Abstract:
A current mode logic (CML)-complementary metal oxide semiconductor (CMOS) converter prevents change of a duty ratio to stably operate during an operation for converting a CML level signal into a CMOS level signal. The CML-CMOS converter includes a reference level shifting unit configured to receive a CML signal swinging about a first reference level to shift a swing reference level to a second reference level; and an amplifying unit configured to amplify an output signal of the reference level shifting unit to output the amplified signal as a CMOS signal.
Abstract:
A counter with overflow prevention capability includes a counting unit configured to count an output code in response to an input signal and an overflow preventing unit configured to control the counting unit to stop counting the output code when a current value of the output code is a maximum value but a previous value thereof is not the maximum value.
Abstract:
A memory module is configured to include a first rank installed with a first memory chip and a second rank installed with a second memory chip. When the first and second memory chips are in a first data output mode, the first memory chip is configured to externally output lower order data of a plurality of data via lower data output pins. Also, when the first and second memory chips are in the first data output mode, the second memory chip is configured to externally output data that has the same order as the lower order data output by the first memory chip via upper data output pins.
Abstract:
An on-chip self test circuit implemented on the same chip as a test semiconductor device includes: a test load block for receiving a test target signal; and a self test block for receiving a test target signal passing through the test load block and a test target signal inputted to an output driver together, and determining whether a change of the test target signal is within an allowable range.
Abstract:
A semiconductor memory device can a desired internal clock in consideration of a delay time of an actual clock/data path. The semiconductor memory device includes a multiclock signal generating unit configured to receive a reference clock signal and generate a plurality of clock signals having a constant phase difference from each other, a delay modeling unit configured to generate a plurality of delay clock signals by reflecting a delay time of an actual clock/data path to the plurality of clock signals, a selection signal generating unit configured to generate selection signals by comparing phases between the reference clock signal and the plurality of delay clock signals, and a phase multiplexing unit configured to output any one of the plurality of clock signals as a final clock signal in response to the selection signals.
Abstract:
Phase locked loop and method for controlling the same includes a phase/frequency detector configured to detect a phase difference between an input clock and a feedback clock to generate an up signal or a down signal depending on the detected phase difference, a charge pump configured to variably control a bandwidth according to a bandwidth control signal input thereinto, the charge pump operating in response to the up signal or the down signal and a voltage controlled oscillator configured to change a frequency according to an output of the charge pump.
Abstract:
The present invention relates to a washing machine and a method of controlling the washing machine. According to a washing machine and a method of controlling the washing machine in accordance with the present invention, a drum operates at a first speed so that part of the laundry tumbles within the drum and another part of the laundry adheres to the drum. The laundry amount within the drum is sensed during the first speed operation. Operation commands for driving the drum after the first speed operation are changed based on the sensed laundry amount. Accordingly, at the time of the dehydration cycle, stability of the washing machine and laundry balancing can be ensured.
Abstract:
A duty correction circuit includes a duty ratio sensor for controlling a duty ratio sensing speed by a sensing speed control signal and outputting a correction signal by sensing a duty ratio of a clock, and a duty ratio corrector for controlling the duty ratio of the clock in response to the correction signal.
Abstract:
A semiconductor memory device includes a thermosensor that senses present temperatures of the device and confirms whether the temperature values are valid. The thermosensor includes a temperature sensing unit, a storage unit and an initializing unit. The temperature sensing unit senses temperatures in response to a driving signal. The storage unit stores output signals of the temperature sensing unit and outputs temperature values. The initializing unit initializes the storage unit after a predetermined time from an activation of the driving signal. A driving method includes driving the thermosensor in response to the driving signal, requesting a re-driving after a predetermined time from the activation of the driving signal, and re-driving the thermosensor in response to the driving signal input again.
Abstract:
An injection locking clock generator can vary the free running frequency of an injection locking oscillator to broaden an operating frequency range of an oscillation signal injected to itself, thereby performing an injection locking with respect to all frequencies of an operating frequency range. The clock generator includes a main oscillator configured to generate oscillation signals of a frequency corresponding to a control voltage, and an injection locking oscillator configured to generate division signals synchronized with the oscillation signals by dividing the oscillation signals, wherein a free running frequency of the injection locking oscillator is set according to the frequency of the oscillation signals.