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    Systems including janus droplets capable of binding an analyte and changing orientation to provide a detectable change
    71.
    发明授权
    Systems including janus droplets capable of binding an analyte and changing orientation to provide a detectable change 有权

    公开(公告)号：US10060913B2

    公开(公告)日：2018-08-28

    申请号：US15269543

    申请日：2016-09-19

    Applicant: Massachusetts Institute of Technology

    Inventor： Timothy M. Swager ,  Qifan Zhang ,  Suchol Savagatrup

    IPC: G01N21/77 ,  G01N33/543 ,  C12Q1/6834

    CPC classification number: G01N33/5432 ,  C12Q1/6834 ,  G01N21/59 ,  G01N21/77 ,  G01N33/54366 ,  G01N2021/7783 ,  C12Q2563/161

    Abstract: Embodiments described herein may be useful in the detection of analytes. The systems and methods may allow for a relatively simple and rapid way for detecting analytes such as chemical and/or biological analytes and may be useful in numerous applications including sensing, food manufacturing, medical diagnostics, performance materials, dynamic lenses, water monitoring, environmental monitoring, detection of proteins, detection of DNA, among other applications. For example, the systems and methods described herein may be used for determining the presence of a contaminant such as bacteria (e.g., detecting pathogenic bacteria in food and water samples which helps to prevent widespread infection, illness, and even death). Advantageously, the systems and methods described herein may not have the drawbacks in current detection technologies including, for example, relatively high costs, long enrichment steps and analysis times, and/or the need for extensive user training. Another advantageous feature provided by the systems and methods described herein includes fabrication in a relatively large scale. In some embodiments, the systems and methods may be used in conjunction with a detector including handheld detectors incorporated with, for example, smartphones (e.g., for the on-site detection of analytes such as pathogenic bacteria).

    Methods for deposition of materials including mechanical abrasion
    73.
    发明授权
    Methods for deposition of materials including mechanical abrasion 有权
    材料沉积方法，包括机械磨损

    公开(公告)号：US09459222B2

    公开(公告)日：2016-10-04

    申请号：US13800169

    申请日：2013-03-13

    Applicant: Massachusetts Institute of Technology

    Inventor： Timothy M. Swager ,  Katherine A. Mirica ,  Joseph M. Azzarelli ,  Jonathan G. Weis ,  Jan Schnorr ,  Birgit Esser

    IPC: G01N27/00 ,  G01N27/04 ,  G01N27/07 ,  G01N27/12

    CPC classification number: G01N27/12 ,  Y10T29/49002

    Abstract: Methods described herein may be useful in the fabrication and/or screening of devices (e.g., sensors, circuits, etc.) including conductive materials. In some embodiments, a conductive material is formed on a substrate using mechanical abrasion. The methods described herein may be useful in fabricating sensors, circuits, tags for remotely-monitored sensors or human/object labeling and tracking, among other devices. In some cases, devices for determining analytes are also provided.

    Abstract translation: 本文所述的方法可用于制造和/或筛选包括导电材料的装置（例如，传感器，电路等）。 在一些实施例中，使用机械磨损在基板上形成导电材料。 本文描述的方法可用于制造用于远程监视的传感器的传感器，电路，标签，或者人/物体标记和跟踪以及其它设备。 在某些情况下，还提供了用于确定分析物的装置。

    METHODS AND DEVICES FOR DEPOSITION OF MATERIALS ON PATTERNED SUBSTRATES
    76.
    发明申请
    METHODS AND DEVICES FOR DEPOSITION OF MATERIALS ON PATTERNED SUBSTRATES 有权
    用于沉积图案材料的方法和装置

    公开(公告)号：US20160195504A1

    公开(公告)日：2016-07-07

    申请号：US14831679

    申请日：2015-08-20

    Applicant: Massachusetts Institute of Technology

    Inventor： Timothy M. Swager ,  Kelvin Mitchell Frazier ,  Katherine A. Mirica ,  Joseph Walish

    IPC: G01N33/00

    CPC classification number: G01N33/0009 ,  B81C1/00031 ,  B81C1/00373

    Abstract: Methods for depositing materials on patterned substrates, and related devices, are generally provided. In some embodiments, a material is deposited on a patterned substrate. In certain embodiments, the substrate comprises a first portion with a material deposited on the first portion and a second portion of the substrate essentially free of the material. The methods described herein may be useful in fabricating sensors, circuits, tags, among other devices. In some cases, devices for determining analytes are also provided.

    Abstract translation: 通常提供了在图案化基板上沉积材料的方法和相关装置。 在一些实施例中，材料沉积在图案化的衬底上。 在某些实施例中，衬底包括具有沉积在第一部分上的材料的第一部分和基本上不含该材料的衬底的第二部分。 本文描述的方法可用于制造传感器，电路，标签等装置。 在某些情况下，还提供了用于确定分析物的装置。

    EMISSIVE COMPOSITIONS WITH INTERNAL STANDARD AND RELATED TECHNIQUES
    78.
    发明申请
    EMISSIVE COMPOSITIONS WITH INTERNAL STANDARD AND RELATED TECHNIQUES 审中-公开
    具有内部标准和相关技术的电磁组合

    公开(公告)号：US20150031138A1

    公开(公告)日：2015-01-29

    申请号：US14455502

    申请日：2014-08-08

    Applicant: Massachusetts Institute of Technology

    Inventor： Timothy M. Swager ,  Jessica H. Liao

    IPC: G01N33/44

    CPC classification number: G01N33/442 ,  C09K11/06 ,  C09K11/574 ,  C09K2211/1416 ,  C09K2211/1425 ,  C09K2211/182 ,  G01N33/5432 ,  G01N33/544 ,  G01N33/545 ,  G01N33/553 ,  G01N2021/6432 ,  Y10T428/2998

    Abstract: The present invention provides materials, devices, and methods related to determination of an analyte. In some embodiments, an analyte may be determined by monitoring, for example, a change in an optical signal of a luminescent material (e.g., particle) upon exposure to an analyte. The present invention may be particularly advantageous in that some embodiments may comprise an emissive species useful as an internal reference standard. Methods of the invention may also be useful in the quantitative determination of an analyte. In some cases, the present invention may allow for selective determination of an analyte.

    Abstract translation: 本发明提供了与分析物的测定相关的材料，装置和方法。 在一些实施方案中，可以通过在暴露于分析物时监测发光材料（例如，颗粒）的光学信号的变化来确定分析物。 本发明可能是特别有利的，因为一些实施方案可以包含可用作内部参考标准的发射物质。 本发明的方法也可用于分析物的定量测定。 在一些情况下，本发明可以允许选择性地测定分析物。

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