Abstract:
Disclosed are an apparatus and method of determining an optimal cyclic delay value. The method of determining the optimal cyclic delay value includes determining a Signal-to-Interference and Noise Ratio (SINR) function depending on a diversity order; determining a channel estimation error variance function; and determining an SINR being required for a system according to the SINR function and the channel estimation error variance function.
Abstract:
Memory devices and/or encoding/decoding methods are provided. A memory device may include: a memory cell array; an internal decoder configured to apply, to a first codeword read from the memory cell array, a first decoding scheme selected based on a characteristic of a first channel in which the first codeword is read to perform error control codes (ECC) decoding of the first codeword, and apply, to a second codeword read from the memory cell array, a second decoding scheme selected based on a characteristic of a second channel in which the second codeword is read to perform the ECC decoding of the second codeword; and an external decoder configured to apply an external decoding scheme to the ECC-decoded first codeword and the ECC-decoded second codeword to perform the ECC decoding of the first codeword and the second codeword.
Abstract:
An apparatus and a method for reading from a non-volatile memory whereby soft decision data is used to determine the reliability of hard decision data. The hard decision data read from the non-volatile memory is de-randomized and the soft decision data read from the non-volatile memory is not de-randomized. Using the soft decision data, the hard decision data is decoded.
Abstract:
A method of programming multi-level cells included in a spare region, the method including programming first page data and at least one first dummy data in a first multi-level cell; and programming second page data and at least one second dummy data in a second multi-level cell.
Abstract:
Example embodiments may provide a memory device and memory data programming method. The memory device according to example embodiments may encode a first data page to generate at least one first codeword and encode a second data page to generate a second codeword. The memory device may generate the first codeword with at least one of a maximum value of a number of successive ones and a second maximum value of a number of successive zeros. The memory device may program the at least one first codeword and the at least one second codeword to a plurality of multi-bit cells.
Abstract:
An interleaving apparatus may include a first buffer unit configured to buffer input data in units having a size of a sector to generate sector unit data, an encoding unit configured to encode the sector unit data and generate a plurality of parity codes based on the encoding, a second buffer unit configured to interleave the sector unit data and the parity codes and generate interleaving data based on the interleaving, the second buffer unit including a plurality of output buffers configured to store the interleaving data, and an output unit configured to output the interleaving data.
Abstract:
Provided are memory devices and memory programming methods. A memory device may include: a multi-bit cell array that includes a plurality of memory cells; a controller that extracts state information of each of the memory cells, divides the plurality of memory cells into a first group and a second group, assigns a first verify voltage to memory cells of the first group and assigns a second verify voltage to memory cells of the second group; and a programming unit that changes a threshold voltage of each memory cell of the first group until the threshold voltage of each memory cell of the first group is greater than or equal to the first verify voltage, and changes a threshold voltage of each memory cell of the second group until the threshold voltage of each memory cell of the second group is greater than or equal to the second verify voltage.
Abstract:
Provided are memory devices and memory programming methods. A memory device may include a multi-bit cell array including a plurality of multi-bit cells, a programming unit configured to program a first data page in the plurality of multi-bit cells and to program a second data page in the multi-bit cells with the programmed first data page, a first controller configured to divide the multi-bit cells with the programmed first data page into a first group and a second group, and a second controller configured to set a target threshold voltage interval of each of the multi-bit cells included in the first group based on first read voltage levels and the second data page, and to set a target threshold voltage interval of each of the multi-bit cells included in the second group based on second read threshold voltage levels and the second data page.
Abstract:
Memory systems and related defective block management methods are provided. Methods for managing a defective block in a memory device include allocating a defective block when a memory block satisfies a defective block condition. The allocated defective block is cancelled when the allocated defective block satisfies a defective block cancellation condition.
Abstract:
Provided is a read method for a memory system. The read method determines whether a read data error is correctable. The read method applies a plurality of read operations at a set read voltage level to identify erasure candidates, when the error is uncorrectable. The read method performs erasure decoding using an error correction code or an error detection code for the erasure candidates.