间分辨光谱单元包括超短光脉冲源,用于将超短光脉冲分裂成参考光束的分束器和另一光束,用于从除了参考光束之外的光束产生泵浦光束和探测光束的光学系统 以及用于捕获由第二导光单元和参考光束引导的光形成的干涉图案的用于时间分辨光谱的成像装置。 二维光波转换光学系统介于第二导光单元和成像装置之间。

    Analysis of component for presence, composition and/or thickness of coating
    64.
    发明申请
    Analysis of component for presence, composition and/or thickness of coating 审中-公开
    分析涂层的存在,组成和/或厚度的组分

    公开(公告)号:US20070296967A1

    公开(公告)日:2007-12-27

    申请号:US11475212

    申请日:2006-06-27

    CPC classification number: G01J3/2889 G01J3/443 G01N21/718

    Abstract: A method comprising the following steps: (a) providing a turbine component comprising a metal substrate having an external surface; and (b) analyzing the external surface by laser plasma spectroscopy to determine whether a metallic coating is present on or absent from the external surface. If a metallic coating is determined to be present on the external surface, the elemental composition, elemental concentration and/or thickness of the metallic coating present on the external surface may be determined (qualitatively and/or quantitatively) by laser plasma spectroscopy. Another method comprises the following steps: (a) providing a turbine component comprising a metal substrate having an external surface which has been subjected to treatment to remove a metallic coating applied to the external surface; and (b) analyzing the treated external surface by laser plasma spectroscopy to determine the degree of removal of the metallic coating from the treated external surface.

    Abstract translation: 一种方法,包括以下步骤:(a)提供包括具有外表面的金属基底的涡轮机部件; 和(b)通过激光等离子体光谱分析外表面以确定金属涂层是否存在于外表面上或不存在于外表面上。 如果确定外表面上存在金属涂层,则可以通过激光等离子体光谱法确定(定性和/或定量)存在于外表面上的金属涂层的元素组成,元素浓度和/或厚度。 另一方法包括以下步骤:(a)提供包括具有外表面的金属基底的涡轮机部件,所述外表面经过处理以除去施加到外表面的金属涂层; 和(b)通过激光等离子体光谱分析处理的外表面以确定从被处理的外表面去除金属涂层的程度。

    Optical spectrum analyzer with continuously rotating tuynable filter
    65.
    发明申请
    Optical spectrum analyzer with continuously rotating tuynable filter 有权
    具有连续旋转可旋转滤光片的光谱分析仪

    公开(公告)号:US20070285659A1

    公开(公告)日:2007-12-13

    申请号:US11810873

    申请日:2007-06-07

    Abstract: An optical spectrum analyzer is implemented with a detector combined with a tunable filter mounted on a stage capable of 360-degree rotation at a constant velocity. Because of the constant rate of angular change, different portions of the input spectrum are detected at each increment of time as a function of filter position, which can be easily measured with an encoder for synchronization purposes. The unidirectional motion of the mirror permits operation at very high speeds with great mechanical reliability. The same improvements may be obtained using a diffraction grating or a prism, in which case the detector or an intervening mirror may be rotated instead of the grating or prism.

    Abstract translation: 光谱分析仪采用与安装在能够以恒定速度360度旋转的平台上的可调滤波器组合的检测器。 由于角度变化的恒定速率,输入频谱的不同部分在每个增量时间上被检测为滤波器位置的函数,这可以通过编码器容易地用于同步目的来测量。 镜子的单向运动允许以非常高的速度运行,具有很大的机械可靠性。 可以使用衍射光栅或棱镜获得相同的改进,在这种情况下,可以旋转检测器或中间镜来代替光栅或棱镜。

    System and method to perform raman imaging without luminescence
    66.
    发明申请
    System and method to perform raman imaging without luminescence 有权
    不发光的拉曼成像系统和方法

    公开(公告)号:US20070222982A1

    公开(公告)日:2007-09-27

    申请号:US11728430

    申请日:2007-03-26

    Abstract: A system and method for collecting Raman data sets without the “contaminating” effect of luminescence emitted photons. Using a frame transfer CCD for time resolved data collection, Raman imaging may be performed without photobleaching the sample. The system may include a light source, a frame transfer CCD, an optical lens and at least one controller. The light source illuminates the sample with a plurality of photons to generate scattered photons from the sample. The frame transfer CCD has an image array and a storage array. The optical lens collects scattered photons and directs the scattered photons to the image array. The controller transfers a Raman data set representative of the scattered photons from the image array to the storage array. The frame transfer CCD may be configured so as the image array integrates the scattered photons during a Raman integration time and the controller transfers the Raman data set from the image array to storage array during a parallel transfer time. The sum of the Raman integration time and the parallel transfer time is less than the minimum time it takes to trigger luminescence from the sample.

