ERROR-CORRECTING CODE DISTRIBUTION FOR MEMORY SYSTEMS
    71.
    发明申请
    ERROR-CORRECTING CODE DISTRIBUTION FOR MEMORY SYSTEMS 有权
    存储系统错误修正代码分配

    公开(公告)号:US20150143201A1

    公开(公告)日:2015-05-21

    申请号:US14084043

    申请日:2013-11-19

    IPC分类号: G06F11/10

    摘要: According to one embodiment, a memory system includes a plurality of memory devices and a memory controller operatively coupled to the memory devices. The memory controller is configured to partition write data into a plurality of data blocks, where each data block is associated with one of the memory devices. The memory controller is further configured to generate an instance of a local error-correcting code (ECC) corresponding to each data block, and merge each data block with the corresponding instance of the local ECC to form an encoded data block for each memory device. Additionally, the memory controller is configured to write each encoded data block to the memory devices such that each memory device stores one of the data blocks with the corresponding instance of the local ECC. A global ECC and a local ECC of the global ECC can also be included in the memory system.

    摘要翻译: 根据一个实施例,存储器系统包括多个存储器件和可操作地耦合到存储器件的存储器控​​制器。 存储器控制器被配置为将写入数据分割成多个数据块,其中每个数据块与存储器件之一相关联。 存储器控制器还被配置为生成对应于每个数据块的本地纠错码(ECC)的实例,并且将每个数据块与本地ECC的对应实例合并,以形成每个存储器设备的编码数据块。 另外,存储器控制器被配置为将每个编码的数据块写入存储器件,使得每个存储器件将数据块中的一个与本地ECC的对应实例一起存储。 全局ECC的全局ECC和本地ECC也可以包含在内存系统中。

    Implementing SDRAM having no RAS to CAS delay in write operation
    73.
    发明授权
    Implementing SDRAM having no RAS to CAS delay in write operation 有权
    在写操作中实现没有RAS的SDRAM延迟到CAS延迟

    公开(公告)号:US08797823B2

    公开(公告)日:2014-08-05

    申请号:US13658226

    申请日:2012-10-23

    IPC分类号: G11C8/18 G06F17/50

    摘要: A method and circuit for implementing faster-cycle-time and lower-energy write operations for Synchronous Dynamic Random Access Memory (SDRAM), and a design structure on which the subject circuit resides are provided. A first RAS (row address strobe) to CAS (column address strobe) command delay (tRCD) is provided to the SDRAM for a read operation. A second delay tRCD is provided for a write operation that is substantially shorter than the first delay tRCD for the read operation.

    摘要翻译: 用于实现用于同步动态随机存取存储器(SDRAM)的更快周期时间和较低能量写入操作的方法和电路,以及提供主题电路所在的设计结构。 向SDRAM(第一列地址选通)命令延迟(tRCD)的第一个RAS(行地址选通)提供给SDRAM用于读取操作。 提供第二延迟tRCD用于写操作,该写操作实质上比读操作的第一延迟tRCD短。

    Tracking address ranges for computer memory errors

    公开(公告)号:US11017875B2

    公开(公告)日:2021-05-25

    申请号:US16363110

    申请日:2019-03-25

    摘要: Tracking address ranges for computer memory errors including detecting, by memory logic, an error at a memory address, the memory address representing one or more memory cells at a physical location of computer memory; reporting, by the memory logic to memory firmware, the detected error including providing the memory firmware with the memory address; identifying, by the memory firmware, an address range affected by the detected error including scanning the computer memory in dependence upon the memory address; determining, by the memory firmware, a region size based on the address range affected by the detected error; and populating an entry in a mark table corresponding to the detected error, including populating a field specifying the region size and a field specifying a match address corresponding to the memory address.

    Performing error correction in computer memory

    公开(公告)号:US10971246B2

    公开(公告)日:2021-04-06

    申请号:US16387846

    申请日:2019-04-18

    摘要: Performing error correction in computer memory including receiving a read request targeting a read address within the computer memory; accessing a mark table comprising a plurality of entries, each entry including a field specifying a region size, a field specifying a match address, and a field specifying a mark location; performing a lookup of the mark table using the read address including, for each entry in the mark table: generating a mask based on the region size stored in the entry; determining, based on the mask, whether the read address is within a memory region specified by the match address and region size stored in the entry; and if the read address is within the memory region specified by the match address and region size stored in the entry, performing error correction using the mark location stored in the entry.

    REDUNDANT VOLTAGE REGULATOR FOR MEMORY DEVICES

    公开(公告)号:US20200013449A1

    公开(公告)日:2020-01-09

    申请号:US16577644

    申请日:2019-09-20

    IPC分类号: G11C11/4074 G11C5/14

    摘要: A memory subsystem is disclosed comprising at least one memory module, the memory module having a substrate to which a plurality of memory chips is mounted and a voltage regulator, the voltage regulator receiving a power supply signal from a system power supply and outputting two or more power signals, each power signal providing a different, regulated voltage, which regulated voltages are each routed to each of the memory chips; and a redundant voltage regulator external to and not mounted on the memory module and configured to output two or more power signals, providing external different, regulated voltages which are the same voltages as the voltages output by the voltage regulator on the memory module, and supplying the two or more signals to the memory module.

    COMMON HIGH AND LOW RANDOM BIT ERROR CORRECTION LOGIC

    公开(公告)号:US20190317856A1

    公开(公告)日:2019-10-17

    申请号:US15953805

    申请日:2018-04-16

    IPC分类号: G06F11/10 G11C29/52 G06F3/06

    摘要: Embodiments of the present invention include a memory module that includes a plurality of memory devices and a memory buffer device. Each of the memory devices are characterized as one of a high random bit error rate (RBER) and a low RBER memory device. The memory buffer device includes a read data interface to receive data read from a memory address on one of the memory devices. The memory buffer device also includes common error correction logic to detect and correct error conditions in data read from both high RBER and low RBER memory devices. The common error correction logic includes a plurality of error correction units which provide different complexity levels of error correction and have different latencies. The error correction units include a first fast path error correction unit for isolating and correcting random symbol errors.