    Abstract translation: 用于收集拉曼数据集而不发出发光光子的“污染”影响的系统和方法。 使用帧传输CCD进行时间分辨数据采集,拉曼成像可以在没有光漂白样品的情况下进行。 该系统可以包括光源,帧传送CCD,光学透镜和至少一个控制器。 光源用多个光子照射样品以从样品产生散射的光子。 帧传送CCD具有图像阵列和存储阵列。 光学透镜收集散射的光子并将散射的光子引导到图像阵列。 控制器将表示散射光子的拉曼数据集从图像阵列传送到存储阵列。 帧传送CCD可以被配置为使得图像阵列在拉曼积分时间期间对散射的光子进行积分,并且控制器在平行传送时间期间将拉曼数据集从图像阵列传送到存储阵列。 拉曼积分时间和平行传输时间的总和小于从样品触发发光所需的最小时间。

    Very fast time resolved imaging in multiparameter measurement space
    67.
    发明授权
    Very fast time resolved imaging in multiparameter measurement space 有权
    多参数测量空间中非常快速的时间分辨成像

    公开(公告)号:US07227116B2

    公开(公告)日:2007-06-05

    申请号:US10258917

    申请日:2001-04-26

    Abstract: Plural electronic or optical images are provided in a streak optical system, as for instance by use of plural slits instead of the conventional single slit, to obtain a third, fourth, etc. dimension—rather than only the conventional two, namely range or time and azimuth. Such additional dimension or dimensions are thereby incorporated into the optical information that is to be streaked and thereby time resolved. The added dimensions may take any of an extremely broad range of forms, including wave-length, polarization state, or one or more spatial dimensions—or indeed virtually any optical parameter that can be impressed upon a probe beam. Resulting capabilities remarkably include several new forms of lidar spectroscopy, fluorescence analysis, polarimetry, spectropolarimetry, and combinations of these, as well as a gigahertz wavefront sensor.

    Abstract translation: 多个电子或光学图像以条纹光学系统提供,例如通过使用多个狭缝而不是传统的单个狭缝,以获得第三,第四等尺寸,而不仅仅是传统的两个,即范围或时间 和方位角。 因此,这样的附加尺寸或尺寸被并入要划线的光学信息中,从而被时间分辨。 增加的尺寸可以采取非常宽的形式范围中的任何一种,包括波长,极化状态或一个或多个空间维度,或实际上实际上可以施加到探测光束上的任何光学参数。 所产生的功能显着地包括激光雷达光谱,荧光分析,偏振测量,分光偏振测量及其组合的几种新形式,以及千兆赫兹波前传感器。

    Fast time-correlated multi-element photon detector and method

    公开(公告)号:US20070041011A1

    公开(公告)日:2007-02-22

    申请号:US11209353

    申请日:2005-08-22

    Abstract: Photons emitted from a sample responsive to being excited by laser pulses are directed through a prism onto a photomultiplier tube having several spaced-apart anodes. The prism alters the path of each photon as a function of its wavelength so that the wavelength determines the anode to which the photon is directed. Taps of first and second delay lines that are coupled to respective alternating anodes. When an anode receives the photon, it generates a pulse that propagates through the delay line in opposite directions from its associated tap. A timer determines first and second times from the laser pulse to the pulse reaching the first and second ends of the delay line. The difference between the first and second times corresponds to the wavelength of the emitted photon and the sum of the first and second times corresponds to the emission delay of the emitted photon.

    Spectroscopic systems and methods
    69.
    发明授权
    Spectroscopic systems and methods 有权
    光谱系统和方法

    公开(公告)号:US07099003B2

    公开(公告)日:2006-08-29

    申请号:US10840686

    申请日:2004-05-06

    Abstract: The present invention relates to spectroscopic methods and systems for collecting electromagnetic radiation from an object using a continuously-spinning wavelength-selecting (CSWS) device, e.g., an interference filter(s) or grating. One embodiment of the invention provides a spectroscopic system for collecting electromagnetic radiation from a target. The spectroscopic system has at least one beam of electromagnetic radiation that interacts with the target. The system includes a continuously spinning wavelength-selecting (CSWS) device, e.g., a continuously spinning interference filter/grating driven by a DC motor, in the path of the at least one beam. The device filters the radiation with regard to wavelength to produce filtered radiation. The system further includes at least one detector in the path of the at least one beam for detecting the filtered radiation.

    Abstract translation: 本发明涉及使用连续纺丝波长选择(CSWS)装置(例如干涉滤光器或光栅)从物体收集电磁辐射的光谱方法和系统。 本发明的一个实施例提供了一种用于从目标收集电磁辐射的光谱系统。 光谱系统具有与靶相互作用的至少一束电磁辐射。 该系统包括连续旋转波长选择(CSWS)装置,例如由直流电动机驱动的连续旋转干涉滤波器/光栅,在至少一个光束的路径中。 该装置相对于波长对辐射进行滤波以产生滤波的辐射。 该系统还包括至少一个光束的路径中的至少一个检测器,用于检测经过滤的辐射。

    Scanning IR microscope
    70.
    发明授权
    Scanning IR microscope 有权
    扫描红外显微镜

    公开(公告)号:US07057733B2

    公开(公告)日:2006-06-06

    申请号:US10779959

    申请日:2004-02-17

    CPC classification number: G01J3/4535 G01J3/06 G01J3/2889 G02B21/26

    Abstract: An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.

    Abstract translation: 与扫描光谱仪相关联地操作FT-IR显微镜,使得显微镜的可移动台的增量移动与扫描光谱仪的扫描同步。 这最大限度地减少了处理时间的延迟。

Patent Agency Ranking